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X-RAY DIFFRACTION
Materials and Methods page
4EJB
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 7
    Temperature 293.0
    Details 4% PEG 20k, 4% PEG550 MME, 0.1M TRIS-ACETATE, 0.2M KSCN, 10mM MgCl2, pH 7.0, VAPOR DIFFUSION, SITTING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 210.46 α = 90
    b = 447.34 β = 90
    c = 622.3 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Details mirrors
    Collection Date 2011-07-22
     
    Diffraction Radiation
    Monochromator KOHZU DIAMOND MONOCHROMATOR
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 24-ID-C
    Wavelength List 0.9792
    Site APS
    Beamline 24-ID-C
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 3.5
    Resolution(Low) 50
    Number Reflections(All) 720970
    Number Reflections(Observed) 720017
    Percent Possible(Observed) 99.9
    R Merge I(Observed) 0.438
    Redundancy 11.5
     
    High Resolution Shell Details
    Resolution(High) 3.5
    Resolution(Low) 3.7
    Percent Possible(All) 99.9
    R Merge I(Observed) 1.303
    Mean I Over Sigma(Observed) 1.8
    R-Sym I(Observed) 1.382
    Redundancy 9.6
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.516
    Resolution(Low) 35.071
    Cut-off Sigma(F) 1.99
    Number of Reflections(all) 720970
    Number of Reflections(Observed) 719893
    Number of Reflections(R-Free) 32818
    Percent Reflections(Observed) 99.86
    R-Factor(Observed) 0.2119
    R-Work 0.2102
    R-Free 0.2493
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -9.4477
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 5.0433
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 5.6251
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5158
    Shell Resolution(Low) 3.5557
    Number of Reflections(R-Free) 1157
    Number of Reflections(R-Work) 21899
    R-Factor(R-Work) 0.2905
    R-Factor(R-Free) 0.3259
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5557
    Shell Resolution(Low) 3.5975
    Number of Reflections(R-Free) 1191
    Number of Reflections(R-Work) 22652
    R-Factor(R-Work) 0.2863
    R-Factor(R-Free) 0.3213
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5975
    Shell Resolution(Low) 3.6413
    Number of Reflections(R-Free) 1134
    Number of Reflections(R-Work) 22721
    R-Factor(R-Work) 0.2751
    R-Factor(R-Free) 0.3029
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6413
    Shell Resolution(Low) 3.6874
    Number of Reflections(R-Free) 1190
    Number of Reflections(R-Work) 22699
    R-Factor(R-Work) 0.2708
    R-Factor(R-Free) 0.3094
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6874
    Shell Resolution(Low) 3.7359
    Number of Reflections(R-Free) 1191
    Number of Reflections(R-Work) 22673
    R-Factor(R-Work) 0.2603
    R-Factor(R-Free) 0.299
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7359
    Shell Resolution(Low) 3.787
    Number of Reflections(R-Free) 1197
    Number of Reflections(R-Work) 22672
    R-Factor(R-Work) 0.2534
    R-Factor(R-Free) 0.2762
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.787
    Shell Resolution(Low) 3.841
    Number of Reflections(R-Free) 1186
    Number of Reflections(R-Work) 22745
    R-Factor(R-Work) 0.2452
    R-Factor(R-Free) 0.2783
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.841
    Shell Resolution(Low) 3.8983
    Number of Reflections(R-Free) 1130
    Number of Reflections(R-Work) 22778
    R-Factor(R-Work) 0.2412
    R-Factor(R-Free) 0.2867
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8983
    Shell Resolution(Low) 3.9591
    Number of Reflections(R-Free) 1189
    Number of Reflections(R-Work) 22716
    R-Factor(R-Work) 0.233
    R-Factor(R-Free) 0.2688
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9591
    Shell Resolution(Low) 4.0239
    Number of Reflections(R-Free) 1196
    Number of Reflections(R-Work) 22633
    R-Factor(R-Work) 0.227
    R-Factor(R-Free) 0.2658
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0239
    Shell Resolution(Low) 4.0932
    Number of Reflections(R-Free) 1194
    Number of Reflections(R-Work) 22750
    R-Factor(R-Work) 0.2245
    R-Factor(R-Free) 0.2536
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0932
    Shell Resolution(Low) 4.1675
    Number of Reflections(R-Free) 1188
    Number of Reflections(R-Work) 22666
    R-Factor(R-Work) 0.2158
    R-Factor(R-Free) 0.2414
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1675
    Shell Resolution(Low) 4.2475
    Number of Reflections(R-Free) 1197
    Number of Reflections(R-Work) 22736
    R-Factor(R-Work) 0.2095
    R-Factor(R-Free) 0.2796
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2475
    Shell Resolution(Low) 4.3341
    Number of Reflections(R-Free) 1198
    Number of Reflections(R-Work) 22780
    R-Factor(R-Work) 0.2133
    R-Factor(R-Free) 0.2482
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3341
    Shell Resolution(Low) 4.4282
    Number of Reflections(R-Free) 1164
    Number of Reflections(R-Work) 22786
    R-Factor(R-Work) 0.2067
    R-Factor(R-Free) 0.2429
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4282
    Shell Resolution(Low) 4.531
    Number of Reflections(R-Free) 561
    Number of Reflections(R-Work) 23415
    R-Factor(R-Work) 0.1999
    R-Factor(R-Free) 0.254
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.531
    Shell Resolution(Low) 4.644
    Number of Reflections(R-Free) 704
    Number of Reflections(R-Work) 23259
    R-Factor(R-Work) 0.2005
    R-Factor(R-Free) 0.2383
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.644
    Shell Resolution(Low) 4.7693
    Number of Reflections(R-Free) 814
    Number of Reflections(R-Work) 23145
    R-Factor(R-Work) 0.1979
    R-Factor(R-Free) 0.2397
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7693
    Shell Resolution(Low) 4.9093
    Number of Reflections(R-Free) 995
    Number of Reflections(R-Work) 23060
    R-Factor(R-Work) 0.1917
    R-Factor(R-Free) 0.2224
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.9093
    Shell Resolution(Low) 5.0673
    Number of Reflections(R-Free) 1176
    Number of Reflections(R-Work) 22755
    R-Factor(R-Work) 0.1898
    R-Factor(R-Free) 0.2259
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.0673
    Shell Resolution(Low) 5.2478
    Number of Reflections(R-Free) 1181
    Number of Reflections(R-Work) 22893
    R-Factor(R-Work) 0.1855
    R-Factor(R-Free) 0.2278
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.2478
    Shell Resolution(Low) 5.4572
    Number of Reflections(R-Free) 1182
    Number of Reflections(R-Work) 22800
    R-Factor(R-Work) 0.18
    R-Factor(R-Free) 0.2246
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.4572
    Shell Resolution(Low) 5.7045
    Number of Reflections(R-Free) 1185
    Number of Reflections(R-Work) 22917
    R-Factor(R-Work) 0.1826
    R-Factor(R-Free) 0.2228
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.7045
    Shell Resolution(Low) 6.0039
    Number of Reflections(R-Free) 1196
    Number of Reflections(R-Work) 22904
    R-Factor(R-Work) 0.1833
    R-Factor(R-Free) 0.2296
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.0039
    Shell Resolution(Low) 6.378
    Number of Reflections(R-Free) 1186
    Number of Reflections(R-Work) 22955
    R-Factor(R-Work) 0.1845
    R-Factor(R-Free) 0.232
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.378
    Shell Resolution(Low) 6.867
    Number of Reflections(R-Free) 1194
    Number of Reflections(R-Work) 22915
    R-Factor(R-Work) 0.1854
    R-Factor(R-Free) 0.23
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.867
    Shell Resolution(Low) 7.5518
    Number of Reflections(R-Free) 726
    Number of Reflections(R-Work) 23523
    R-Factor(R-Work) 0.1778
    R-Factor(R-Free) 0.2333
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.5518
    Shell Resolution(Low) 8.6303
    Number of Reflections(R-Free) 864
    Number of Reflections(R-Work) 23449
    R-Factor(R-Work) 0.191
    R-Factor(R-Free) 0.2271
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 8.6303
    Shell Resolution(Low) 10.8201
    Number of Reflections(R-Free) 1000
    Number of Reflections(R-Work) 23444
    R-Factor(R-Work) 0.2042
    R-Factor(R-Free) 0.2304
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 10.8201
    Shell Resolution(Low) 35.0726
    Number of Reflections(R-Free) 1152
    Number of Reflections(R-Work) 23735
    R-Factor(R-Work) 0.2238
    R-Factor(R-Free) 0.2451
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.008
    f_chiral_restr 0.088
    f_dihedral_angle_d 20.121
    f_angle_d 1.052
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 27738
    Nucleic Acid Atoms 63078
    Heterogen Atoms 0
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC Quantum
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution PHENIX (phenix.refine: 1.7_641)
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7_641)
    model building PHENIX version: (phenix.refine: 1.7_641)
    data collection ADSC version: Quantum