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X-RAY DIFFRACTION
Materials and Methods page
4EJ1
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 4.4
    Temperature 293.0
    Details 30% PEG1000, 100 mM phosphate/citrate, 110 mM Lithium Citrate, pH 4.4, VAPOR DIFFUSION, SITTING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 100.74 α = 90
    b = 77.06 β = 92
    c = 92.78 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2008-06-15
     
    Diffraction Radiation
    Monochromator Si 111 CHANNEL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID23-1
    Wavelength List 1.0723
    Site ESRF
    Beamline ID23-1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.75
    Resolution(Low) 50
    Number Reflections(All) 76010
    Number Reflections(Observed) 72438
    Percent Possible(Observed) 95.3
     
    High Resolution Shell Details
    Resolution(High) 1.75
    Resolution(Low) 1.774
    Percent Possible(All) 95.3
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.75
    Resolution(Low) 19.863
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 68339
    Number of Reflections(R-Free) 3430
    Percent Reflections(Observed) 95.66
    R-Factor(Observed) 0.1883
    R-Work 0.1864
    R-Free 0.2235
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 0.0354
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -0.5145
    Anisotropic B[2][2] 0.0
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.0354
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.75
    Shell Resolution(Low) 1.774
    Number of Reflections(R-Free) 112
    Number of Reflections(R-Work) 2444
    R-Factor(R-Work) 0.3451
    R-Factor(R-Free) 0.3933
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.774
    Shell Resolution(Low) 1.7993
    Number of Reflections(R-Free) 121
    Number of Reflections(R-Work) 2515
    R-Factor(R-Work) 0.3212
    R-Factor(R-Free) 0.3365
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7993
    Shell Resolution(Low) 1.8261
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2512
    R-Factor(R-Work) 0.2971
    R-Factor(R-Free) 0.3797
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8261
    Shell Resolution(Low) 1.8546
    Number of Reflections(R-Free) 118
    Number of Reflections(R-Work) 2557
    R-Factor(R-Work) 0.2968
    R-Factor(R-Free) 0.2727
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8546
    Shell Resolution(Low) 1.885
    Number of Reflections(R-Free) 119
    Number of Reflections(R-Work) 2527
    R-Factor(R-Work) 0.286
    R-Factor(R-Free) 0.3576
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.885
    Shell Resolution(Low) 1.9175
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2555
    R-Factor(R-Work) 0.2753
    R-Factor(R-Free) 0.3505
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9175
    Shell Resolution(Low) 1.9523
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2513
    R-Factor(R-Work) 0.2612
    R-Factor(R-Free) 0.3141
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9523
    Shell Resolution(Low) 1.9899
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 2588
    R-Factor(R-Work) 0.2442
    R-Factor(R-Free) 0.2858
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9899
    Shell Resolution(Low) 2.0304
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2568
    R-Factor(R-Work) 0.2371
    R-Factor(R-Free) 0.3164
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0304
    Shell Resolution(Low) 2.0745
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2569
    R-Factor(R-Work) 0.2169
    R-Factor(R-Free) 0.246
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0745
    Shell Resolution(Low) 2.1227
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 2568
    R-Factor(R-Work) 0.2152
    R-Factor(R-Free) 0.2643
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1227
    Shell Resolution(Low) 2.1758
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2574
    R-Factor(R-Work) 0.2049
    R-Factor(R-Free) 0.236
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1758
    Shell Resolution(Low) 2.2345
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2577
    R-Factor(R-Work) 0.1939
    R-Factor(R-Free) 0.2485
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2345
    Shell Resolution(Low) 2.3002
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2550
    R-Factor(R-Work) 0.1939
    R-Factor(R-Free) 0.2273
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3002
    Shell Resolution(Low) 2.3743
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2602
    R-Factor(R-Work) 0.2004
    R-Factor(R-Free) 0.2215
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3743
    Shell Resolution(Low) 2.459
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2575
    R-Factor(R-Work) 0.2027
    R-Factor(R-Free) 0.2372
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.459
    Shell Resolution(Low) 2.5573
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2602
    R-Factor(R-Work) 0.2049
    R-Factor(R-Free) 0.2642
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5573
    Shell Resolution(Low) 2.6734
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2605
    R-Factor(R-Work) 0.2011
    R-Factor(R-Free) 0.2453
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6734
    Shell Resolution(Low) 2.814
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2623
    R-Factor(R-Work) 0.2032
    R-Factor(R-Free) 0.242
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.814
    Shell Resolution(Low) 2.9897
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2671
    R-Factor(R-Work) 0.1981
    R-Factor(R-Free) 0.2291
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9897
    Shell Resolution(Low) 3.2197
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2699
    R-Factor(R-Work) 0.1885
    R-Factor(R-Free) 0.2374
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2197
    Shell Resolution(Low) 3.542
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2722
    R-Factor(R-Work) 0.1642
    R-Factor(R-Free) 0.1999
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.542
    Shell Resolution(Low) 4.0508
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2707
    R-Factor(R-Work) 0.1421
    R-Factor(R-Free) 0.197
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0508
    Shell Resolution(Low) 5.0893
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2725
    R-Factor(R-Work) 0.1245
    R-Factor(R-Free) 0.1509
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.0893
    Shell Resolution(Low) 19.8642
    Number of Reflections(R-Free) 163
    Number of Reflections(R-Work) 2761
    R-Factor(R-Work) 0.1718
    R-Factor(R-Free) 0.1778
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.079
    f_dihedral_angle_d 14.64
    f_angle_d 1.114
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4453
    Nucleic Acid Atoms 0
    Heterogen Atoms 88
    Solvent Atoms 529
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC Quantum
    Data Reduction (intensity integration) DENZO
    Data Reduction (data scaling) SCALEPACK
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.7.3_928)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.3_928)
    model building PHASER
    data collection ADSC version: Quantum