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X-RAY DIFFRACTION
Materials and Methods page
4EGZ
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 4.2
    Temperature 298.0
    Details 0.1M sodium acetate, 200mM KCl, 25% PEG 8000, pH 4.2, VAPOR DIFFUSION, HANGING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 46.16 α = 90
    b = 46.16 β = 90
    c = 171.2 γ = 90
     
    Space Group
    Space Group Name:    P 43
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MAR CCD 165 mm
    Collection Date 2010-07-01
     
    Diffraction Radiation
    Monochromator GRAPHITE
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE BM14
    Wavelength List 1.0
    Site ESRF
    Beamline BM14
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 2.3
    Resolution(Low) 50
    Percent Possible(Observed) 99.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 2.3
    Resolution(Low) 40.629
    Cut-off Sigma(F) 0.0
    Number of Reflections(Observed) 15195
    Number of Reflections(R-Free) 757
    Percent Reflections(Observed) 95.92
    R-Factor(Observed) 0.2224
    R-Work 0.2198
    R-Free 0.2712
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 6.827
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 6.827
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -13.654
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3001
    Shell Resolution(Low) 2.4777
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2692
    R-Factor(R-Work) 0.3254
    R-Factor(R-Free) 0.4155
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4777
    Shell Resolution(Low) 2.727
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2906
    R-Factor(R-Work) 0.2861
    R-Factor(R-Free) 0.3749
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.727
    Shell Resolution(Low) 3.1215
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 2964
    R-Factor(R-Work) 0.2572
    R-Factor(R-Free) 0.2985
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1215
    Shell Resolution(Low) 3.9322
    Number of Reflections(R-Free) 169
    Number of Reflections(R-Work) 2949
    R-Factor(R-Work) 0.1991
    R-Factor(R-Free) 0.266
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9322
    Shell Resolution(Low) 40.6354
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2927
    R-Factor(R-Work) 0.1978
    R-Factor(R-Free) 0.2312
    Percent Reflections(Observed) 96.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.069
    f_dihedral_angle_d 24.838
    f_angle_d 1.208
    f_bond_d 0.01
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1281
    Nucleic Acid Atoms 855
    Heterogen Atoms 20
    Solvent Atoms 145
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution SHELXS
    Structure Refinement PHENIX (phenix.refine: 1.7_650)
     
    Software
    refinement REFMAC version: 5.5.0072
    model building SHELXS
    data collection HKL-2000