X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 4.2
Temperature 298.0
Details 26% PEG 8000, pH 4.2, VAPOR DIFFUSION, HANGING DROP, temperature 298K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 139.73 α = 90
b = 42.52 β = 114.43
c = 67.58 γ = 90
Symmetry
Space Group C 1 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MAR CCD 165 mm -- 2011-01-12
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE BM14 1.0 ESRF BM14

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.3 50 98.0 -- -- -- -- -- n/a 1.0 1.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.3 2.42 97.0 0.378 -- 2.4 3.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.301 35.959 -- 1.34 -- 15834 953 96.73 -- 0.2247 0.2222 0.2623 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.3011 2.4224 -- 148 2094 0.3482 0.3842 -- 96.0
X Ray Diffraction 2.4224 2.5741 -- 132 2100 0.2811 0.3602 -- 97.0
X Ray Diffraction 2.5741 2.7728 -- 131 2121 0.2506 0.357 -- 97.0
X Ray Diffraction 2.7728 3.0517 -- 158 2113 0.2518 0.2899 -- 97.0
X Ray Diffraction 3.0517 3.493 -- 100 2118 0.2229 0.2416 -- 96.0
X Ray Diffraction 3.493 4.3995 -- 141 2133 0.1943 0.219 -- 97.0
X Ray Diffraction 4.3995 35.9633 -- 143 2202 0.1941 0.2372 -- 97.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] 17.79
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 15.3169
Anisotropic B[2][2] -9.6515
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -8.1385
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.006
f_chiral_restr 0.061
f_dihedral_angle_d 24.522
f_angle_d 1.272
f_bond_d 0.007
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1181
Nucleic Acid Atoms 855
Heterogen Atoms 13
Solvent Atoms 101

Software

Computing
Computing Package Purpose
HKL-2000 Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
SHELXS Structure Solution
PHENIX (phenix.refine: 1.7_650) Structure Refinement
Software
Software Name Purpose
PHENIX refinement
CNS version: 1.2 refinement
REFMAC version: 5.5.0072 refinement
SHELXS model building
HKL-2000 data collection