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X-RAY DIFFRACTION
Materials and Methods page
4EGY
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 4.2
    Temperature 298.0
    Details 26% PEG 8000, pH 4.2, VAPOR DIFFUSION, HANGING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 139.73 α = 90
    b = 42.52 β = 114.43
    c = 67.58 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MAR CCD 165 mm
    Collection Date 2011-01-12
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE BM14
    Wavelength List 1.0
    Site ESRF
    Beamline BM14
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 2.3
    Resolution(Low) 50
    Percent Possible(Observed) 98.0
     
    High Resolution Shell Details
    Resolution(High) 2.3
    Resolution(Low) 2.42
    Percent Possible(All) 97.0
    R Merge I(Observed) 0.378
    Mean I Over Sigma(Observed) 2.4
    Redundancy 3.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.301
    Resolution(Low) 35.959
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 15834
    Number of Reflections(R-Free) 953
    Percent Reflections(Observed) 96.73
    R-Factor(Observed) 0.2247
    R-Work 0.2222
    R-Free 0.2623
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 17.79
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 15.3169
    Anisotropic B[2][2] -9.6515
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -8.1385
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3011
    Shell Resolution(Low) 2.4224
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2094
    R-Factor(R-Work) 0.3482
    R-Factor(R-Free) 0.3842
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4224
    Shell Resolution(Low) 2.5741
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2100
    R-Factor(R-Work) 0.2811
    R-Factor(R-Free) 0.3602
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5741
    Shell Resolution(Low) 2.7728
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2121
    R-Factor(R-Work) 0.2506
    R-Factor(R-Free) 0.357
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7728
    Shell Resolution(Low) 3.0517
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 2113
    R-Factor(R-Work) 0.2518
    R-Factor(R-Free) 0.2899
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0517
    Shell Resolution(Low) 3.493
    Number of Reflections(R-Free) 100
    Number of Reflections(R-Work) 2118
    R-Factor(R-Work) 0.2229
    R-Factor(R-Free) 0.2416
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.493
    Shell Resolution(Low) 4.3995
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2133
    R-Factor(R-Work) 0.1943
    R-Factor(R-Free) 0.219
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3995
    Shell Resolution(Low) 35.9633
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2202
    R-Factor(R-Work) 0.1941
    R-Factor(R-Free) 0.2372
    Percent Reflections(Observed) 97.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.061
    f_dihedral_angle_d 24.522
    f_angle_d 1.272
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1181
    Nucleic Acid Atoms 855
    Heterogen Atoms 13
    Solvent Atoms 101
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution SHELXS
    Structure Refinement PHENIX (phenix.refine: 1.7_650)
     
    Software
    refinement PHENIX
    refinement CNS version: 1.2
    refinement REFMAC version: 5.5.0072
    model building SHELXS
    data collection HKL-2000