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X-RAY DIFFRACTION
Materials and Methods page
4EGX
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 5.8
    Temperature 289.0
    Details 18% (w/v) PEG 5000 MME, 8% (v/v) Tacsimate (pH 6.0), 0.1 M Bis-Tris, pH 5.8, VAPOR DIFFUSION, HANGING DROP, temperature 289K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 83.94 α = 90
    b = 87.86 β = 90
    c = 101.69 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 225 mm CCD
    Collection Date 2010-09-01
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRF BEAMLINE BL17U
    Wavelength List 0.979
    Site SSRF
    Beamline BL17U
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 3.0
    Resolution(High) 2.5
    Resolution(Low) 50
    Number Reflections(All) 25983
    Number Reflections(Observed) 24084
    Percent Possible(Observed) 97.6
    R Merge I(Observed) 0.103
    Redundancy 2.6
     
    High Resolution Shell Details
    Resolution(High) 2.5
    Resolution(Low) 2.54
    Percent Possible(All) 97.7
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.51
    Resolution(Low) 50.0
    Number of Reflections(Observed) 24084
    Number of Reflections(R-Free) 1286
    Percent Reflections(Observed) 96.36
    R-Factor(Observed) 0.25325
    R-Work 0.25168
    R-Free 0.28257
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 39.229
    Anisotropic B[1][1] 0.48
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 1.89
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -2.37
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.511
    Shell Resolution(Low) 2.576
    Number of Reflections(R-Free) 89
    Number of Reflections(R-Work) 1500
    R-Factor(R-Work) 0.305
    R-Factor(R-Free) 0.402
    Percent Reflections(Observed) 83.11
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_scangle_it 1.633
    r_scbond_it 1.076
    r_mcangle_it 0.67
    r_mcbond_it 0.537
    r_nbd_refined 0.231
    r_gen_planes_refined 0.004
    r_chiral_restr 0.078
    r_dihedral_angle_4_deg 21.643
    r_dihedral_angle_3_deg 20.817
    r_dihedral_angle_2_deg 34.713
    r_dihedral_angle_1_deg 6.138
    r_angle_refined_deg 1.267
    r_bond_refined_d 0.01
    r_nbtor_refined 0.309
    r_xyhbond_nbd_refined 0.175
    r_symmetry_vdw_refined 0.243
    r_symmetry_hbond_refined 0.222
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 5405
    Nucleic Acid Atoms 0
    Heterogen Atoms 26
    Solvent Atoms 160
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution Phaser
    Structure Refinement REFMAC 5.2.0019
     
    Software
    refinement REFMAC version: 5.2.0019
    model building Phaser
    data collection HKL-2000