X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 5.8
Temperature 289.0
Details 18% (w/v) PEG 5000 MME, 8% (v/v) Tacsimate (pH 6.0), 0.1 M Bis-Tris, pH 5.8, VAPOR DIFFUSION, HANGING DROP, temperature 289K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 83.94 α = 90
b = 87.86 β = 90
c = 101.69 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 225 mm CCD -- 2010-09-01
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRF BEAMLINE BL17U 0.979 SSRF BL17U

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.5 50 97.6 0.103 -- -- 2.6 25983 24084 -- 3.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.5 2.54 97.7 -- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.51 50.0 -- -- -- 24084 1286 96.36 -- 0.25325 0.25168 0.28257 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.511 2.576 -- 89 1500 0.305 0.402 -- 83.11
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 39.229
Anisotropic B[1][1] 0.48
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 1.89
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -2.37
RMS Deviations
Key Refinement Restraint Deviation
r_scangle_it 1.633
r_scbond_it 1.076
r_mcangle_it 0.67
r_mcbond_it 0.537
r_nbd_refined 0.231
r_gen_planes_refined 0.004
r_chiral_restr 0.078
r_dihedral_angle_4_deg 21.643
r_dihedral_angle_3_deg 20.817
r_dihedral_angle_2_deg 34.713
r_dihedral_angle_1_deg 6.138
r_angle_refined_deg 1.267
r_bond_refined_d 0.01
r_nbtor_refined 0.309
r_xyhbond_nbd_refined 0.175
r_symmetry_vdw_refined 0.243
r_symmetry_hbond_refined 0.222
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 5405
Nucleic Acid Atoms 0
Heterogen Atoms 26
Solvent Atoms 160

Software

Computing
Computing Package Purpose
HKL-2000 Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
Phaser Structure Solution
REFMAC 5.2.0019 Structure Refinement
Software
Software Name Purpose
REFMAC version: 5.2.0019 refinement
Phaser model building
HKL-2000 data collection