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X-RAY DIFFRACTION
Materials and Methods page
4EGC
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 5.1
    Temperature 291.0
    Details 13.75% PEG8000, 0.01 M magnesium chloride, 0.05 M MES, pH 5.1, VAPOR DIFFUSION, HANGING DROP, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 123.21 α = 90
    b = 150.18 β = 90
    c = 53.92 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 85
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2011-07-23
     
    Diffraction Radiation
    Monochromator Rosenbaum-Rock high-resolution double-crystal Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 19-ID
    Wavelength List 0.97912
    Site APS
    Beamline 19-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.48
    Resolution(Low) 50
    Number Reflections(Observed) 145786
    Percent Possible(Observed) 87.6
    R Merge I(Observed) 0.081
    Redundancy 7.1
     
    High Resolution Shell Details
    Resolution(High) 1.48
    Resolution(Low) 1.51
    Percent Possible(All) 39.8
    Redundancy 1.4
    Number Unique Reflections(All) 3271
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 1.994
    Resolution(Low) 36.032
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 68728
    Number of Reflections(R-Free) 3488
    Percent Reflections(Observed) 99.51
    R-Factor(Observed) 0.1861
    R-Work 0.184
    R-Free 0.2241
     
    Temperature Factor Modeling
    Mean Isotropic B Value 30.673
    Anisotropic B[1][1] -6.8795
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 3.4778
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 3.4016
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.994
    Shell Resolution(Low) 2.0217
    Number of Reflections(R-Free) 122
    Number of Reflections(R-Work) 2385
    R-Factor(R-Work) 0.2297
    R-Factor(R-Free) 0.2906
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0217
    Shell Resolution(Low) 2.0506
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2571
    R-Factor(R-Work) 0.216
    R-Factor(R-Free) 0.262
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0506
    Shell Resolution(Low) 2.0812
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2588
    R-Factor(R-Work) 0.2115
    R-Factor(R-Free) 0.276
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0812
    Shell Resolution(Low) 2.1137
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2566
    R-Factor(R-Work) 0.2107
    R-Factor(R-Free) 0.2811
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1137
    Shell Resolution(Low) 2.1484
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2630
    R-Factor(R-Work) 0.2113
    R-Factor(R-Free) 0.2497
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1484
    Shell Resolution(Low) 2.1854
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2581
    R-Factor(R-Work) 0.2051
    R-Factor(R-Free) 0.2604
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1854
    Shell Resolution(Low) 2.2251
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2574
    R-Factor(R-Work) 0.2073
    R-Factor(R-Free) 0.2958
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2251
    Shell Resolution(Low) 2.2679
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2594
    R-Factor(R-Work) 0.2057
    R-Factor(R-Free) 0.2631
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2679
    Shell Resolution(Low) 2.3142
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2613
    R-Factor(R-Work) 0.2078
    R-Factor(R-Free) 0.2601
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3142
    Shell Resolution(Low) 2.3645
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2586
    R-Factor(R-Work) 0.2004
    R-Factor(R-Free) 0.3225
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3645
    Shell Resolution(Low) 2.4195
    Number of Reflections(R-Free) 121
    Number of Reflections(R-Work) 2609
    R-Factor(R-Work) 0.1974
    R-Factor(R-Free) 0.2501
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4195
    Shell Resolution(Low) 2.48
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2580
    R-Factor(R-Work) 0.2018
    R-Factor(R-Free) 0.256
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.48
    Shell Resolution(Low) 2.5471
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2590
    R-Factor(R-Work) 0.2043
    R-Factor(R-Free) 0.2717
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5471
    Shell Resolution(Low) 2.622
    Number of Reflections(R-Free) 120
    Number of Reflections(R-Work) 2613
    R-Factor(R-Work) 0.2067
    R-Factor(R-Free) 0.2516
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.622
    Shell Resolution(Low) 2.7066
    Number of Reflections(R-Free) 173
    Number of Reflections(R-Work) 2592
    R-Factor(R-Work) 0.1821
    R-Factor(R-Free) 0.2427
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7066
    Shell Resolution(Low) 2.8033
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2603
    R-Factor(R-Work) 0.1952
    R-Factor(R-Free) 0.2378
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8033
    Shell Resolution(Low) 2.9155
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2585
    R-Factor(R-Work) 0.1945
    R-Factor(R-Free) 0.2288
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9155
    Shell Resolution(Low) 3.0481
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2632
    R-Factor(R-Work) 0.195
    R-Factor(R-Free) 0.2595
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0481
    Shell Resolution(Low) 3.2087
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2649
    R-Factor(R-Work) 0.189
    R-Factor(R-Free) 0.2194
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2087
    Shell Resolution(Low) 3.4096
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2639
    R-Factor(R-Work) 0.1845
    R-Factor(R-Free) 0.23
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4096
    Shell Resolution(Low) 3.6726
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2616
    R-Factor(R-Work) 0.1687
    R-Factor(R-Free) 0.2121
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6726
    Shell Resolution(Low) 4.0418
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2643
    R-Factor(R-Work) 0.1598
    R-Factor(R-Free) 0.1867
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0418
    Shell Resolution(Low) 4.6256
    Number of Reflections(R-Free) 173
    Number of Reflections(R-Work) 2660
    R-Factor(R-Work) 0.1442
    R-Factor(R-Free) 0.1725
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6256
    Shell Resolution(Low) 5.8238
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2716
    R-Factor(R-Work) 0.163
    R-Factor(R-Free) 0.1815
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.8238
    Shell Resolution(Low) 36.0378
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 2825
    R-Factor(R-Work) 0.1858
    R-Factor(R-Free) 0.1906
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 12.546
    f_plane_restr 0.004
    f_chiral_restr 0.069
    f_angle_d 1.045
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 6295
    Nucleic Acid Atoms 0
    Heterogen Atoms 24
    Solvent Atoms 812
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-3000
    Data Reduction (intensity integration) DENZO
    Data Reduction (data scaling) SCALEPACK
    Structure Solution MLPHARE
    Structure Refinement PHENIX (phenix.refine: 1.7.3_928)
     
    Software
    data extraction pdb_extract version: 3.10
    refinement phenix
    data reduction SCALEPACK
    data collection DENZO