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X-RAY DIFFRACTION
Materials and Methods page
4EFA
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6
    Temperature 292.0
    Details 0.1 M lithium sulfate, 0.1 M MES, 20% PEG mme 2000, 0.15 M glycine , pH 6, VAPOR DIFFUSION, HANGING DROP, temperature 292K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 51.54 α = 90
    b = 93.65 β = 90
    c = 116.89 γ = 90
     
    Space Group
    Space Group Name:    P 2 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 270
    Collection Date 2011-10-22
     
    Diffraction Radiation
    Monochromator Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type CHESS BEAMLINE F1
    Wavelength List 0.918
    Site CHESS
    Beamline F1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2.8
    Resolution(Low) 40
    Number Reflections(All) 14238
    Number Reflections(Observed) 14187
    Percent Possible(Observed) 99.9
    R Merge I(Observed) 0.132
    Redundancy 13.9
     
    High Resolution Shell Details
    Resolution(High) 2.8
    Resolution(Low) 2.85
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.0
    Mean I Over Sigma(Observed) 2.306
    R-Sym I(Observed) 0.0
    Redundancy 14.1
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.8163
    Resolution(Low) 38.655
    Cut-off Sigma(F) 1.34
    Number of Reflections(all) 14238
    Number of Reflections(Observed) 14187
    Number of Reflections(R-Free) 1418
    Percent Reflections(Observed) 99.3
    R-Factor(Observed) 0.2345
    R-Work 0.2295
    R-Free 0.2767
    R-Free Selection Details random using lattice symmetry
     
    Temperature Factor Modeling
    Mean Isotropic B Value 93.5261
    Anisotropic B[1][1] -6.3956
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 1.4884
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 4.9071
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8163
    Shell Resolution(Low) 2.9169
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 1209
    R-Factor(R-Work) 0.3358
    R-Factor(R-Free) 0.3715
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9169
    Shell Resolution(Low) 3.0337
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 1280
    R-Factor(R-Work) 0.2997
    R-Factor(R-Free) 0.3434
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0337
    Shell Resolution(Low) 3.1717
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 1240
    R-Factor(R-Work) 0.2942
    R-Factor(R-Free) 0.3592
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1717
    Shell Resolution(Low) 3.3388
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 1276
    R-Factor(R-Work) 0.2755
    R-Factor(R-Free) 0.3397
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3388
    Shell Resolution(Low) 3.5479
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 1257
    R-Factor(R-Work) 0.2665
    R-Factor(R-Free) 0.2964
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5479
    Shell Resolution(Low) 3.8216
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 1255
    R-Factor(R-Work) 0.2341
    R-Factor(R-Free) 0.2799
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8216
    Shell Resolution(Low) 4.2057
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 1273
    R-Factor(R-Work) 0.2223
    R-Factor(R-Free) 0.2897
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2057
    Shell Resolution(Low) 4.8133
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 1293
    R-Factor(R-Work) 0.1829
    R-Factor(R-Free) 0.2367
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.8133
    Shell Resolution(Low) 6.0605
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 1312
    R-Factor(R-Work) 0.2168
    R-Factor(R-Free) 0.2527
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.0605
    Shell Resolution(Low) 38.6587
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 1374
    R-Factor(R-Work) 0.206
    R-Factor(R-Free) 0.2473
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 7.851
    f_plane_restr 0.002
    f_chiral_restr 0.035
    f_angle_d 0.499
    f_bond_d 0.002
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3385
    Nucleic Acid Atoms 0
    Heterogen Atoms 20
    Solvent Atoms 24
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC Quantum
    Data Reduction (intensity integration) HKL
    Data Reduction (data scaling) HKL
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: dev_1012)
     
    Software
    data extraction pdb_extract version: 3.10
    refinement phenix
    molecular replacement Phaser version: 2.5.0
    data reduction HKL