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X-RAY DIFFRACTION
Materials and Methods page
4EF8
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 5.6
    Temperature 295.0
    Details 0.1M SODIUM CITRATE TRIBASIC DIHYDRATE pH 5.6, 1.3M LITHIUM SULFATE, 0.3M AMMONIUM SULFATE, VAPOR DIFFUSION, SITTING DROP, temperature 295K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 144.19 α = 90
    b = 144.19 β = 90
    c = 69.87 γ = 120
     
    Space Group
    Space Group Name:    P 61
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 225 mm CCD
    Collection Date 2011-11-08
     
    Diffraction Radiation
    Monochromator Si(111) double-crystal
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type LNLS BEAMLINE W01B-MX2
    Wavelength List 1.461
    Site LNLS
    Beamline W01B-MX2
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.5
    Resolution(High) 1.56
    Resolution(Low) 22.43
    Number Reflections(All) 116828
    Number Reflections(Observed) 116828
    Percent Possible(Observed) 99.9
    R Merge I(Observed) 0.077
    B(Isotropic) From Wilson Plot 17.9
    Redundancy 8.8
     
    High Resolution Shell Details
    Resolution(High) 1.56
    Resolution(Low) 1.65
    Percent Possible(All) 99.9
    R Merge I(Observed) 0.218
    Mean I Over Sigma(Observed) 7.8
    R-Sym I(Observed) 0.218
    Redundancy 7.8
    Number Unique Reflections(All) 16994
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.56
    Resolution(Low) 22.43
    Number of Reflections(all) 110920
    Number of Reflections(Observed) 110920
    Number of Reflections(R-Free) 5843
    Percent Reflections(Observed) 99.84
    R-Factor(Observed) 0.17726
    R-Work 0.17639
    R-Free 0.19352
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 17.43
    Anisotropic B[1][1] 0.0
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 0.0
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.0
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.563
    Shell Resolution(Low) 1.603
    Number of Reflections(R-Free) 410
    Number of Reflections(R-Work) 7985
    R-Factor(R-Work) 0.271
    R-Factor(R-Free) 0.288
    Percent Reflections(Observed) 99.92
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_gen_planes_refined 0.007
    r_chiral_restr 0.085
    r_dihedral_angle_4_deg 14.545
    r_dihedral_angle_3_deg 11.247
    r_dihedral_angle_2_deg 40.094
    r_dihedral_angle_1_deg 5.878
    r_angle_refined_deg 1.275
    r_bond_refined_d 0.004
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4731
    Nucleic Acid Atoms 0
    Heterogen Atoms 114
    Solvent Atoms 608
     
     
  •   Software and Computing Hide
    Computing
    Data Collection NatXray software
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution MOLREP
    Structure Refinement REFMAC 5.6.0117
     
    Software
    refinement REFMAC version: 5.6.0117
    model building MOLREP
    data collection NatXray version: software