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X-RAY DIFFRACTION
Materials and Methods page
4EE7
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 4.6
    Temperature 293.0
    Details 200 mM (NH4)2SO4, 30% (w/v) PEG2000MME, 100 mM sodium acetate 4.6, VAPOR DIFFUSION, SITTING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 42.11 α = 90
    b = 97.01 β = 90
    c = 135.86 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 225 mm CCD
    Collection Date 2010-05-07
     
    Diffraction Radiation
    Monochromator DCCM
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SLS BEAMLINE X06DA
    Wavelength List 1.00000
    Site SLS
    Beamline X06DA
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) -3.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.67
    Resolution(Low) 30
    Number Reflections(All) 65578
    Number Reflections(Observed) 65469
    Percent Possible(Observed) 99.8
     
    High Resolution Shell Details
    Resolution(High) 1.67
    Resolution(Low) 1.71
    Percent Possible(All) 99.4
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method PHASER
    reflnsShellList 1.67
    Resolution(Low) 29.39
    Number of Reflections(all) 62847
    Number of Reflections(Observed) 62847
    Number of Reflections(R-Free) 2619
    Percent Reflections(Observed) 100.0
    R-Factor(Observed) 0.18908
    R-Work 0.18765
    R-Free 0.22383
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 15.188
    Anisotropic B[1][1] -0.2
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 0.5
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.3
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.67
    Shell Resolution(Low) 1.713
    Number of Reflections(R-Free) 189
    Number of Reflections(R-Work) 4527
    R-Factor(R-Work) 0.241
    R-Factor(R-Free) 0.279
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_scangle_it 3.617
    r_scbond_it 2.581
    r_mcangle_it 2.188
    r_mcbond_other 0.658
    r_bond_refined_d 0.011
    r_bond_other_d 0.001
    r_angle_refined_deg 1.418
    r_angle_other_deg 0.872
    r_dihedral_angle_1_deg 6.053
    r_dihedral_angle_2_deg 31.525
    r_dihedral_angle_3_deg 12.842
    r_dihedral_angle_4_deg 10.511
    r_chiral_restr 0.091
    r_gen_planes_refined 0.006
    r_gen_planes_other 0.001
    r_mcbond_it 1.523
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4480
    Nucleic Acid Atoms 0
    Heterogen Atoms 83
    Solvent Atoms 634
     
     
  •   Software and Computing Hide
    Computing
    Data Collection SLS X06DA
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution PHASER
    Structure Refinement REFMAC 5.5.0109
     
    Software
    refinement REFMAC version: 5.5.0109
    model building PHASER
    data collection SLS version: X06DA