X-RAY DIFFRACTION Experimental Data & Validation


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Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 8.5
Temperature 288.0
Details 1.7 M (NH4)2SO4, 0.2 M Li2SO4, 4 % Gamma-butyrolactone, 0.1 M Tris pH 8.5, VAPOR DIFFUSION, HANGING DROP, temperature 288K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 121.57 α = 90
b = 121.57 β = 90
c = 121.57 γ = 90
Symmetry
Space Group I 21 3

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MAR CCD 165 mm -- 2008-09-10
Diffraction Radiation
Monochromator Protocol
SI (111) DOUBLE CRYSTAL SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON MAX II BEAMLINE I911-2 1.038 MAX II I911-2

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3 50 96.9 0.064 -- -- 3.32 -- 11254 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
3.0 3.08 93.3 0.632 -- 1.76 3.12 791

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 3.002 24.815 -- 1.29 -- 11245 1097 96.83 -- 0.2597 0.2538 0.3113 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 3.002 3.1383 -- 132 1250 0.3487 0.4135 -- 95.0
X Ray Diffraction 3.1383 3.3034 -- 110 1339 0.3441 0.4149 -- 100.0
X Ray Diffraction 3.3034 3.5099 -- 140 1245 0.3805 0.5102 -- 95.0
X Ray Diffraction 3.5099 3.78 -- 140 1215 0.3416 0.4964 -- 95.0
X Ray Diffraction 3.78 4.1588 -- 114 1235 0.2913 0.3752 -- 94.0
X Ray Diffraction 4.1588 4.7569 -- 147 1315 0.2128 0.2654 -- 99.0
X Ray Diffraction 4.7569 5.9793 -- 153 1282 0.2008 0.2761 -- 99.0
X Ray Diffraction 5.9793 24.8162 -- 161 1267 0.2086 0.2315 -- 98.0
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.008
f_chiral_restr 0.088
f_dihedral_angle_d 19.949
f_angle_d 1.271
f_bond_d 0.006
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 883
Nucleic Acid Atoms 0
Heterogen Atoms 1
Solvent Atoms 0

Software

Computing
Computing Package Purpose
XDS Data Reduction (intensity integration)
XSCALE Data Reduction (data scaling)
PHASER Structure Solution
PHENIX (phenix.refine: 1.7.2_869) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.7.2_869) refinement
PHASER model building