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X-RAY DIFFRACTION
Materials and Methods page
4EC2
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8.5
    Temperature 288.0
    Details 1.7 M (NH4)2SO4, 0.2 M Li2SO4, 4 % Gamma-butyrolactone, 0.1 M Tris pH 8.5, VAPOR DIFFUSION, HANGING DROP, temperature 288K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 121.57 α = 90
    b = 121.57 β = 90
    c = 121.57 γ = 90
     
    Space Group
    Space Group Name:    I 21 3
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MAR CCD 165 mm
    Collection Date 2008-09-10
     
    Diffraction Radiation
    Monochromator SI (111) DOUBLE CRYSTAL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type MAX II BEAMLINE I911-2
    Wavelength List 1.038
    Site MAX II
    Beamline I911-2
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 3
    Resolution(Low) 50
    Number Reflections(Observed) 11254
    Percent Possible(Observed) 96.9
    R Merge I(Observed) 0.064
    Redundancy 3.32
     
    High Resolution Shell Details
    Resolution(High) 3.0
    Resolution(Low) 3.08
    Percent Possible(All) 93.3
    R Merge I(Observed) 0.632
    Mean I Over Sigma(Observed) 1.76
    Redundancy 3.12
    Number Unique Reflections(All) 791
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.002
    Resolution(Low) 24.815
    Cut-off Sigma(F) 1.29
    Number of Reflections(Observed) 11245
    Number of Reflections(R-Free) 1097
    Percent Reflections(Observed) 96.83
    R-Factor(Observed) 0.2597
    R-Work 0.2538
    R-Free 0.3113
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.002
    Shell Resolution(Low) 3.1383
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 1250
    R-Factor(R-Work) 0.3487
    R-Factor(R-Free) 0.4135
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1383
    Shell Resolution(Low) 3.3034
    Number of Reflections(R-Free) 110
    Number of Reflections(R-Work) 1339
    R-Factor(R-Work) 0.3441
    R-Factor(R-Free) 0.4149
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3034
    Shell Resolution(Low) 3.5099
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 1245
    R-Factor(R-Work) 0.3805
    R-Factor(R-Free) 0.5102
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5099
    Shell Resolution(Low) 3.78
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 1215
    R-Factor(R-Work) 0.3416
    R-Factor(R-Free) 0.4964
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.78
    Shell Resolution(Low) 4.1588
    Number of Reflections(R-Free) 114
    Number of Reflections(R-Work) 1235
    R-Factor(R-Work) 0.2913
    R-Factor(R-Free) 0.3752
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1588
    Shell Resolution(Low) 4.7569
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 1315
    R-Factor(R-Work) 0.2128
    R-Factor(R-Free) 0.2654
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7569
    Shell Resolution(Low) 5.9793
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 1282
    R-Factor(R-Work) 0.2008
    R-Factor(R-Free) 0.2761
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.9793
    Shell Resolution(Low) 24.8162
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 1267
    R-Factor(R-Work) 0.2086
    R-Factor(R-Free) 0.2315
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.008
    f_chiral_restr 0.088
    f_dihedral_angle_d 19.949
    f_angle_d 1.271
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 883
    Nucleic Acid Atoms 0
    Heterogen Atoms 1
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.7.2_869)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.2_869)
    model building PHASER