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X-RAY DIFFRACTION
Materials and Methods page
4EBR
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8
    Temperature 293.0
    Details 50mM bis-Tris-HCl (pH 6.15), 3M NaCl, 1mM 1,4-diacetoxymercury-2,3-dimetoxybutane, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 127.83 α = 90
    b = 127.83 β = 90
    c = 169.59 γ = 120
     
    Space Group
    Space Group Name:    P 61 2 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 210
    Collection Date 2010-02-08
    Detector CCD
    Type ADSC QUANTUM 315
    Collection Date 2009-11-07
     
    Diffraction Radiation
    Monochromator double crystal monochromator
    Diffraction Protocol SINGLE WAVELENGTH
    Monochromator double crystal monochromator
    Diffraction Protocol MAD
     
    Diffraction Source
    Source SYNCHROTRON
    Type PHOTON FACTORY BEAMLINE AR-NW12A
    Wavelength List 1
    Site PHOTON FACTORY
    Beamline AR-NW12A
    Source SYNCHROTRON
    Type PAL/PLS BEAMLINE 4A
    Wavelength List 0.97951, 0.97966, 0.96
    Site PAL/PLS
    Beamline 4A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2.7
    Resolution(Low) 27.83
    Number Reflections(All) 23338
    Number Reflections(Observed) 23007
    Percent Possible(Observed) 98.58
     
    High Resolution Shell Details
    Resolution(High) 2.7
    Resolution(Low) 2.75
    Percent Possible(All) 100.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MAD
    reflnsShellList 2.701
    Resolution(Low) 27.835
    Cut-off Sigma(F) 0.15
    Number of Reflections(all) 23056
    Number of Reflections(Observed) 21751
    Number of Reflections(R-Free) 1886
    Percent Reflections(Observed) 94.34
    R-Factor(Observed) 0.224
    R-Work 0.2107
    R-Free 0.2511
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 0.7844
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 0.7844
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -1.5688
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7012
    Shell Resolution(Low) 2.7742
    Number of Reflections(R-Free) 121
    Number of Reflections(R-Work) 1295
    R-Factor(R-Work) 0.316
    R-Factor(R-Free) 0.3601
    Percent Reflections(Observed) 82.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7742
    Shell Resolution(Low) 2.8558
    Number of Reflections(R-Free) 124
    Number of Reflections(R-Work) 1360
    R-Factor(R-Work) 0.3086
    R-Factor(R-Free) 0.3275
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8558
    Shell Resolution(Low) 2.9478
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 1538
    R-Factor(R-Work) 0.2662
    R-Factor(R-Free) 0.3335
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9478
    Shell Resolution(Low) 3.0531
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 1550
    R-Factor(R-Work) 0.253
    R-Factor(R-Free) 0.2796
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0531
    Shell Resolution(Low) 3.1752
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 1527
    R-Factor(R-Work) 0.2412
    R-Factor(R-Free) 0.3019
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1752
    Shell Resolution(Low) 3.3194
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 1504
    R-Factor(R-Work) 0.2319
    R-Factor(R-Free) 0.2496
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3194
    Shell Resolution(Low) 3.4941
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 1467
    R-Factor(R-Work) 0.2129
    R-Factor(R-Free) 0.2481
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4941
    Shell Resolution(Low) 3.7126
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 1544
    R-Factor(R-Work) 0.2097
    R-Factor(R-Free) 0.2629
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7126
    Shell Resolution(Low) 3.9985
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 1545
    R-Factor(R-Work) 0.1779
    R-Factor(R-Free) 0.2046
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9985
    Shell Resolution(Low) 4.3994
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 1569
    R-Factor(R-Work) 0.1653
    R-Factor(R-Free) 0.1939
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3994
    Shell Resolution(Low) 5.0328
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 1615
    R-Factor(R-Work) 0.1482
    R-Factor(R-Free) 0.1743
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.0328
    Shell Resolution(Low) 6.3285
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 1643
    R-Factor(R-Work) 0.2088
    R-Factor(R-Free) 0.2117
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.3285
    Shell Resolution(Low) 27.8367
    Number of Reflections(R-Free) 164
    Number of Reflections(R-Work) 1708
    R-Factor(R-Work) 0.2386
    R-Factor(R-Free) 0.2499
    Percent Reflections(Observed) 96.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.007
    f_chiral_restr 0.099
    f_dihedral_angle_d 16.726
    f_angle_d 1.418
    f_bond_d 0.01
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2604
    Nucleic Acid Atoms 0
    Heterogen Atoms 2
    Solvent Atoms 36
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution SOLVE
    Structure Refinement PHENIX (phenix.refine: 1.7.3_928)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.3_928)
    model building SOLVE
    data collection HKL-2000