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X-RAY DIFFRACTION
Materials and Methods page
4EAH
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    Temperature 298.0
    Details 11% PEG 10000, 0.2 M magnesium acetate, 0.1 M MES, pH 6.5, Silver Bullet 33 (0.20% w/v D-(+)-Maltose monohydrate, 0.20% w/v D-(+)-Melibiose monohydrate, 0.20% w/v D-(+)-Raffinose pentahydrate, 0.20% w/v D-(+)-Trehalose dihydrate, 0.20% w/v Stachyose hydrate, 0.02 M HEPES sodium pH 6.8), Silver Bullet 70 (0.2% w/v Anthrone, 0.2% w/v Benzidine, 0.2% w/v N-(2-Acetamido)-2-aminoethanesulfonic acid, 0.2% w/v Phenylurea, 0.2% w/v -Alanine, 0.02 M HEPES sodium pH 6.8), VAPOR DIFFUSION, HANGING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 125.98 α = 90
    b = 126.05 β = 93.17
    c = 129.62 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 300 mm CCD
    Collection Date 2010-10-18
     
    Diffraction Radiation
    Monochromator K-B pair of biomorph mirrors
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 23-ID-D
    Wavelength List 0.979
    Site APS
    Beamline 23-ID-D
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 3.4
    Resolution(Low) 19.87
    Number Reflections(All) 55841
    Number Reflections(Observed) 55419
    Percent Possible(Observed) 99.2
     
    High Resolution Shell Details
    Resolution(High) 3.4
    Resolution(Low) 3.5
    Percent Possible(All) 99.9
    Mean I Over Sigma(Observed) 2.62
    Redundancy 3.84
    Number Unique Reflections(All) 4626
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.4
    Resolution(Low) 19.819
    Cut-off Sigma(F) 1.99
    Number of Reflections(all) 55841
    Number of Reflections(Observed) 55408
    Number of Reflections(R-Free) 2894
    Percent Reflections(Observed) 99.78
    R-Factor(Observed) 0.2325
    R-Work 0.2301
    R-Free 0.2773
    R-Free Selection Details thin shells
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -17.2636
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 1.748
    Anisotropic B[2][2] -22.9013
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 40.1649
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4
    Shell Resolution(Low) 3.4555
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2443
    R-Factor(R-Work) 0.2826
    R-Factor(R-Free) 0.3361
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4555
    Shell Resolution(Low) 3.5147
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2520
    R-Factor(R-Work) 0.271
    R-Factor(R-Free) 0.3386
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5147
    Shell Resolution(Low) 3.5783
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2478
    R-Factor(R-Work) 0.2709
    R-Factor(R-Free) 0.3497
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5783
    Shell Resolution(Low) 3.6467
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2463
    R-Factor(R-Work) 0.265
    R-Factor(R-Free) 0.3321
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6467
    Shell Resolution(Low) 3.7207
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2540
    R-Factor(R-Work) 0.2513
    R-Factor(R-Free) 0.3314
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7207
    Shell Resolution(Low) 3.801
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2491
    R-Factor(R-Work) 0.2523
    R-Factor(R-Free) 0.3051
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.801
    Shell Resolution(Low) 3.8888
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2461
    R-Factor(R-Work) 0.2506
    R-Factor(R-Free) 0.3209
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8888
    Shell Resolution(Low) 3.9853
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2488
    R-Factor(R-Work) 0.2421
    R-Factor(R-Free) 0.3188
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9853
    Shell Resolution(Low) 4.0921
    Number of Reflections(R-Free) 121
    Number of Reflections(R-Work) 2530
    R-Factor(R-Work) 0.2351
    R-Factor(R-Free) 0.2866
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0921
    Shell Resolution(Low) 4.2114
    Number of Reflections(R-Free) 122
    Number of Reflections(R-Work) 2537
    R-Factor(R-Work) 0.2206
    R-Factor(R-Free) 0.2796
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2114
    Shell Resolution(Low) 4.346
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2473
    R-Factor(R-Work) 0.2076
    R-Factor(R-Free) 0.259
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.346
    Shell Resolution(Low) 4.4995
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 2472
    R-Factor(R-Work) 0.1948
    R-Factor(R-Free) 0.2351
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4995
    Shell Resolution(Low) 4.6774
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2501
    R-Factor(R-Work) 0.2032
    R-Factor(R-Free) 0.2276
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6774
    Shell Resolution(Low) 4.8873
    Number of Reflections(R-Free) 122
    Number of Reflections(R-Work) 2509
    R-Factor(R-Work) 0.2152
    R-Factor(R-Free) 0.28
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.8873
    Shell Resolution(Low) 5.1407
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2474
    R-Factor(R-Work) 0.2266
    R-Factor(R-Free) 0.2841
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.1407
    Shell Resolution(Low) 5.4565
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2502
    R-Factor(R-Work) 0.2452
    R-Factor(R-Free) 0.2623
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.4565
    Shell Resolution(Low) 5.8676
    Number of Reflections(R-Free) 106
    Number of Reflections(R-Work) 2521
    R-Factor(R-Work) 0.279
    R-Factor(R-Free) 0.3784
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.8676
    Shell Resolution(Low) 6.4396
    Number of Reflections(R-Free) 105
    Number of Reflections(R-Work) 2553
    R-Factor(R-Work) 0.2533
    R-Factor(R-Free) 0.3246
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.4396
    Shell Resolution(Low) 7.3299
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2498
    R-Factor(R-Work) 0.2438
    R-Factor(R-Free) 0.2967
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.3299
    Shell Resolution(Low) 9.0844
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2517
    R-Factor(R-Work) 0.1994
    R-Factor(R-Free) 0.2343
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 9.0844
    Shell Resolution(Low) 19.8191
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2543
    R-Factor(R-Work) 0.2092
    R-Factor(R-Free) 0.2289
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.007
    f_chiral_restr 0.102
    f_dihedral_angle_d 18.123
    f_angle_d 1.449
    f_bond_d 0.01
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 22720
    Nucleic Acid Atoms 0
    Heterogen Atoms 172
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Collection JBluIce
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XDS
    Structure Solution PHENIX AutoMR
    Structure Refinement PHENIX (phenix.refine: 1.7.3_928)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.3_928)
    model building PHENIX version: AutoMR
    data collection JBluIce