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X-RAY DIFFRACTION
Materials and Methods page
4E9A
  •   Crystallization Hide
    Crystallization Experiments
    Method EVAPORATION
    pH 7.5
    Temperature 290.0
    Details HEPES, MPD, pH 7.5, EVAPORATION, temperature 290K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 41.89 α = 90
    b = 52.06 β = 90
    c = 92.06 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector IMAGE PLATE
    Type ADSC QUANTUM 315r
    Collection Date 2011-11-22
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRF BEAMLINE BL17U
    Wavelength List 1
    Site SSRF
    Beamline BL17U
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 1.66
    Resolution(Low) 34.48
    Number Reflections(Observed) 24141
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.662
    Resolution(Low) 34.48
    Cut-off Sigma(F) 1.35
    Number of Reflections(Observed) 24141
    Number of Reflections(R-Free) 1229
    Percent Reflections(Observed) 98.84
    R-Factor(Observed) 0.2088
    R-Work 0.2076
    R-Free 0.2302
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -0.48
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 0.3879
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.0921
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6616
    Shell Resolution(Low) 1.7282
    Number of Reflections(R-Free) 112
    Number of Reflections(R-Work) 2458
    R-Factor(R-Work) 0.2692
    R-Factor(R-Free) 0.268
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7282
    Shell Resolution(Low) 1.8068
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2539
    R-Factor(R-Work) 0.2297
    R-Factor(R-Free) 0.2502
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8068
    Shell Resolution(Low) 1.9021
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2515
    R-Factor(R-Work) 0.1931
    R-Factor(R-Free) 0.2115
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9021
    Shell Resolution(Low) 2.0212
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2536
    R-Factor(R-Work) 0.1827
    R-Factor(R-Free) 0.1882
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0212
    Shell Resolution(Low) 2.1773
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2533
    R-Factor(R-Work) 0.1771
    R-Factor(R-Free) 0.2162
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1773
    Shell Resolution(Low) 2.3963
    Number of Reflections(R-Free) 118
    Number of Reflections(R-Work) 2576
    R-Factor(R-Work) 0.193
    R-Factor(R-Free) 0.207
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3963
    Shell Resolution(Low) 2.7429
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2577
    R-Factor(R-Work) 0.1957
    R-Factor(R-Free) 0.2266
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7429
    Shell Resolution(Low) 3.4553
    Number of Reflections(R-Free) 124
    Number of Reflections(R-Work) 2598
    R-Factor(R-Work) 0.1991
    R-Factor(R-Free) 0.2113
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4553
    Shell Resolution(Low) 34.4913
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2580
    R-Factor(R-Work) 0.228
    R-Factor(R-Free) 0.2546
    Percent Reflections(Observed) 95.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.073
    f_dihedral_angle_d 18.0
    f_angle_d 1.098
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1308
    Nucleic Acid Atoms 0
    Heterogen Atoms 45
    Solvent Atoms 87
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Refinement PHENIX (phenix.refine: 1.7.3_928)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.3_928)
    data collection HKL-2000