X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Evaporation
pH 7.5
Temperature 290.0
Details HEPES, MPD, pH 7.5, EVAPORATION, temperature 290K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 41.89 α = 90
b = 52.06 β = 90
c = 92.06 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE ADSC QUANTUM 315r -- 2011-11-22
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRF BEAMLINE BL17U 1 SSRF BL17U

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.66 34.48 -- -- -- -- -- -- 24141 -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.662 34.48 -- 1.35 -- 24141 1229 98.84 -- 0.2088 0.2076 0.2302 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.6616 1.7282 -- 112 2458 0.2692 0.268 -- 97.0
X Ray Diffraction 1.7282 1.8068 -- 141 2539 0.2297 0.2502 -- 100.0
X Ray Diffraction 1.8068 1.9021 -- 150 2515 0.1931 0.2115 -- 100.0
X Ray Diffraction 1.9021 2.0212 -- 142 2536 0.1827 0.1882 -- 100.0
X Ray Diffraction 2.0212 2.1773 -- 146 2533 0.1771 0.2162 -- 100.0
X Ray Diffraction 2.1773 2.3963 -- 118 2576 0.193 0.207 -- 100.0
X Ray Diffraction 2.3963 2.7429 -- 143 2577 0.1957 0.2266 -- 100.0
X Ray Diffraction 2.7429 3.4553 -- 124 2598 0.1991 0.2113 -- 99.0
X Ray Diffraction 3.4553 34.4913 -- 153 2580 0.228 0.2546 -- 95.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] -0.48
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 0.3879
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 0.0921
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.004
f_chiral_restr 0.073
f_dihedral_angle_d 18.0
f_angle_d 1.098
f_bond_d 0.007
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1308
Nucleic Acid Atoms 0
Heterogen Atoms 45
Solvent Atoms 87

Software

Computing
Computing Package Purpose
HKL-2000 Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
PHENIX (phenix.refine: 1.7.3_928) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.7.3_928) refinement
HKL-2000 data collection