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X-RAY DIFFRACTION
Materials and Methods page
4E8L
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 5.6
    Temperature 298.0
    Details 0.2 M potassium/sodium tartrate, 2 M ammonium sulfate, 0.1 M tri-sodium citrate, pH 5.6, VAPOR DIFFUSION, SITTING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 91.84 α = 90
    b = 184.04 β = 90
    c = 96.91 γ = 90
     
    Space Group
    Space Group Name:    C 2 2 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector IMAGE PLATE
    Type RIGAKU SATURN A200
    Details mirrors
    Collection Date 2011-09-07
     
    Diffraction Radiation
    Monochromator graphite
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU MICROMAX-007 HF
    Wavelength List 1.54178
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2.7
    Resolution(Low) 25
    Number Reflections(All) 22987
    Number Reflections(Observed) 22987
    Percent Possible(Observed) 100.0
    Redundancy 6.1
     
    High Resolution Shell Details
    Resolution(High) 2.696
    Resolution(Low) 2.75
    Percent Possible(All) 100.0
    Mean I Over Sigma(Observed) 2.013
    R-Sym I(Observed) 0.368
    Redundancy 6.1
    Number Unique Reflections(All) 1117
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.696
    Resolution(Low) 24.666
    Cut-off Sigma(F) 1.35
    Number of Reflections(Observed) 22955
    Number of Reflections(R-Free) 1148
    Percent Reflections(Observed) 99.72
    R-Factor(Observed) 0.2109
    R-Work 0.2084
    R-Free 0.2575
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 1.0536
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -27.5517
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -9.8098
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.696
    Shell Resolution(Low) 2.819
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2635
    R-Factor(R-Work) 0.2945
    R-Factor(R-Free) 0.3149
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.819
    Shell Resolution(Low) 2.9674
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2721
    R-Factor(R-Work) 0.2827
    R-Factor(R-Free) 0.3466
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9674
    Shell Resolution(Low) 3.1529
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2687
    R-Factor(R-Work) 0.2517
    R-Factor(R-Free) 0.3091
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1529
    Shell Resolution(Low) 3.3958
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2685
    R-Factor(R-Work) 0.241
    R-Factor(R-Free) 0.261
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3958
    Shell Resolution(Low) 3.7365
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2722
    R-Factor(R-Work) 0.2048
    R-Factor(R-Free) 0.2665
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7365
    Shell Resolution(Low) 4.2747
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2741
    R-Factor(R-Work) 0.1765
    R-Factor(R-Free) 0.2258
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2747
    Shell Resolution(Low) 5.3765
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2758
    R-Factor(R-Work) 0.1598
    R-Factor(R-Free) 0.2101
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.3765
    Shell Resolution(Low) 24.6668
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2858
    R-Factor(R-Work) 0.2019
    R-Factor(R-Free) 0.2545
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.048
    f_dihedral_angle_d 10.766
    f_angle_d 0.699
    f_bond_d 0.004
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 5087
    Nucleic Acid Atoms 0
    Heterogen Atoms 27
    Solvent Atoms 115
     
     
  •   Software and Computing Hide
    Computing
    Data Collection StructureStudio
    Data Reduction (intensity integration) HKL-3000
    Data Reduction (data scaling) HKL-3000
    Structure Solution PHENIX (phenix.phaser)
    Structure Refinement PHENIX (phenix.refine: 1.7.3_928)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.3_928)
    model building PHENIX version: (phenix.phaser)
    data collection StructureStudio