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X-RAY DIFFRACTION
Materials and Methods page
4E5Q
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.8
    Temperature 298.0
    Details 1.6 M sodium citrate, 50 mM TRIS Chloride, pH 7.8, VAPOR DIFFUSION, HANGING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 42.19 α = 90
    b = 41.01 β = 104.51
    c = 71.54 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector IMAGE PLATE
    Type RIGAKU RAXIS IV++
    Collection Date 2011-04-18
     
    Diffraction Radiation
    Monochromator Varimax optics
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU RUH3R
    Wavelength List 1.5418
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 1.7
    Resolution(Low) 20
    Number Reflections(Observed) 23826
    Percent Possible(Observed) 90.9
    R Merge I(Observed) 0.088
    Redundancy 6.8
     
    High Resolution Shell Details
    Resolution(High) 1.7
    Resolution(Low) 1.76
    Percent Possible(All) 89.2
    R Merge I(Observed) 0.549
    Redundancy 7.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.7024
    Resolution(Low) 19.909
    Cut-off Sigma(F) 1.34
    Number of Reflections(all) 26211
    Number of Reflections(Observed) 23826
    Number of Reflections(R-Free) 1982
    Percent Reflections(Observed) 90.9
    R-Factor(Observed) 0.1742
    R-Work 0.1717
    R-Free 0.2006
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 2.5341
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -0.5539
    Anisotropic B[2][2] -7.1554
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 4.6213
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7024
    Shell Resolution(Low) 1.7449
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 1488
    R-Factor(R-Work) 0.253
    R-Factor(R-Free) 0.2914
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7449
    Shell Resolution(Low) 1.7921
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 1533
    R-Factor(R-Work) 0.2283
    R-Factor(R-Free) 0.3105
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7921
    Shell Resolution(Low) 1.8448
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 1545
    R-Factor(R-Work) 0.1922
    R-Factor(R-Free) 0.2379
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8448
    Shell Resolution(Low) 1.9043
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 1498
    R-Factor(R-Work) 0.1712
    R-Factor(R-Free) 0.2155
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9043
    Shell Resolution(Low) 1.9723
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 1531
    R-Factor(R-Work) 0.1427
    R-Factor(R-Free) 0.2232
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9723
    Shell Resolution(Low) 2.0512
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 1520
    R-Factor(R-Work) 0.1489
    R-Factor(R-Free) 0.2036
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0512
    Shell Resolution(Low) 2.1444
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 1487
    R-Factor(R-Work) 0.1466
    R-Factor(R-Free) 0.2061
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1444
    Shell Resolution(Low) 2.2573
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 1528
    R-Factor(R-Work) 0.1574
    R-Factor(R-Free) 0.2173
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2573
    Shell Resolution(Low) 2.3986
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 1553
    R-Factor(R-Work) 0.1505
    R-Factor(R-Free) 0.1947
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3986
    Shell Resolution(Low) 2.5834
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 1580
    R-Factor(R-Work) 0.1647
    R-Factor(R-Free) 0.2035
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5834
    Shell Resolution(Low) 2.8427
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 1625
    R-Factor(R-Work) 0.1697
    R-Factor(R-Free) 0.1869
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8427
    Shell Resolution(Low) 3.2525
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 1652
    R-Factor(R-Work) 0.1717
    R-Factor(R-Free) 0.2142
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2525
    Shell Resolution(Low) 4.092
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 1621
    R-Factor(R-Work) 0.1582
    R-Factor(R-Free) 0.1664
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.092
    Shell Resolution(Low) 19.91
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 1683
    R-Factor(R-Work) 0.1966
    R-Factor(R-Free) 0.1946
    Percent Reflections(Observed) 94.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.008
    f_chiral_restr 0.078
    f_dihedral_angle_d 13.726
    f_angle_d 1.304
    f_bond_d 0.01
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2048
    Nucleic Acid Atoms 0
    Heterogen Atoms 4
    Solvent Atoms 114
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CrystalClear
    Data Reduction (intensity integration) HKL
    Data Reduction (data scaling) HKL
    Structure Solution PHENIX
    Structure Refinement PHENIX (phenix.refine: 1.7.2_869)
     
    Software
    data extraction pdb_extract version: 3.10
    refinement phenix
    data reduction HKL