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X-RAY DIFFRACTION
Materials and Methods page
4E2V
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8.5
    Temperature 291.15
    Details 100 mM TRIS, 1 mM DTT, 10 % DMSO, 12 % PEG 8000, pH 8.5, VAPOR DIFFUSION, HANGING DROP, temperature 291.15K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 90.36 α = 90
    b = 64.89 β = 95.82
    c = 70.38 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 113.15
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 225 mm CCD
    Details mirror
    Collection Date 2010-12-15
     
    Diffraction Radiation
    Monochromator double crystal monochromator
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type BESSY BEAMLINE 14.2
    Wavelength List 0.91841
    Site BESSY
    Beamline 14.2
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 1.18
    Resolution(Low) 30
    Number Reflections(All) 125858
    Number Reflections(Observed) 125858
    Percent Possible(Observed) 95.0
    B(Isotropic) From Wilson Plot 10.42
    Redundancy 2.5
     
    High Resolution Shell Details
    Resolution(High) 1.18
    Resolution(Low) 1.2
    Percent Possible(All) 88.0
    Mean I Over Sigma(Observed) 4.13
    R-Sym I(Observed) 0.218
    Redundancy 2.2
    Number Unique Reflections(All) 5750
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.18
    Resolution(Low) 21.031
    Cut-off Sigma(F) 1.0
    Number of Reflections(all) 121156
    Number of Reflections(Observed) 121156
    Number of Reflections(R-Free) 12053
    Percent Reflections(Observed) 91.49
    R-Factor(Observed) 0.1391
    R-Work 0.1375
    R-Free 0.1528
    R-Free Selection Details Random,10%
     
    Temperature Factor Modeling
    Isotropic Thermal Model isotropic
    Anisotropic B[1][1] 0.1179
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -5.0946
    Anisotropic B[2][2] -0.5328
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.4149
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.1804
    Shell Resolution(Low) 1.1938
    Number of Reflections(R-Free) 376
    Number of Reflections(R-Work) 3062
    R-Factor(R-Work) 0.1686
    R-Factor(R-Free) 0.2015
    Percent Reflections(Observed) 79.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.1938
    Shell Resolution(Low) 1.2079
    Number of Reflections(R-Free) 393
    Number of Reflections(R-Work) 3309
    R-Factor(R-Work) 0.1565
    R-Factor(R-Free) 0.18
    Percent Reflections(Observed) 84.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2079
    Shell Resolution(Low) 1.2226
    Number of Reflections(R-Free) 378
    Number of Reflections(R-Work) 3329
    R-Factor(R-Work) 0.1525
    R-Factor(R-Free) 0.1612
    Percent Reflections(Observed) 85.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2226
    Shell Resolution(Low) 1.2381
    Number of Reflections(R-Free) 373
    Number of Reflections(R-Work) 3426
    R-Factor(R-Work) 0.1468
    R-Factor(R-Free) 0.162
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2381
    Shell Resolution(Low) 1.2544
    Number of Reflections(R-Free) 354
    Number of Reflections(R-Work) 3440
    R-Factor(R-Work) 0.137
    R-Factor(R-Free) 0.1617
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2544
    Shell Resolution(Low) 1.2716
    Number of Reflections(R-Free) 413
    Number of Reflections(R-Work) 3418
    R-Factor(R-Work) 0.132
    R-Factor(R-Free) 0.1684
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2716
    Shell Resolution(Low) 1.2897
    Number of Reflections(R-Free) 378
    Number of Reflections(R-Work) 3512
    R-Factor(R-Work) 0.1266
    R-Factor(R-Free) 0.1412
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2897
    Shell Resolution(Low) 1.309
    Number of Reflections(R-Free) 407
    Number of Reflections(R-Work) 3519
    R-Factor(R-Work) 0.116
    R-Factor(R-Free) 0.1456
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.309
    Shell Resolution(Low) 1.3294
    Number of Reflections(R-Free) 386
    Number of Reflections(R-Work) 3608
    R-Factor(R-Work) 0.1158
    R-Factor(R-Free) 0.147
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3294
    Shell Resolution(Low) 1.3512
    Number of Reflections(R-Free) 356
    Number of Reflections(R-Work) 3663
    R-Factor(R-Work) 0.1103
    R-Factor(R-Free) 0.1329
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3512
    Shell Resolution(Low) 1.3745
    Number of Reflections(R-Free) 414
    Number of Reflections(R-Work) 3522
    R-Factor(R-Work) 0.1093
    R-Factor(R-Free) 0.1204
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3745
    Shell Resolution(Low) 1.3995
    Number of Reflections(R-Free) 407
    Number of Reflections(R-Work) 3624
    R-Factor(R-Work) 0.1084
    R-Factor(R-Free) 0.1307
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3995
    Shell Resolution(Low) 1.4264
    Number of Reflections(R-Free) 383
    Number of Reflections(R-Work) 3706
    R-Factor(R-Work) 0.1037
    R-Factor(R-Free) 0.1255
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4264
    Shell Resolution(Low) 1.4555
    Number of Reflections(R-Free) 438
    Number of Reflections(R-Work) 3698
    R-Factor(R-Work) 0.1058
    R-Factor(R-Free) 0.1285
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4555
    Shell Resolution(Low) 1.4872
    Number of Reflections(R-Free) 413
    Number of Reflections(R-Work) 3629
    R-Factor(R-Work) 0.0998
    R-Factor(R-Free) 0.1231
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4872
    Shell Resolution(Low) 1.5217
    Number of Reflections(R-Free) 425
    Number of Reflections(R-Work) 3706
    R-Factor(R-Work) 0.0993
    R-Factor(R-Free) 0.1281
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5217
    Shell Resolution(Low) 1.5598
    Number of Reflections(R-Free) 441
    Number of Reflections(R-Work) 3766
    R-Factor(R-Work) 0.1017
    R-Factor(R-Free) 0.1234
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5598
    Shell Resolution(Low) 1.602
    Number of Reflections(R-Free) 401
    Number of Reflections(R-Work) 3806
    R-Factor(R-Work) 0.1004
    R-Factor(R-Free) 0.1269
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.602
    Shell Resolution(Low) 1.6491
    Number of Reflections(R-Free) 420
    Number of Reflections(R-Work) 3802
    R-Factor(R-Work) 0.1036
    R-Factor(R-Free) 0.1199
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6491
    Shell Resolution(Low) 1.7023
    Number of Reflections(R-Free) 427
    Number of Reflections(R-Work) 3812
    R-Factor(R-Work) 0.1081
    R-Factor(R-Free) 0.1384
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7023
    Shell Resolution(Low) 1.7631
    Number of Reflections(R-Free) 413
    Number of Reflections(R-Work) 3835
    R-Factor(R-Work) 0.1155
    R-Factor(R-Free) 0.1364
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7631
    Shell Resolution(Low) 1.8336
    Number of Reflections(R-Free) 397
    Number of Reflections(R-Work) 3881
    R-Factor(R-Work) 0.1204
    R-Factor(R-Free) 0.1368
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8336
    Shell Resolution(Low) 1.917
    Number of Reflections(R-Free) 407
    Number of Reflections(R-Work) 3926
    R-Factor(R-Work) 0.1253
    R-Factor(R-Free) 0.1397
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.917
    Shell Resolution(Low) 2.018
    Number of Reflections(R-Free) 443
    Number of Reflections(R-Work) 3821
    R-Factor(R-Work) 0.1323
    R-Factor(R-Free) 0.1487
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.018
    Shell Resolution(Low) 2.1444
    Number of Reflections(R-Free) 434
    Number of Reflections(R-Work) 3944
    R-Factor(R-Work) 0.1401
    R-Factor(R-Free) 0.1569
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1444
    Shell Resolution(Low) 2.3097
    Number of Reflections(R-Free) 417
    Number of Reflections(R-Work) 3917
    R-Factor(R-Work) 0.1395
    R-Factor(R-Free) 0.1583
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3097
    Shell Resolution(Low) 2.5418
    Number of Reflections(R-Free) 423
    Number of Reflections(R-Work) 3962
    R-Factor(R-Work) 0.1425
    R-Factor(R-Free) 0.1555
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5418
    Shell Resolution(Low) 2.9088
    Number of Reflections(R-Free) 437
    Number of Reflections(R-Work) 3966
    R-Factor(R-Work) 0.1533
    R-Factor(R-Free) 0.1527
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9088
    Shell Resolution(Low) 3.6616
    Number of Reflections(R-Free) 387
    Number of Reflections(R-Work) 3732
    R-Factor(R-Work) 0.1564
    R-Factor(R-Free) 0.1536
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6616
    Shell Resolution(Low) 21.0344
    Number of Reflections(R-Free) 312
    Number of Reflections(R-Work) 2762
    R-Factor(R-Work) 0.2082
    R-Factor(R-Free) 0.2269
    Percent Reflections(Observed) 68.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.076
    f_dihedral_angle_d 12.643
    f_angle_d 1.202
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2810
    Nucleic Acid Atoms 0
    Heterogen Atoms 38
    Solvent Atoms 464
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution Paser
    Structure Refinement PHENIX (phenix.refine: 1.7.2_869)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.2_869)
    model building Paser
    data collection HKL-2000