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X-RAY DIFFRACTION
Materials and Methods page
4E27
  •   Crystallization Hide
    Crystallization Experiments
    pH 7
    Temperature 293.0
    Details 20% PEG 3350, 0.2M K Formate, no buffer, pH 7, VAPOR DIFFUSION, SITTING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 135.71 α = 90
    b = 68.36 β = 93.69
    c = 107.83 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type RIGAKU SATURN 944+
    Collection Date 2011-11-14
     
    Diffraction Radiation
    Monochromator GRAPHITE
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU FR-E+ SUPERBRIGHT
    Wavelength 1.54178
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2.4
    Resolution(Low) 50
    Number Reflections(Observed) 75296
    Percent Possible(Observed) 99.5
    R Merge I(Observed) 0.098
    B(Isotropic) From Wilson Plot 25.25
     
    High Resolution Shell Details
    Resolution(High) 2.4
    Resolution(Low) 2.46
    Percent Possible(All) 99.6
    R Merge I(Observed) 0.371
    Mean I Over Sigma(Observed) 4.88
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 2.4
    Resolution(Low) 43.51
    Cut-off Sigma(F) 2.0
    Number of Reflections(all) 38729
    Number of Reflections(Observed) 38729
    Number of Reflections(R-Free) 1947
    Percent Reflections(Observed) 99.8
    R-Factor(Observed) 0.205
    R-Work 0.202
    R-Free 0.256
     
    Temperature Factor Modeling
    Mean Isotropic B Value 21.96
    Anisotropic B[1][1] -1.6516
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -0.8773
    Anisotropic B[2][2] -2.7902
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 4.4418
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4002
    Shell Resolution(Low) 2.4602
    Number of Reflections(R-Free) 168
    Number of Reflections(R-Work) 2630
    R-Factor(R-Work) 0.2504
    R-Factor(R-Free) 0.3251
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4602
    Shell Resolution(Low) 2.5267
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2601
    R-Factor(R-Work) 0.2102
    R-Factor(R-Free) 0.2643
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5267
    Shell Resolution(Low) 2.6011
    Number of Reflections(R-Free) 122
    Number of Reflections(R-Work) 2623
    R-Factor(R-Work) 0.2243
    R-Factor(R-Free) 0.2968
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6011
    Shell Resolution(Low) 2.685
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2577
    R-Factor(R-Work) 0.2107
    R-Factor(R-Free) 0.2957
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.685
    Shell Resolution(Low) 2.781
    Number of Reflections(R-Free) 124
    Number of Reflections(R-Work) 2656
    R-Factor(R-Work) 0.2124
    R-Factor(R-Free) 0.2825
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.781
    Shell Resolution(Low) 2.8923
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2609
    R-Factor(R-Work) 0.1881
    R-Factor(R-Free) 0.2715
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8923
    Shell Resolution(Low) 3.0239
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2598
    R-Factor(R-Work) 0.2192
    R-Factor(R-Free) 0.29
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0239
    Shell Resolution(Low) 3.1833
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2595
    R-Factor(R-Work) 0.1996
    R-Factor(R-Free) 0.2766
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1833
    Shell Resolution(Low) 3.3826
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2624
    R-Factor(R-Work) 0.1916
    R-Factor(R-Free) 0.2293
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3826
    Shell Resolution(Low) 3.6437
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 2626
    R-Factor(R-Work) 0.19
    R-Factor(R-Free) 0.2165
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6437
    Shell Resolution(Low) 4.0101
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2651
    R-Factor(R-Work) 0.1849
    R-Factor(R-Free) 0.2482
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0101
    Shell Resolution(Low) 4.5899
    Number of Reflections(R-Free) 120
    Number of Reflections(R-Work) 2646
    R-Factor(R-Work) 0.1512
    R-Factor(R-Free) 0.1666
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5899
    Shell Resolution(Low) 5.7806
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 2634
    R-Factor(R-Work) 0.1878
    R-Factor(R-Free) 0.2311
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.7806
    Shell Resolution(Low) 43.5169
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2712
    R-Factor(R-Work) 0.2786
    R-Factor(R-Free) 0.3308
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.071
    f_dihedral_angle_d 12.426
    f_angle_d 1.081
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 5654
    Nucleic Acid Atoms 0
    Heterogen Atoms 29
    Solvent Atoms 488
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution PHENIX
    Structure Refinement PHENIX (PHENIX.REFINE: 1.7.3_928)
     
    Software
    data extraction pdb_extract version: 3.10
    refinement phenix
    phasing mlphare
    data reduction Xscale