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X-RAY DIFFRACTION
Materials and Methods page
4E1U
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION
    pH 7
    Temperature 296.0
    Details 20mM Cacodylate; 6mM Spermine*HCl; 40mM NaCl; 10mM BaCl2 5% 2-M-2,4PD, pH 7.0, VAPOR DIFFUSION, temperature 296K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 24.04 α = 74.67
    b = 24.8 β = 84.42
    c = 37.52 γ = 76.21
     
    Space Group
    Space Group Name:    P 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PIXEL
    Type DECTRIS PILATUS 6M
    Collection Date 2010-12-03
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRL BEAMLINE BL12-2
    Wavelength List .7749
    Site SSRL
    Beamline BL12-2
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) -1.0
    Observed Criterion Sigma(I) -1.0
    Resolution(High) 0.92
    Resolution(Low) 36
    Number Reflections(Observed) 46920
    Percent Possible(Observed) 82.7
    R Merge I(Observed) 0.03
    Redundancy 3.9
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 0.92
    Resolution(Low) 23.33
    Cut-off Sigma(F) 1.98
    Number of Reflections(Observed) 46920
    Number of Reflections(R-Free) 4695
    Percent Reflections(Observed) 81.74
    R-Factor(Observed) 0.1401
    R-Work 0.1397
    R-Free 0.149
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -0.2315
    Anisotropic B[1][2] -1.9032
    Anisotropic B[1][3] 0.7312
    Anisotropic B[2][2] 1.5877
    Anisotropic B[2][3] 0.3666
    Anisotropic B[3][3] -1.3562
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 0.92
    Shell Resolution(Low) 0.9305
    Number of Reflections(R-Free) 88
    Number of Reflections(R-Work) 1572
    R-Factor(R-Work) 0.2866
    R-Factor(R-Free) 0.3264
    Percent Reflections(Observed) 45.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 0.9305
    Shell Resolution(Low) 0.9414
    Number of Reflections(R-Free) 116
    Number of Reflections(R-Work) 2133
    R-Factor(R-Work) 0.2697
    R-Factor(R-Free) 0.291
    Percent Reflections(Observed) 60.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 0.9414
    Shell Resolution(Low) 0.9529
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2743
    R-Factor(R-Work) 0.2642
    R-Factor(R-Free) 0.2969
    Percent Reflections(Observed) 75.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 0.9529
    Shell Resolution(Low) 0.965
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2817
    R-Factor(R-Work) 0.2504
    R-Factor(R-Free) 0.2756
    Percent Reflections(Observed) 80.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 0.965
    Shell Resolution(Low) 0.9777
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2890
    R-Factor(R-Work) 0.2157
    R-Factor(R-Free) 0.2312
    Percent Reflections(Observed) 81.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 0.9777
    Shell Resolution(Low) 0.9911
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 2956
    R-Factor(R-Work) 0.2046
    R-Factor(R-Free) 0.2629
    Percent Reflections(Observed) 82.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 0.9911
    Shell Resolution(Low) 1.0052
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2834
    R-Factor(R-Work) 0.1955
    R-Factor(R-Free) 0.2218
    Percent Reflections(Observed) 80.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.0052
    Shell Resolution(Low) 1.0202
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2788
    R-Factor(R-Work) 0.1824
    R-Factor(R-Free) 0.2175
    Percent Reflections(Observed) 81.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.0202
    Shell Resolution(Low) 1.0362
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2910
    R-Factor(R-Work) 0.1802
    R-Factor(R-Free) 0.1964
    Percent Reflections(Observed) 78.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.0362
    Shell Resolution(Low) 1.0532
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2721
    R-Factor(R-Work) 0.1664
    R-Factor(R-Free) 0.1948
    Percent Reflections(Observed) 79.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.0532
    Shell Resolution(Low) 1.0713
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 3082
    R-Factor(R-Work) 0.153
    R-Factor(R-Free) 0.182
    Percent Reflections(Observed) 85.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.0713
    Shell Resolution(Low) 1.0908
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 3040
    R-Factor(R-Work) 0.147
    R-Factor(R-Free) 0.1612
    Percent Reflections(Observed) 85.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.0908
    Shell Resolution(Low) 1.1118
    Number of Reflections(R-Free) 173
    Number of Reflections(R-Work) 3029
    R-Factor(R-Work) 0.1409
    R-Factor(R-Free) 0.1522
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.1118
    Shell Resolution(Low) 1.1345
    Number of Reflections(R-Free) 165
    Number of Reflections(R-Work) 3079
    R-Factor(R-Work) 0.1354
    R-Factor(R-Free) 0.1746
    Percent Reflections(Observed) 85.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.1345
    Shell Resolution(Low) 1.1592
    Number of Reflections(R-Free) 192
    Number of Reflections(R-Work) 2952
    R-Factor(R-Work) 0.1297
    R-Factor(R-Free) 0.1443
    Percent Reflections(Observed) 84.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.1592
    Shell Resolution(Low) 1.1861
    Number of Reflections(R-Free) 174
    Number of Reflections(R-Work) 2895
    R-Factor(R-Work) 0.1253
    R-Factor(R-Free) 0.1507
    Percent Reflections(Observed) 82.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.1861
    Shell Resolution(Low) 1.2158
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2681
    R-Factor(R-Work) 0.1234
    R-Factor(R-Free) 0.1398
    Percent Reflections(Observed) 76.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2158
    Shell Resolution(Low) 1.2487
    Number of Reflections(R-Free) 170
    Number of Reflections(R-Work) 3184
    R-Factor(R-Work) 0.1196
    R-Factor(R-Free) 0.1276
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2487
    Shell Resolution(Low) 1.2854
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 3076
    R-Factor(R-Work) 0.1141
    R-Factor(R-Free) 0.1467
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2854
    Shell Resolution(Low) 1.3269
    Number of Reflections(R-Free) 204
    Number of Reflections(R-Work) 3108
    R-Factor(R-Work) 0.1062
    R-Factor(R-Free) 0.1195
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3269
    Shell Resolution(Low) 1.3743
    Number of Reflections(R-Free) 167
    Number of Reflections(R-Work) 3142
    R-Factor(R-Work) 0.1073
    R-Factor(R-Free) 0.1321
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3743
    Shell Resolution(Low) 1.4293
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 3130
    R-Factor(R-Work) 0.1073
    R-Factor(R-Free) 0.1351
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4293
    Shell Resolution(Low) 1.4944
    Number of Reflections(R-Free) 190
    Number of Reflections(R-Work) 2856
    R-Factor(R-Work) 0.1042
    R-Factor(R-Free) 0.1324
    Percent Reflections(Observed) 81.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4944
    Shell Resolution(Low) 1.5731
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 3048
    R-Factor(R-Work) 0.115
    R-Factor(R-Free) 0.1286
    Percent Reflections(Observed) 85.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5731
    Shell Resolution(Low) 1.6717
    Number of Reflections(R-Free) 172
    Number of Reflections(R-Work) 3226
    R-Factor(R-Work) 0.1197
    R-Factor(R-Free) 0.1122
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6717
    Shell Resolution(Low) 1.8007
    Number of Reflections(R-Free) 171
    Number of Reflections(R-Work) 3103
    R-Factor(R-Work) 0.1237
    R-Factor(R-Free) 0.1357
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8007
    Shell Resolution(Low) 1.9818
    Number of Reflections(R-Free) 122
    Number of Reflections(R-Work) 3153
    R-Factor(R-Work) 0.1319
    R-Factor(R-Free) 0.1502
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9818
    Shell Resolution(Low) 2.2684
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2904
    R-Factor(R-Work) 0.139
    R-Factor(R-Free) 0.1521
    Percent Reflections(Observed) 81.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2684
    Shell Resolution(Low) 2.8571
    Number of Reflections(R-Free) 197
    Number of Reflections(R-Work) 3157
    R-Factor(R-Work) 0.1604
    R-Factor(R-Free) 0.1553
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8571
    Shell Resolution(Low) 23.3378
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 3110
    R-Factor(R-Work) 0.1524
    R-Factor(R-Free) 0.1494
    Percent Reflections(Observed) 86.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.017
    f_chiral_restr 0.074
    f_dihedral_angle_d 34.206
    f_angle_d 1.62
    f_bond_d 0.011
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 0
    Nucleic Acid Atoms 488
    Heterogen Atoms 237
    Solvent Atoms 197
     
     
  •   Software and Computing Hide
    Computing
    Data Collection BluIce
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) SCALA
    Structure Solution SHELXD
    Structure Refinement PHENIX (phenix.refine: 1.7.3_928)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.3_928)
    model building SHELXD
    data collection BluIce