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X-RAY DIFFRACTION
Materials and Methods page
4E1Q
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 8
    Temperature 291.0
    Details 1.0M ammonium phosphate dibasic, 0.1M imidazole pH8.0, 0.2M NaCl , VAPOR DIFFUSION, SITTING DROP, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 37.13 α = 90
    b = 52.94 β = 90
    c = 77.77 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 197
     
    Diffraction Detector
    Detector AREA DETECTOR
    Type ADSC QUANTUM 315
    Collection Date 2012-02-14
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type PHOTON FACTORY BEAMLINE BL-17A
    Wavelength List 1.00
    Site PHOTON FACTORY
    Beamline BL-17A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.34
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 1.25
    Resolution(Low) 26.85
    Number Reflections(All) 42959
    Number Reflections(Observed) 42895
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.251
    Resolution(Low) 26.855
    Cut-off Sigma(F) 1.34
    Number of Reflections(all) 42895
    Number of Reflections(Observed) 42895
    Number of Reflections(R-Free) 2166
    Percent Reflections(Observed) 99.46
    R-Factor(All) 0.1778
    R-Factor(Observed) 0.1778
    R-Work 0.1775
    R-Free 0.185
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -0.1542
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 2.0553
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -1.9011
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2508
    Shell Resolution(Low) 1.2799
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2682
    R-Factor(R-Work) 0.1889
    R-Factor(R-Free) 0.2052
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2799
    Shell Resolution(Low) 1.3119
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2661
    R-Factor(R-Work) 0.1809
    R-Factor(R-Free) 0.1938
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3119
    Shell Resolution(Low) 1.3474
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2711
    R-Factor(R-Work) 0.1733
    R-Factor(R-Free) 0.1617
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3474
    Shell Resolution(Low) 1.387
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 2657
    R-Factor(R-Work) 0.1794
    R-Factor(R-Free) 0.2323
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.387
    Shell Resolution(Low) 1.4318
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2713
    R-Factor(R-Work) 0.1769
    R-Factor(R-Free) 0.2057
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4318
    Shell Resolution(Low) 1.483
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2682
    R-Factor(R-Work) 0.1662
    R-Factor(R-Free) 0.1733
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.483
    Shell Resolution(Low) 1.5423
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 2692
    R-Factor(R-Work) 0.1717
    R-Factor(R-Free) 0.1968
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5423
    Shell Resolution(Low) 1.6125
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2703
    R-Factor(R-Work) 0.1651
    R-Factor(R-Free) 0.1867
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6125
    Shell Resolution(Low) 1.6975
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2714
    R-Factor(R-Work) 0.1659
    R-Factor(R-Free) 0.1741
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6975
    Shell Resolution(Low) 1.8039
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2704
    R-Factor(R-Work) 0.1672
    R-Factor(R-Free) 0.1666
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8039
    Shell Resolution(Low) 1.9431
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2731
    R-Factor(R-Work) 0.167
    R-Factor(R-Free) 0.1924
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9431
    Shell Resolution(Low) 2.1386
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2735
    R-Factor(R-Work) 0.1682
    R-Factor(R-Free) 0.1713
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1386
    Shell Resolution(Low) 2.4479
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2776
    R-Factor(R-Work) 0.1744
    R-Factor(R-Free) 0.2054
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4479
    Shell Resolution(Low) 3.0833
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2814
    R-Factor(R-Work) 0.1913
    R-Factor(R-Free) 0.1735
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0833
    Shell Resolution(Low) 26.8615
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 2754
    R-Factor(R-Work) 0.1857
    R-Factor(R-Free) 0.1833
    Percent Reflections(Observed) 95.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.075
    f_dihedral_angle_d 11.651
    f_angle_d 1.105
    f_bond_d 0.005
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1280
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 170
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC Quantum
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX
    Structure Refinement PHENIX (phenix.refine: 1.7.3_928)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.3_928)
    model building PHENIX
    data collection ADSC version: Quantum