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X-RAY DIFFRACTION
Materials and Methods page
4E13
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 5.6
    Temperature 293.0
    Details 2%(V/V) POLYETHYLENE GLYCOL 400, 0.2M LITHIUM SULFATE, 1.6M AMMONIUM SULFATE, 0.1M SODIUM CITRATE, pH 5.6, VAPOR DIFFUSION, SITTING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 100.75 α = 90
    b = 100.75 β = 90
    c = 132.09 γ = 120
     
    Space Group
    Space Group Name:    P 62 2 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 85
     
    Diffraction Detector
    Detector IMAGE PLATE
    Type RIGAKU RAXIS IV++
    Details CONFOCAL
    Collection Date 2011-09-15
     
    Diffraction Radiation
    Monochromator MULTILAYER
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU FR-E+ DW
    Wavelength 1.5418
    Wavelength List 1.5418
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2.08
    Resolution(Low) 47.07
    Number Reflections(Observed) 24271
    Percent Possible(Observed) 99.0
    R Merge I(Observed) 0.078
    B(Isotropic) From Wilson Plot 30.1
    Redundancy 11.3
     
    High Resolution Shell Details
    Resolution(High) 2.08
    Resolution(Low) 2.12
    Percent Possible(All) 89.2
    R Merge I(Observed) 0.61
    Mean I Over Sigma(Observed) 2.1
    R-Sym I(Observed) 0.61
    Redundancy 3.8
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.08
    Resolution(Low) 47.07
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 23105
    Number of Reflections(Observed) 23089
    Number of Reflections(R-Free) 1133
    Percent Reflections(Observed) 99.1
    R-Factor(All) 0.232
    R-Factor(Observed) 0.227
    R-Work 0.227
    R-Free 0.25
    R-Free Selection Details THICK SHELLS
     
    Temperature Factor Modeling
    Isotropic Thermal Model variable
    Mean Isotropic B Value 47.6
    Anisotropic B[1][1] 0.11
    Anisotropic B[1][2] 2.36
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 0.11
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.23
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.08
    Shell Resolution(Low) 2.12
    Number of Reflections(Observed) 1078
    Number of Reflections(R-Free) 54
    Number of Reflections(R-Work) 1024
    R-Factor(R-Work) 0.335
    R-Factor(R-Free) 0.368
    R-Free Error 0.05
    Percent Reflections(Observed) 91.9
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    c_improper_angle_d 1.18
    c_bond_d 0.006
    c_angle_deg 1.0
    c_dihedral_angle_d 18.9
     
    Coordinate Error
    Luzzati ESD(Observed) 0.3
    Luzzati Sigma A(Observed) 0.29
    Luzzati Resolution Cutoff(Low) 5.0
    Luzzati ESD(R-Free Set) 0.33
    Luzzati Sigma A(R-Free Set) 0.33
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2135
    Nucleic Acid Atoms 0
    Heterogen Atoms 89
    Solvent Atoms 35
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-3000
    Data Reduction (intensity integration) HKL-3000
    Data Reduction (data scaling) HKL-3000
    Structure Solution CNS
    Structure Refinement CNS 1.1
     
    Software
    refinement CNS version: 1.1
    model building CNS
    data collection HKL-3000