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X-RAY DIFFRACTION
Materials and Methods page
4E0Z
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.4
    Temperature 293.0
    Details 5% (w/v) PEG 4000, 10mM Tris-HCl, 300mM NaCl , pH 7.4, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 117.27 α = 90
    b = 120.39 β = 112.46
    c = 58.72 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 96
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Collection Date 2010-02-10
     
    Diffraction Radiation
    Monochromator Si 111 CHANNEL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 24-ID-C
    Wavelength List 0.979
    Site APS
    Beamline 24-ID-C
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.28
    Resolution(Low) 50
    Number Reflections(All) 25104
    Number Reflections(Observed) 25104
    Percent Possible(Observed) 73.2
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.42
    Resolution(Low) 35.689
    Cut-off Sigma(F) 1.35
    Number of Reflections(all) 23792
    Number of Reflections(Observed) 23775
    Number of Reflections(R-Free) 1186
    Percent Reflections(Observed) 82.64
    R-Factor(Observed) 0.1941
    R-Work 0.1909
    R-Free 0.2534
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -0.8829
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -0.6509
    Anisotropic B[2][2] -3.5115
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 4.3945
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4201
    Shell Resolution(Low) 2.5302
    Number of Reflections(R-Free) 82
    Number of Reflections(R-Work) 1588
    R-Factor(R-Work) 0.179
    R-Factor(R-Free) 0.2442
    Percent Reflections(Observed) 46.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5302
    Shell Resolution(Low) 2.6635
    Number of Reflections(R-Free) 93
    Number of Reflections(R-Work) 2025
    R-Factor(R-Work) 0.2248
    R-Factor(R-Free) 0.2883
    Percent Reflections(Observed) 59.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6635
    Shell Resolution(Low) 2.8303
    Number of Reflections(R-Free) 110
    Number of Reflections(R-Work) 2471
    R-Factor(R-Work) 0.2526
    R-Factor(R-Free) 0.296
    Percent Reflections(Observed) 73.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8303
    Shell Resolution(Low) 3.0488
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 3048
    R-Factor(R-Work) 0.2624
    R-Factor(R-Free) 0.3828
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0488
    Shell Resolution(Low) 3.3554
    Number of Reflections(R-Free) 187
    Number of Reflections(R-Work) 3337
    R-Factor(R-Work) 0.2184
    R-Factor(R-Free) 0.3125
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3554
    Shell Resolution(Low) 3.8404
    Number of Reflections(R-Free) 179
    Number of Reflections(R-Work) 3383
    R-Factor(R-Work) 0.1776
    R-Factor(R-Free) 0.242
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8404
    Shell Resolution(Low) 4.8366
    Number of Reflections(R-Free) 176
    Number of Reflections(R-Work) 3359
    R-Factor(R-Work) 0.1461
    R-Factor(R-Free) 0.2106
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.8366
    Shell Resolution(Low) 35.6933
    Number of Reflections(R-Free) 205
    Number of Reflections(R-Work) 3378
    R-Factor(R-Work) 0.1724
    R-Factor(R-Free) 0.2034
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.086
    f_dihedral_angle_d 21.974
    f_angle_d 1.578
    f_bond_d 0.011
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2530
    Nucleic Acid Atoms 590
    Heterogen Atoms 41
    Solvent Atoms 256
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC Quantum
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: dev_1145)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.3_928)
    model building PHASER
    data collection ADSC version: Quantum