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X-RAY DIFFRACTION
Materials and Methods page
4E0Y
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.4
    Temperature 293.0
    Details 5% (w/v) PEG 4000, 10mM Tris-HCl, 300mM NaCl , pH 7.4, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 116.98 α = 90
    b = 119.44 β = 112.42
    c = 56.92 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 96
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Collection Date 2010-02-10
     
    Diffraction Radiation
    Monochromator Si 111 CHANNEL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 24-ID-C
    Wavelength List 0.979
    Site APS
    Beamline 24-ID-C
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.4
    Resolution(Low) 50
    Number Reflections(All) 21996
    Number Reflections(Observed) 21996
    Percent Possible(Observed) 77.7
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.4
    Resolution(Low) 40.082
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 21975
    Number of Reflections(Observed) 21975
    Number of Reflections(R-Free) 1120
    Percent Reflections(Observed) 77.69
    R-Factor(Observed) 0.2187
    R-Work 0.2159
    R-Free 0.2698
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 3.3904
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 2.9442
    Anisotropic B[2][2] 3.9598
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -7.3502
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4
    Shell Resolution(Low) 2.5092
    Number of Reflections(R-Free) 73
    Number of Reflections(R-Work) 1301
    R-Factor(R-Work) 0.2742
    R-Factor(R-Free) 0.3671
    Percent Reflections(Observed) 39.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5092
    Shell Resolution(Low) 2.6415
    Number of Reflections(R-Free) 76
    Number of Reflections(R-Work) 1730
    R-Factor(R-Work) 0.2726
    R-Factor(R-Free) 0.3303
    Percent Reflections(Observed) 51.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6415
    Shell Resolution(Low) 2.807
    Number of Reflections(R-Free) 103
    Number of Reflections(R-Work) 2160
    R-Factor(R-Work) 0.2939
    R-Factor(R-Free) 0.3455
    Percent Reflections(Observed) 64.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.807
    Shell Resolution(Low) 3.0236
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 2627
    R-Factor(R-Work) 0.3018
    R-Factor(R-Free) 0.3225
    Percent Reflections(Observed) 79.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0236
    Shell Resolution(Low) 3.3278
    Number of Reflections(R-Free) 174
    Number of Reflections(R-Work) 3123
    R-Factor(R-Work) 0.2568
    R-Factor(R-Free) 0.3212
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3278
    Shell Resolution(Low) 3.809
    Number of Reflections(R-Free) 195
    Number of Reflections(R-Work) 3308
    R-Factor(R-Work) 0.2085
    R-Factor(R-Free) 0.2964
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.809
    Shell Resolution(Low) 4.7977
    Number of Reflections(R-Free) 169
    Number of Reflections(R-Work) 3278
    R-Factor(R-Work) 0.1677
    R-Factor(R-Free) 0.2165
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7977
    Shell Resolution(Low) 40.088
    Number of Reflections(R-Free) 168
    Number of Reflections(R-Work) 3328
    R-Factor(R-Work) 0.1918
    R-Factor(R-Free) 0.219
    Percent Reflections(Observed) 97.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.05
    f_dihedral_angle_d 19.632
    f_angle_d 0.857
    f_bond_d 0.003
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2528
    Nucleic Acid Atoms 593
    Heterogen Atoms 23
    Solvent Atoms 136
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC Quantum
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: dev_1005)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.3_928)
    model building PHASER
    data collection ADSC version: Quantum