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X-RAY DIFFRACTION
Materials and Methods page
4E0P
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.4
    Temperature 293.0
    Details 5% (w/v) PEG 4000, 10mM Tris-HCl, 300mM NaCl , pH 7.4, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 117.58 α = 90
    b = 119.69 β = 113.94
    c = 62.94 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 96
     
    Diffraction Detector
    Detector AREA DETECTOR
    Type ADSC QUANTUM 315
    Collection Date 2009-06-08
     
    Diffraction Radiation
    Monochromator Si 111
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 14-BM-C
    Wavelength List 0.900
    Site APS
    Beamline 14-BM-C
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.94
    Resolution(Low) 50
    Number Reflections(All) 3
    Number Reflections(Observed) 58879
    Percent Possible(Observed) 83.2
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.2
    Resolution(Low) 39.983
    Cut-off Sigma(F) 1.33
    Number of Reflections(all) 32047
    Number of Reflections(Observed) 32038
    Number of Reflections(R-Free) 1619
    Percent Reflections(Observed) 79.37
    R-Factor(Observed) 0.2037
    R-Work 0.2012
    R-Free 0.2492
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 2.6852
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -1.0303
    Anisotropic B[2][2] 2.4322
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -12.312
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2002
    Shell Resolution(Low) 2.2649
    Number of Reflections(R-Free) 70
    Number of Reflections(R-Work) 1500
    R-Factor(R-Work) 0.2214
    R-Factor(R-Free) 0.3792
    Percent Reflections(Observed) 47.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2649
    Shell Resolution(Low) 2.338
    Number of Reflections(R-Free) 80
    Number of Reflections(R-Work) 1642
    R-Factor(R-Work) 0.2261
    R-Factor(R-Free) 0.3084
    Percent Reflections(Observed) 51.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.338
    Shell Resolution(Low) 2.4216
    Number of Reflections(R-Free) 100
    Number of Reflections(R-Work) 1823
    R-Factor(R-Work) 0.243
    R-Factor(R-Free) 0.2563
    Percent Reflections(Observed) 57.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4216
    Shell Resolution(Low) 2.5185
    Number of Reflections(R-Free) 104
    Number of Reflections(R-Work) 2044
    R-Factor(R-Work) 0.2538
    R-Factor(R-Free) 0.299
    Percent Reflections(Observed) 64.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5185
    Shell Resolution(Low) 2.6331
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2254
    R-Factor(R-Work) 0.2702
    R-Factor(R-Free) 0.3083
    Percent Reflections(Observed) 71.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6331
    Shell Resolution(Low) 2.7719
    Number of Reflections(R-Free) 117
    Number of Reflections(R-Work) 2495
    R-Factor(R-Work) 0.2638
    R-Factor(R-Free) 0.3347
    Percent Reflections(Observed) 79.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7719
    Shell Resolution(Low) 2.9455
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2812
    R-Factor(R-Work) 0.2669
    R-Factor(R-Free) 0.3211
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9455
    Shell Resolution(Low) 3.1729
    Number of Reflections(R-Free) 165
    Number of Reflections(R-Work) 3107
    R-Factor(R-Work) 0.256
    R-Factor(R-Free) 0.3075
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1729
    Shell Resolution(Low) 3.492
    Number of Reflections(R-Free) 185
    Number of Reflections(R-Work) 3150
    R-Factor(R-Work) 0.1938
    R-Factor(R-Free) 0.2393
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.492
    Shell Resolution(Low) 3.9969
    Number of Reflections(R-Free) 163
    Number of Reflections(R-Work) 3182
    R-Factor(R-Work) 0.1681
    R-Factor(R-Free) 0.2414
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9969
    Shell Resolution(Low) 5.0341
    Number of Reflections(R-Free) 178
    Number of Reflections(R-Work) 3168
    R-Factor(R-Work) 0.1517
    R-Factor(R-Free) 0.1837
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.0341
    Shell Resolution(Low) 39.9894
    Number of Reflections(R-Free) 173
    Number of Reflections(R-Work) 3242
    R-Factor(R-Work) 0.1647
    R-Factor(R-Free) 0.1989
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.088
    f_dihedral_angle_d 20.969
    f_angle_d 1.467
    f_bond_d 0.011
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2528
    Nucleic Acid Atoms 593
    Heterogen Atoms 29
    Solvent Atoms 436
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC Quantum
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: dev_1145)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.3_928)
    model building PHASER
    data collection ADSC version: Quantum