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X-RAY DIFFRACTION
Materials and Methods page
4E0K
  •   Crystallization Hide
    Crystallization Experiments
    Method vapor diffusion, hanging drop
    pH 6.5
    Temperature 290.0
    Details 0.1M BIS-TRIS PROPANE pH 6.5, 0.2 M SODIUM FLUORIDE, 20% (w/v) PEG 3350, vapor diffusion, hanging drop, temperature 290K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 62.37 α = 90
    b = 62.37 β = 90
    c = 11.73 γ = 120
     
    Space Group
    Space Group Name:    P 61
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Collection Date 2010-12-11
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 24-ID-C
    Wavelength List 0.97911
    Site APS
    Beamline 24-ID-C
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 0.97
    Resolution(Low) 14.98
    Percent Possible(Observed) 99.3
    R Merge I(Observed) 0.069
    B(Isotropic) From Wilson Plot 9.162
     
    High Resolution Shell Details
    Resolution(High) 0.97
    Resolution(Low) 1.0
    Percent Possible(All) 97.4
    R Merge I(Observed) 0.448
    Mean I Over Sigma(Observed) 2.42
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SIRAS
    reflnsShellList 0.97
    Resolution(Low) 14.981
    Cut-off Sigma(F) 2.01
    Number of Reflections(Observed) 15997
    Number of Reflections(R-Free) 1601
    Percent Reflections(Observed) 99.84
    R-Factor(Observed) 0.1138
    R-Work 0.1119
    R-Free 0.1311
     
    Temperature Factor Modeling
    Mean Isotropic B Value 10.9748
    Anisotropic B[1][1] 0.2207
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 0.2207
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.4415
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 0.9703
    Shell Resolution(Low) 1.0016
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 1251
    R-Factor(R-Work) 0.1495
    R-Factor(R-Free) 0.1713
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.0016
    Shell Resolution(Low) 1.0374
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 1303
    R-Factor(R-Work) 0.1342
    R-Factor(R-Free) 0.1571
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.0374
    Shell Resolution(Low) 1.0789
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 1301
    R-Factor(R-Work) 0.1072
    R-Factor(R-Free) 0.1138
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.0789
    Shell Resolution(Low) 1.128
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 1278
    R-Factor(R-Work) 0.0908
    R-Factor(R-Free) 0.1088
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.128
    Shell Resolution(Low) 1.1874
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 1299
    R-Factor(R-Work) 0.0891
    R-Factor(R-Free) 0.1048
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.1874
    Shell Resolution(Low) 1.2618
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 1291
    R-Factor(R-Work) 0.0941
    R-Factor(R-Free) 0.1198
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2618
    Shell Resolution(Low) 1.3592
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 1316
    R-Factor(R-Work) 0.0961
    R-Factor(R-Free) 0.1238
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3592
    Shell Resolution(Low) 1.4958
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 1314
    R-Factor(R-Work) 0.0982
    R-Factor(R-Free) 0.1029
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4958
    Shell Resolution(Low) 1.712
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 1320
    R-Factor(R-Work) 0.1003
    R-Factor(R-Free) 0.1325
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.712
    Shell Resolution(Low) 2.1559
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 1330
    R-Factor(R-Work) 0.1075
    R-Factor(R-Free) 0.1349
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1559
    Shell Resolution(Low) 14.9826
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 1393
    R-Factor(R-Work) 0.1304
    R-Factor(R-Free) 0.1445
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 19.613
    f_plane_restr 0.009
    f_chiral_restr 0.095
    f_angle_d 1.417
    f_bond_d 0.01
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 244
    Nucleic Acid Atoms 0
    Heterogen Atoms 31
    Solvent Atoms 49
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XSCALE
    Data Reduction (data scaling) XSCALE
    Structure Refinement PHENIX (phenix.refine: 1.7_650)
     
    Software
    data extraction pdb_extract version: 3.10
    refinement phenix
    data reduction Xscale