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X-RAY DIFFRACTION
Materials and Methods page
4E0J
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.4
    Temperature 293.0
    Details 5% (w/v) PEG 4000, 10mM Tris-HCl, 300mM NaCl , pH 7.4, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 117.56 α = 90
    b = 120.08 β = 111.68
    c = 56.76 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 96
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Collection Date 2010-02-10
     
    Diffraction Radiation
    Monochromator Si 111 CHANNEL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 24-ID-C
    Wavelength List 0.979
    Site APS
    Beamline 24-ID-C
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.07
    Resolution(Low) 50
    Number Reflections(All) 36750
    Number Reflections(Observed) 36750
    Percent Possible(Observed) 81.5
     
    High Resolution Shell Details
    Resolution(High) 2.07
    Resolution(Low) 2.12
    Percent Possible(All) 71.5
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.3
    Resolution(Low) 39.503
    Cut-off Sigma(F) 1.35
    Number of Reflections(all) 27711
    Number of Reflections(Observed) 27710
    Number of Reflections(R-Free) 1409
    Percent Reflections(Observed) 85.21
    R-Factor(Observed) 0.2079
    R-Work 0.2055
    R-Free 0.2521
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -3.0212
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.1008
    Anisotropic B[2][2] -6.2184
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -4.3667
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3
    Shell Resolution(Low) 2.3822
    Number of Reflections(R-Free) 58
    Number of Reflections(R-Work) 1046
    R-Factor(R-Work) 0.3515
    R-Factor(R-Free) 0.448
    Percent Reflections(Observed) 34.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3822
    Shell Resolution(Low) 2.4776
    Number of Reflections(R-Free) 98
    Number of Reflections(R-Work) 1966
    R-Factor(R-Work) 0.3078
    R-Factor(R-Free) 0.3662
    Percent Reflections(Observed) 64.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4776
    Shell Resolution(Low) 2.5903
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2449
    R-Factor(R-Work) 0.3019
    R-Factor(R-Free) 0.3179
    Percent Reflections(Observed) 79.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5903
    Shell Resolution(Low) 2.7269
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2931
    R-Factor(R-Work) 0.2931
    R-Factor(R-Free) 0.3257
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7269
    Shell Resolution(Low) 2.8977
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 2973
    R-Factor(R-Work) 0.27
    R-Factor(R-Free) 0.3396
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8977
    Shell Resolution(Low) 3.1213
    Number of Reflections(R-Free) 165
    Number of Reflections(R-Work) 2986
    R-Factor(R-Work) 0.2386
    R-Factor(R-Free) 0.3086
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1213
    Shell Resolution(Low) 3.4353
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2968
    R-Factor(R-Work) 0.2
    R-Factor(R-Free) 0.2434
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4353
    Shell Resolution(Low) 3.932
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 3001
    R-Factor(R-Work) 0.169
    R-Factor(R-Free) 0.2183
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.932
    Shell Resolution(Low) 4.9523
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 3013
    R-Factor(R-Work) 0.1408
    R-Factor(R-Free) 0.1941
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.9523
    Shell Resolution(Low) 39.509
    Number of Reflections(R-Free) 197
    Number of Reflections(R-Work) 2968
    R-Factor(R-Work) 0.1715
    R-Factor(R-Free) 0.2018
    Percent Reflections(Observed) 96.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.048
    f_dihedral_angle_d 20.272
    f_angle_d 0.77
    f_bond_d 0.003
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2527
    Nucleic Acid Atoms 650
    Heterogen Atoms 2
    Solvent Atoms 363
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC Quantum
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: dev_1005)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.3_928)
    model building PHASER
    data collection ADSC version: Quantum