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X-RAY DIFFRACTION
Materials and Methods page
4E0G
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.4
    Temperature 293.0
    Details 5% (w/v) PEG 4000, 10mM Tris-HCl, 300mM NaCl, pH 7.4, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 117.88 α = 90
    b = 120.2 β = 111.85
    c = 58.04 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 96
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Collection Date 2010-02-10
     
    Diffraction Radiation
    Monochromator Si 111 CHANNEL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 24-ID-C
    Wavelength List 0.979
    Site APS
    Beamline 24-ID-C
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.99
    Resolution(Low) 50
    Number Reflections(All) 51367
    Number Reflections(Observed) 51367
    Percent Possible(Observed) 82.0
     
    High Resolution Shell Details
    Resolution(High) 1.99
    Resolution(Low) 2.03
    Percent Possible(All) 69.2
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.2
    Resolution(Low) 40.115
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 30329
    Number of Reflections(Observed) 30327
    Number of Reflections(R-Free) 1567
    Percent Reflections(Observed) 79.65
    R-Factor(Observed) 0.1962
    R-Work 0.1939
    R-Free 0.238
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 2.56
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 1.7236
    Anisotropic B[2][2] 3.5032
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -11.6775
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2
    Shell Resolution(Low) 2.271
    Number of Reflections(R-Free) 85
    Number of Reflections(R-Work) 1506
    R-Factor(R-Work) 0.201
    R-Factor(R-Free) 0.2506
    Percent Reflections(Observed) 46.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.271
    Shell Resolution(Low) 2.3522
    Number of Reflections(R-Free) 112
    Number of Reflections(R-Work) 1708
    R-Factor(R-Work) 0.2129
    R-Factor(R-Free) 0.2515
    Percent Reflections(Observed) 53.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3522
    Shell Resolution(Low) 2.4463
    Number of Reflections(R-Free) 105
    Number of Reflections(R-Work) 1957
    R-Factor(R-Work) 0.2267
    R-Factor(R-Free) 0.2935
    Percent Reflections(Observed) 60.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4463
    Shell Resolution(Low) 2.5577
    Number of Reflections(R-Free) 118
    Number of Reflections(R-Work) 2274
    R-Factor(R-Work) 0.2378
    R-Factor(R-Free) 0.287
    Percent Reflections(Observed) 69.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5577
    Shell Resolution(Low) 2.6925
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2499
    R-Factor(R-Work) 0.246
    R-Factor(R-Free) 0.297
    Percent Reflections(Observed) 77.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6925
    Shell Resolution(Low) 2.8611
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 2847
    R-Factor(R-Work) 0.2478
    R-Factor(R-Free) 0.3402
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8611
    Shell Resolution(Low) 3.082
    Number of Reflections(R-Free) 163
    Number of Reflections(R-Work) 3207
    R-Factor(R-Work) 0.2434
    R-Factor(R-Free) 0.2947
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.082
    Shell Resolution(Low) 3.392
    Number of Reflections(R-Free) 177
    Number of Reflections(R-Work) 3220
    R-Factor(R-Work) 0.2097
    R-Factor(R-Free) 0.2665
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.392
    Shell Resolution(Low) 3.8824
    Number of Reflections(R-Free) 184
    Number of Reflections(R-Work) 3220
    R-Factor(R-Work) 0.1726
    R-Factor(R-Free) 0.2291
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8824
    Shell Resolution(Low) 4.8901
    Number of Reflections(R-Free) 168
    Number of Reflections(R-Work) 3170
    R-Factor(R-Work) 0.1334
    R-Factor(R-Free) 0.1679
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.8901
    Shell Resolution(Low) 40.1212
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 3152
    R-Factor(R-Work) 0.1688
    R-Factor(R-Free) 0.161
    Percent Reflections(Observed) 94.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.072
    f_dihedral_angle_d 20.453
    f_angle_d 1.084
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2533
    Nucleic Acid Atoms 650
    Heterogen Atoms 3
    Solvent Atoms 405
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC Quantum
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.7.3_928)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.3_928)
    model building PHASER
    data collection ADSC version: Quantum