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X-RAY DIFFRACTION
Materials and Methods page
4E01
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.5
    Temperature 289.0
    Details 14% peg8000, 0.1 M Tris, pH8.5, 1.2 M NaCl, 125mM KCl, 150mM Arg-HCl, 20mM MgCl2, 5% glycerol, pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 289K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 127.28 α = 90
    b = 127.28 β = 90
    c = 73.99 γ = 90
     
    Space Group
    Space Group Name:    P 42 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Details mirrors
    Collection Date 2011-10-20
     
    Diffraction Radiation
    Monochromator double-crystal
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 19-ID
    Wavelength List 0.97915
    Site APS
    Beamline 19-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 1.97
    Resolution(Low) 50
    Number Reflections(All) 43957
    Number Reflections(Observed) 43789
    Percent Possible(Observed) 99.6
    R Merge I(Observed) 0.077
    B(Isotropic) From Wilson Plot 40.5
    Redundancy 9.8
     
    High Resolution Shell Details
    Resolution(High) 1.97
    Resolution(Low) 2.0
    Percent Possible(All) 97.7
    R Merge I(Observed) 0.937
    Mean I Over Sigma(Observed) 2.08
    R-Sym I(Observed) 0.854
    Redundancy 8.0
    Number Unique Reflections(All) 2098
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.97
    Resolution(Low) 40.249
    Cut-off Sigma(F) 1.35
    Number of Reflections(all) 43743
    Number of Reflections(Observed) 41745
    Number of Reflections(R-Free) 2000
    Percent Reflections(Observed) 99.5
    R-Factor(Observed) 0.1984
    R-Work 0.1974
    R-Free 0.2202
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -3.7609
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -3.7609
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 7.5218
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9626
    Shell Resolution(Low) 2.0116
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2834
    R-Factor(R-Work) 0.2904
    R-Factor(R-Free) 0.3222
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0116
    Shell Resolution(Low) 2.066
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2920
    R-Factor(R-Work) 0.2254
    R-Factor(R-Free) 0.2445
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.066
    Shell Resolution(Low) 2.1268
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2943
    R-Factor(R-Work) 0.2077
    R-Factor(R-Free) 0.2494
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1268
    Shell Resolution(Low) 2.1955
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2962
    R-Factor(R-Work) 0.1889
    R-Factor(R-Free) 0.2127
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1955
    Shell Resolution(Low) 2.2739
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2929
    R-Factor(R-Work) 0.1873
    R-Factor(R-Free) 0.2014
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2739
    Shell Resolution(Low) 2.365
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2956
    R-Factor(R-Work) 0.1889
    R-Factor(R-Free) 0.2588
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.365
    Shell Resolution(Low) 2.4726
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2980
    R-Factor(R-Work) 0.1979
    R-Factor(R-Free) 0.2198
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4726
    Shell Resolution(Low) 2.6029
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2967
    R-Factor(R-Work) 0.1988
    R-Factor(R-Free) 0.197
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6029
    Shell Resolution(Low) 2.766
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2977
    R-Factor(R-Work) 0.1975
    R-Factor(R-Free) 0.2114
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.766
    Shell Resolution(Low) 2.9795
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 3000
    R-Factor(R-Work) 0.2104
    R-Factor(R-Free) 0.2335
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9795
    Shell Resolution(Low) 3.2792
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 3010
    R-Factor(R-Work) 0.2016
    R-Factor(R-Free) 0.2345
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2792
    Shell Resolution(Low) 3.7534
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 3033
    R-Factor(R-Work) 0.1968
    R-Factor(R-Free) 0.2016
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7534
    Shell Resolution(Low) 4.7277
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 3055
    R-Factor(R-Work) 0.1745
    R-Factor(R-Free) 0.1938
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7277
    Shell Resolution(Low) 40.257
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 3177
    R-Factor(R-Work) 0.2062
    R-Factor(R-Free) 0.2422
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.066
    f_dihedral_angle_d 19.489
    f_angle_d 1.111
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2478
    Nucleic Acid Atoms 0
    Heterogen Atoms 47
    Solvent Atoms 118
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-3000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX (phenix.refine: 1.7.1_743)
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.1_743)
    model building PHENIX version: (phenix.refine: 1.7.1_743)
    data collection HKL-3000