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X-RAY DIFFRACTION
Materials and Methods page
4E00
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.5
    Temperature 289.0
    Details 14% peg8000, 0.1 M Tris, pH8.5, 1.2 M NaCl, 125mM KCl, 150mM Arg-HCl,20mM MgCl2, 5% glycerol, pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 289K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 128.06 α = 90
    b = 128.06 β = 90
    c = 73.78 γ = 90
     
    Space Group
    Space Group Name:    P 42 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Details mirrors
    Collection Date 2011-10-21
     
    Diffraction Radiation
    Monochromator double-crystal
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 19-ID
    Wavelength List 0.97915
    Site APS
    Beamline 19-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2.15
    Resolution(Low) 50
    Number Reflections(All) 33951
    Number Reflections(Observed) 33844
    Percent Possible(Observed) 99.7
    R Merge I(Observed) 0.064
    B(Isotropic) From Wilson Plot 47.5
    Redundancy 9.6
     
    High Resolution Shell Details
    Resolution(High) 2.15
    Resolution(Low) 2.19
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.819
    Mean I Over Sigma(Observed) 3.2
    R-Sym I(Observed) 0.743
    Redundancy 9.4
    Number Unique Reflections(All) 1664
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.15
    Resolution(Low) 36.947
    Cut-off Sigma(F) 1.34
    Number of Reflections(all) 34021
    Number of Reflections(Observed) 33793
    Number of Reflections(R-Free) 1998
    Percent Reflections(Observed) 99.33
    R-Factor(Observed) 0.2087
    R-Work 0.207
    R-Free 0.2338
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -2.499
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -2.499
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 4.998
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1478
    Shell Resolution(Low) 2.2015
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2119
    R-Factor(R-Work) 0.2478
    R-Factor(R-Free) 0.2806
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2015
    Shell Resolution(Low) 2.261
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2239
    R-Factor(R-Work) 0.2218
    R-Factor(R-Free) 0.2138
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.261
    Shell Resolution(Low) 2.3275
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2267
    R-Factor(R-Work) 0.2125
    R-Factor(R-Free) 0.2404
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3275
    Shell Resolution(Low) 2.4026
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2228
    R-Factor(R-Work) 0.2028
    R-Factor(R-Free) 0.2367
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4026
    Shell Resolution(Low) 2.4885
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2258
    R-Factor(R-Work) 0.214
    R-Factor(R-Free) 0.264
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4885
    Shell Resolution(Low) 2.5881
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2256
    R-Factor(R-Work) 0.2096
    R-Factor(R-Free) 0.2189
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5881
    Shell Resolution(Low) 2.7058
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2264
    R-Factor(R-Work) 0.2067
    R-Factor(R-Free) 0.2405
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7058
    Shell Resolution(Low) 2.8484
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2278
    R-Factor(R-Work) 0.227
    R-Factor(R-Free) 0.2963
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8484
    Shell Resolution(Low) 3.0268
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2261
    R-Factor(R-Work) 0.2243
    R-Factor(R-Free) 0.3014
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0268
    Shell Resolution(Low) 3.2604
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2285
    R-Factor(R-Work) 0.2171
    R-Factor(R-Free) 0.2375
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2604
    Shell Resolution(Low) 3.5883
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2288
    R-Factor(R-Work) 0.2072
    R-Factor(R-Free) 0.264
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5883
    Shell Resolution(Low) 4.1069
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2329
    R-Factor(R-Work) 0.2003
    R-Factor(R-Free) 0.2294
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1069
    Shell Resolution(Low) 5.172
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2335
    R-Factor(R-Work) 0.1771
    R-Factor(R-Free) 0.1829
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.172
    Shell Resolution(Low) 36.9524
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2388
    R-Factor(R-Work) 0.2215
    R-Factor(R-Free) 0.2293
    Percent Reflections(Observed) 96.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.071
    f_dihedral_angle_d 14.152
    f_angle_d 1.17
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2485
    Nucleic Acid Atoms 0
    Heterogen Atoms 43
    Solvent Atoms 71
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-3000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX (phenix.refine: 1.7.1_743)
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.1_743)
    model building PHENIX version: (phenix.refine: 1.7.1_743)
    data collection HKL-3000