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X-RAY DIFFRACTION
Materials and Methods page
4DZY
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.5
    Temperature 289.0
    Details 14% peg8000, 0.1 M Tris, pH8.5, 1.2 M NaCl, 125mM KCl, 150mM Arg-HCl,20mM MgCl2, 5% glycerol, pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 289K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 127.33 α = 90
    b = 127.33 β = 90
    c = 73.25 γ = 90
     
    Space Group
    Space Group Name:    P 42 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Details mirrors
    Collection Date 2011-11-19
     
    Diffraction Radiation
    Monochromator double-crystal
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 19-ID
    Wavelength List 0.97918
    Site APS
    Beamline 19-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2.1
    Resolution(Low) 50
    Number Reflections(All) 35704
    Number Reflections(Observed) 35683
    Percent Possible(Observed) 99.9
    R Merge I(Observed) 0.055
    B(Isotropic) From Wilson Plot 42.3
    Redundancy 4.2
     
    High Resolution Shell Details
    Resolution(High) 2.1
    Resolution(Low) 2.14
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.733
    Mean I Over Sigma(Observed) 2.67
    R-Sym I(Observed) 0.661
    Redundancy 7.7
    Number Unique Reflections(All) 1753
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.101
    Resolution(Low) 44.956
    Cut-off Sigma(F) 1.34
    Number of Reflections(all) 35669
    Number of Reflections(Observed) 35633
    Number of Reflections(R-Free) 2000
    Percent Reflections(Observed) 99.9
    R-Factor(Observed) 0.2068
    R-Work 0.2054
    R-Free 0.2314
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -2.5713
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -2.5713
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 5.1427
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1006
    Shell Resolution(Low) 2.1531
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2355
    R-Factor(R-Work) 0.2323
    R-Factor(R-Free) 0.2659
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1531
    Shell Resolution(Low) 2.2113
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2356
    R-Factor(R-Work) 0.2243
    R-Factor(R-Free) 0.3075
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2113
    Shell Resolution(Low) 2.2764
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2354
    R-Factor(R-Work) 0.2138
    R-Factor(R-Free) 0.2177
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2764
    Shell Resolution(Low) 2.3499
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2367
    R-Factor(R-Work) 0.2045
    R-Factor(R-Free) 0.2535
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3499
    Shell Resolution(Low) 2.4339
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2385
    R-Factor(R-Work) 0.2076
    R-Factor(R-Free) 0.2414
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4339
    Shell Resolution(Low) 2.5313
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2368
    R-Factor(R-Work) 0.2015
    R-Factor(R-Free) 0.2518
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5313
    Shell Resolution(Low) 2.6465
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2375
    R-Factor(R-Work) 0.2066
    R-Factor(R-Free) 0.2396
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6465
    Shell Resolution(Low) 2.786
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2379
    R-Factor(R-Work) 0.2073
    R-Factor(R-Free) 0.2094
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.786
    Shell Resolution(Low) 2.9605
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2399
    R-Factor(R-Work) 0.2209
    R-Factor(R-Free) 0.2964
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9605
    Shell Resolution(Low) 3.1891
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2410
    R-Factor(R-Work) 0.2099
    R-Factor(R-Free) 0.23
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1891
    Shell Resolution(Low) 3.5099
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2408
    R-Factor(R-Work) 0.2091
    R-Factor(R-Free) 0.2478
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5099
    Shell Resolution(Low) 4.0175
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2418
    R-Factor(R-Work) 0.2064
    R-Factor(R-Free) 0.2155
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0175
    Shell Resolution(Low) 5.0605
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2469
    R-Factor(R-Work) 0.176
    R-Factor(R-Free) 0.1961
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.0605
    Shell Resolution(Low) 44.9663
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2590
    R-Factor(R-Work) 0.2181
    R-Factor(R-Free) 0.2396
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.072
    f_dihedral_angle_d 14.664
    f_angle_d 1.148
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2489
    Nucleic Acid Atoms 0
    Heterogen Atoms 41
    Solvent Atoms 81
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-3000
    Data Reduction (intensity integration) HKL-3000
    Data Reduction (data scaling) HKL-3000
    Structure Solution PHENIX (phenix.refine: 1.7.1_743)
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.1_743)
    model building PHENIX version: (phenix.refine: 1.7.1_743)
    data collection HKL-3000