X-RAY DIFFRACTION Experimental Data & Validation


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Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 7.5
Temperature 289.0
Details 14% peg8000, 0.1 M Tris, pH8.5, 1.2 M NaCl, 125mM KCl, 150mM Arg-HCl,20mM MgCl2, 5% glycerol, pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 289K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 127.33 α = 90
b = 127.33 β = 90
c = 73.25 γ = 90
Symmetry
Space Group P 42 21 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315r mirrors 2011-11-19
Diffraction Radiation
Monochromator Protocol
double-crystal SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.97918 APS 19-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.1 50 99.9 0.055 0.043 -- 4.2 35704 35683 2.0 2.0 42.3
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.1 2.14 100.0 0.733 0.661 2.67 7.7 1753

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.101 44.956 -- 1.34 35669 35633 2000 99.9 -- 0.2068 0.2054 0.2314 random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.1006 2.1531 -- 140 2355 0.2323 0.2659 -- 99.0
X Ray Diffraction 2.1531 2.2113 -- 140 2356 0.2243 0.3075 -- 100.0
X Ray Diffraction 2.2113 2.2764 -- 140 2354 0.2138 0.2177 -- 100.0
X Ray Diffraction 2.2764 2.3499 -- 140 2367 0.2045 0.2535 -- 100.0
X Ray Diffraction 2.3499 2.4339 -- 142 2385 0.2076 0.2414 -- 100.0
X Ray Diffraction 2.4339 2.5313 -- 142 2368 0.2015 0.2518 -- 100.0
X Ray Diffraction 2.5313 2.6465 -- 141 2375 0.2066 0.2396 -- 100.0
X Ray Diffraction 2.6465 2.786 -- 141 2379 0.2073 0.2094 -- 100.0
X Ray Diffraction 2.786 2.9605 -- 143 2399 0.2209 0.2964 -- 100.0
X Ray Diffraction 2.9605 3.1891 -- 143 2410 0.2099 0.23 -- 100.0
X Ray Diffraction 3.1891 3.5099 -- 143 2408 0.2091 0.2478 -- 100.0
X Ray Diffraction 3.5099 4.0175 -- 144 2418 0.2064 0.2155 -- 100.0
X Ray Diffraction 4.0175 5.0605 -- 147 2469 0.176 0.1961 -- 100.0
X Ray Diffraction 5.0605 44.9663 -- 154 2590 0.2181 0.2396 -- 99.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] -2.5713
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -2.5713
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 5.1427
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.004
f_chiral_restr 0.072
f_dihedral_angle_d 14.664
f_angle_d 1.148
f_bond_d 0.008
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2489
Nucleic Acid Atoms 0
Heterogen Atoms 41
Solvent Atoms 81

Software

Computing
Computing Package Purpose
HKL-3000 Data Collection
HKL-3000 Data Reduction (intensity integration)
HKL-3000 Data Reduction (data scaling)
PHENIX (phenix.refine: 1.7.1_743) Structure Solution
PHENIX (phenix.refine: 1.7.1_743) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.7.1_743) refinement
PHENIX version: (phenix.refine: 1.7.1_743) model building
HKL-3000 data collection