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An Information Portal to 105339 Biological Macromolecular Structures

X-RAY DIFFRACTION
Materials and Methods page
4DXX
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 8.5
    Temperature 291.0
    Details TRIS 0.1M, DMSO 10%, PEG8000 12%, pH 8.5, VAPOR DIFFUSION, SITTING DROP, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 91.22 α = 90
    b = 64.86 β = 95.99
    c = 70.08 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 225 mm CCD
    Details MIRROR
    Collection Date 2011-12-09
     
    Diffraction Radiation
    Monochromator DOUBLE CRYSTAL MONOCHROMATOR
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type BESSY BEAMLINE 14.2
    Wavelength List 0.91841
    Site BESSY
    Beamline 14.2
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 1.66
    Resolution(Low) 50
    Number Reflections(All) 47912
    Number Reflections(Observed) 47912
    Percent Possible(Observed) 99.6
    B(Isotropic) From Wilson Plot 11.5
    Redundancy 2.6
     
    High Resolution Shell Details
    Resolution(High) 1.66
    Resolution(Low) 1.69
    Percent Possible(All) 96.6
    Mean I Over Sigma(Observed) 3.8
    R-Sym I(Observed) 0.285
    Redundancy 2.5
    Number Unique Reflections(All) 2330
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.66
    Resolution(Low) 34.85
    Cut-off Sigma(F) 1.35
    Number of Reflections(all) 47886
    Number of Reflections(Observed) 47886
    Number of Reflections(R-Free) 2417
    Percent Reflections(Observed) 99.56
    R-Factor(Observed) 0.1675
    R-Work 0.1658
    R-Free 0.199
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Isotropic Thermal Model isotropic
    Mean Isotropic B Value 13.64
    Anisotropic B[1][1] 0.2368
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -0.6721
    Anisotropic B[2][2] -1.2512
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 1.0144
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.66
    Shell Resolution(Low) 1.6943
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 2643
    R-Factor(R-Work) 0.2249
    R-Factor(R-Free) 0.2521
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6943
    Shell Resolution(Low) 1.7311
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2652
    R-Factor(R-Work) 0.1995
    R-Factor(R-Free) 0.2174
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7311
    Shell Resolution(Low) 1.7714
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2644
    R-Factor(R-Work) 0.1783
    R-Factor(R-Free) 0.1936
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7714
    Shell Resolution(Low) 1.8157
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2661
    R-Factor(R-Work) 0.1633
    R-Factor(R-Free) 0.1889
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8157
    Shell Resolution(Low) 1.8648
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2705
    R-Factor(R-Work) 0.1538
    R-Factor(R-Free) 0.1961
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8648
    Shell Resolution(Low) 1.9197
    Number of Reflections(R-Free) 121
    Number of Reflections(R-Work) 2645
    R-Factor(R-Work) 0.1659
    R-Factor(R-Free) 0.2077
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9197
    Shell Resolution(Low) 1.9816
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2698
    R-Factor(R-Work) 0.1649
    R-Factor(R-Free) 0.1838
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9816
    Shell Resolution(Low) 2.0524
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2659
    R-Factor(R-Work) 0.1598
    R-Factor(R-Free) 0.2036
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0524
    Shell Resolution(Low) 2.1346
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2678
    R-Factor(R-Work) 0.1613
    R-Factor(R-Free) 0.2032
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1346
    Shell Resolution(Low) 2.2317
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2697
    R-Factor(R-Work) 0.1637
    R-Factor(R-Free) 0.2135
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2317
    Shell Resolution(Low) 2.3494
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2674
    R-Factor(R-Work) 0.1657
    R-Factor(R-Free) 0.2111
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3494
    Shell Resolution(Low) 2.4965
    Number of Reflections(R-Free) 165
    Number of Reflections(R-Work) 2668
    R-Factor(R-Work) 0.159
    R-Factor(R-Free) 0.1951
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4965
    Shell Resolution(Low) 2.6892
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2707
    R-Factor(R-Work) 0.163
    R-Factor(R-Free) 0.2017
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6892
    Shell Resolution(Low) 2.9597
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2677
    R-Factor(R-Work) 0.1639
    R-Factor(R-Free) 0.1861
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9597
    Shell Resolution(Low) 3.3877
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2668
    R-Factor(R-Work) 0.1634
    R-Factor(R-Free) 0.1874
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3877
    Shell Resolution(Low) 4.2669
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2712
    R-Factor(R-Work) 0.1519
    R-Factor(R-Free) 0.1849
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2669
    Shell Resolution(Low) 34.8572
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 2681
    R-Factor(R-Work) 0.1782
    R-Factor(R-Free) 0.2144
    Percent Reflections(Observed) 97.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.07
    f_dihedral_angle_d 12.936
    f_angle_d 1.084
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2857
    Nucleic Acid Atoms 0
    Heterogen Atoms 19
    Solvent Atoms 421
     
     
  •   Software and Computing Hide
    Computing
    Data Collection MAR345dtb
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.7.2_869)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.2_869)
    model building PHASER
    data collection MAR345dtb