X-RAY DIFFRACTION Experimental Data & Validation


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Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 7.4
Temperature 293.0
Details 5% (w/v) PEG 4000, 10mM Tris-HCl, 300mM NaCl, pH 7.4, VAPOR DIFFUSION, HANGING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 117.85 α = 90
b = 119.77 β = 108.63
c = 65.98 γ = 90
Symmetry
Space Group C 1 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 96
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MAR CCD 165 mm -- 2009-06-08
Diffraction Radiation
Monochromator Protocol
Si 111 CHANNEL SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 14-ID-B 0.979 APS 14-ID-B

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.3 50 81.6 0.08 -- -- -- 31866 31866 0.0 0.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.3 2.34 45.7 -- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SAD 2.35 40.838 -- 0.0 29358 29358 1450 81.28 -- 0.1908 0.1889 0.2272 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.3502 2.4342 -- 67 1397 0.2106 0.2149 -- 41.0
X Ray Diffraction 2.4342 2.5317 -- 103 1887 0.2103 0.2781 -- 56.0
X Ray Diffraction 2.5317 2.6469 -- 113 2197 0.2328 0.2491 -- 64.0
X Ray Diffraction 2.6469 2.7864 -- 121 2454 0.2258 0.2961 -- 71.0
X Ray Diffraction 2.7864 2.9609 -- 176 2898 0.2382 0.2777 -- 85.0
X Ray Diffraction 2.9609 3.1894 -- 177 3334 0.2295 0.2904 -- 98.0
X Ray Diffraction 3.1894 3.5103 -- 172 3421 0.1834 0.2189 -- 99.0
X Ray Diffraction 3.5103 4.0178 -- 178 3402 0.1718 0.2204 -- 100.0
X Ray Diffraction 4.0178 5.0605 -- 165 3449 0.1454 0.1839 -- 99.0
X Ray Diffraction 5.0605 40.8443 -- 178 3469 0.1868 0.1962 -- 99.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] 0.199
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] -1.2042
Anisotropic B[2][2] 0.3841
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -0.5831
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.005
f_chiral_restr 0.075
f_dihedral_angle_d 22.456
f_angle_d 1.275
f_bond_d 0.009
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2536
Nucleic Acid Atoms 634
Heterogen Atoms 17
Solvent Atoms 347

Software

Computing
Computing Package Purpose
HKL-2000 Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
SOLVE Structure Solution
PHENIX (phenix.refine: dev_1005) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.7.3_928) refinement
SOLVE model building
HKL-2000 data collection