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X-RAY DIFFRACTION
Materials and Methods page
4DWP
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.4
    Temperature 293.0
    Details 5% (w/v) PEG 4000, 10mM Tris-HCl, 300mM NaCl, pH 7.4, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 117.85 α = 90
    b = 119.77 β = 108.63
    c = 65.98 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 96
     
    Diffraction Detector
    Detector CCD
    Type MAR CCD 165 mm
    Collection Date 2009-06-08
     
    Diffraction Radiation
    Monochromator Si 111 CHANNEL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 14-ID-B
    Wavelength List 0.979
    Site APS
    Beamline 14-ID-B
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.3
    Resolution(Low) 50
    Number Reflections(All) 31866
    Number Reflections(Observed) 31866
    Percent Possible(Observed) 81.6
    R Merge I(Observed) 0.08
     
    High Resolution Shell Details
    Resolution(High) 2.3
    Resolution(Low) 2.34
    Percent Possible(All) 45.7
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 2.35
    Resolution(Low) 40.838
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 29358
    Number of Reflections(Observed) 29358
    Number of Reflections(R-Free) 1450
    Percent Reflections(Observed) 81.28
    R-Factor(Observed) 0.1908
    R-Work 0.1889
    R-Free 0.2272
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 0.199
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -1.2042
    Anisotropic B[2][2] 0.3841
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.5831
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3502
    Shell Resolution(Low) 2.4342
    Number of Reflections(R-Free) 67
    Number of Reflections(R-Work) 1397
    R-Factor(R-Work) 0.2106
    R-Factor(R-Free) 0.2149
    Percent Reflections(Observed) 41.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4342
    Shell Resolution(Low) 2.5317
    Number of Reflections(R-Free) 103
    Number of Reflections(R-Work) 1887
    R-Factor(R-Work) 0.2103
    R-Factor(R-Free) 0.2781
    Percent Reflections(Observed) 56.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5317
    Shell Resolution(Low) 2.6469
    Number of Reflections(R-Free) 113
    Number of Reflections(R-Work) 2197
    R-Factor(R-Work) 0.2328
    R-Factor(R-Free) 0.2491
    Percent Reflections(Observed) 64.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6469
    Shell Resolution(Low) 2.7864
    Number of Reflections(R-Free) 121
    Number of Reflections(R-Work) 2454
    R-Factor(R-Work) 0.2258
    R-Factor(R-Free) 0.2961
    Percent Reflections(Observed) 71.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7864
    Shell Resolution(Low) 2.9609
    Number of Reflections(R-Free) 176
    Number of Reflections(R-Work) 2898
    R-Factor(R-Work) 0.2382
    R-Factor(R-Free) 0.2777
    Percent Reflections(Observed) 85.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9609
    Shell Resolution(Low) 3.1894
    Number of Reflections(R-Free) 177
    Number of Reflections(R-Work) 3334
    R-Factor(R-Work) 0.2295
    R-Factor(R-Free) 0.2904
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1894
    Shell Resolution(Low) 3.5103
    Number of Reflections(R-Free) 172
    Number of Reflections(R-Work) 3421
    R-Factor(R-Work) 0.1834
    R-Factor(R-Free) 0.2189
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5103
    Shell Resolution(Low) 4.0178
    Number of Reflections(R-Free) 178
    Number of Reflections(R-Work) 3402
    R-Factor(R-Work) 0.1718
    R-Factor(R-Free) 0.2204
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0178
    Shell Resolution(Low) 5.0605
    Number of Reflections(R-Free) 165
    Number of Reflections(R-Work) 3449
    R-Factor(R-Work) 0.1454
    R-Factor(R-Free) 0.1839
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.0605
    Shell Resolution(Low) 40.8443
    Number of Reflections(R-Free) 178
    Number of Reflections(R-Work) 3469
    R-Factor(R-Work) 0.1868
    R-Factor(R-Free) 0.1962
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.075
    f_dihedral_angle_d 22.456
    f_angle_d 1.275
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2536
    Nucleic Acid Atoms 634
    Heterogen Atoms 17
    Solvent Atoms 347
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution SOLVE
    Structure Refinement PHENIX (phenix.refine: dev_1005)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.3_928)
    model building SOLVE
    data collection HKL-2000