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X-RAY DIFFRACTION
Materials and Methods page
4DWN
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7
    Temperature 298.0
    Details HEPES pH 7.0, ammonium sulfate, DMSO, PEG 8000, L-glutathione reduced/oxidized, VAPOR DIFFUSION, HANGING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 32.09 α = 108.5
    b = 36.51 β = 90.29
    c = 43.75 γ = 111.13
     
    Space Group
    Space Group Name:    P 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 210r
    Collection Date 2009-02-18
     
    Diffraction Radiation
    Monochromator Sagitally focused Si
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type AUSTRALIAN SYNCHROTRON BEAMLINE MX1
    Wavelength List 0.9537
    Site AUSTRALIAN SYNCHROTRON
    Beamline MX1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.58
    Resolution(Low) 41.11
    Number Reflections(All) 23811
    Number Reflections(Observed) 22922
    Percent Possible(Observed) 96.4
    R Merge I(Observed) 0.05
    B(Isotropic) From Wilson Plot 17.7
    Redundancy 3.9
     
    High Resolution Shell Details
    Resolution(High) 1.58
    Resolution(Low) 1.64
    Percent Possible(All) 91.8
    R Merge I(Observed) 0.35
    Mean I Over Sigma(Observed) 3.26
    Redundancy 3.6
    Number Unique Reflections(All) 2182
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.581
    Resolution(Low) 29.657
    Cut-off Sigma(F) 0.15
    Number of Reflections(all) 22923
    Number of Reflections(Observed) 22042
    Number of Reflections(R-Free) 1133
    Percent Reflections(Observed) 92.54
    R-Factor(Observed) 0.1647
    R-Work 0.1629
    R-Free 0.1969
    R-Free Selection Details Random
     
    Temperature Factor Modeling
    Mean Isotropic B Value 24.982
    Anisotropic B[1][1] -4.4699
    Anisotropic B[1][2] 4.1221
    Anisotropic B[1][3] 2.0215
    Anisotropic B[2][2] 6.2901
    Anisotropic B[2][3] 0.6596
    Anisotropic B[3][3] -1.8202
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5807
    Shell Resolution(Low) 1.6527
    Number of Reflections(R-Free) 119
    Number of Reflections(R-Work) 2254
    R-Factor(R-Work) 0.2105
    R-Factor(R-Free) 0.264
    Percent Reflections(Observed) 80.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6527
    Shell Resolution(Low) 1.7398
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 2480
    R-Factor(R-Work) 0.2071
    R-Factor(R-Free) 0.2659
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7398
    Shell Resolution(Low) 1.8488
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2565
    R-Factor(R-Work) 0.1915
    R-Factor(R-Free) 0.2693
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8488
    Shell Resolution(Low) 1.9915
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2629
    R-Factor(R-Work) 0.1723
    R-Factor(R-Free) 0.2101
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9915
    Shell Resolution(Low) 2.1918
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2717
    R-Factor(R-Work) 0.15
    R-Factor(R-Free) 0.1997
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1918
    Shell Resolution(Low) 2.5089
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2730
    R-Factor(R-Work) 0.1489
    R-Factor(R-Free) 0.1947
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5089
    Shell Resolution(Low) 3.1603
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2779
    R-Factor(R-Work) 0.1549
    R-Factor(R-Free) 0.1871
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1603
    Shell Resolution(Low) 29.6618
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 2755
    R-Factor(R-Work) 0.1607
    R-Factor(R-Free) 0.1766
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 19.733
    f_plane_restr 0.009
    f_chiral_restr 0.086
    f_angle_d 1.431
    f_bond_d 0.014
     
    Coordinate Error
    Luzzati ESD(Observed) 0.18
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1624
    Nucleic Acid Atoms 0
    Heterogen Atoms 15
    Solvent Atoms 153
     
     
  •   Software and Computing Hide
    Computing
    Data Collection Blu-Ice GUI
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.7_650)
     
    Software
    data extraction pdb_extract version: 3.10
    refinement phenix
    molecular replacement Phaser version: 2.1.4
    data reduction HKL