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X-RAY DIFFRACTION
Materials and Methods page
4DWL
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6
    Temperature 298.0
    Details 20% PEG 3350, 0.2M magnesium chloride, 0.4M barium chloride, 0.1M Bis-Tris, pH 6.0, VAPOR DIFFUSION, HANGING DROP, temperature 298.0K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 54.32 α = 90
    b = 63.07 β = 103.77
    c = 105.29 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2009-06-30
     
    Diffraction Radiation
    Monochromator Double-crystal, Si(111) liquid N2 cooled
    Diffraction Protocol MAD
     
    Diffraction Source
    Source SYNCHROTRON
    Type ALS BEAMLINE 5.0.2
    Wavelength List 0.97941, 0.97950, 0.97630
    Site ALS
    Beamline 5.0.2
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.5
    Resolution(Low) 50
    Number Reflections(Observed) 43542
    Percent Possible(Observed) 92.3
    R Merge I(Observed) 0.093
     
    High Resolution Shell Details
    Resolution(High) 2.5
    Resolution(Low) 2.54
    Percent Possible(All) 66.4
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MAD
    reflnsShellList 2.69
    Resolution(Low) 42.91
    Cut-off Sigma(F) 1.94
    Number of Reflections(all) 43482
    Number of Reflections(Observed) 36535
    Number of Reflections(R-Free) 1854
    Percent Reflections(Observed) 96.99
    R-Factor(Observed) 0.197
    R-Work 0.1944
    R-Free 0.2439
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 28.6253
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -11.3751
    Anisotropic B[2][2] -16.4608
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -12.9613
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.69
    Shell Resolution(Low) 2.7862
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2981
    R-Factor(R-Work) 0.2481
    R-Factor(R-Free) 0.3318
    Percent Reflections(Observed) 84.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7862
    Shell Resolution(Low) 2.8977
    Number of Reflections(R-Free) 175
    Number of Reflections(R-Work) 3276
    R-Factor(R-Work) 0.2482
    R-Factor(R-Free) 0.346
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8977
    Shell Resolution(Low) 3.0295
    Number of Reflections(R-Free) 179
    Number of Reflections(R-Work) 3417
    R-Factor(R-Work) 0.2348
    R-Factor(R-Free) 0.2896
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0295
    Shell Resolution(Low) 3.1892
    Number of Reflections(R-Free) 188
    Number of Reflections(R-Work) 3603
    R-Factor(R-Work) 0.2228
    R-Factor(R-Free) 0.2807
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1892
    Shell Resolution(Low) 3.3889
    Number of Reflections(R-Free) 204
    Number of Reflections(R-Work) 3551
    R-Factor(R-Work) 0.2044
    R-Factor(R-Free) 0.2519
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3889
    Shell Resolution(Low) 3.6505
    Number of Reflections(R-Free) 203
    Number of Reflections(R-Work) 3573
    R-Factor(R-Work) 0.2022
    R-Factor(R-Free) 0.2526
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6505
    Shell Resolution(Low) 4.0176
    Number of Reflections(R-Free) 173
    Number of Reflections(R-Work) 3566
    R-Factor(R-Work) 0.1666
    R-Factor(R-Free) 0.1966
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0176
    Shell Resolution(Low) 4.5984
    Number of Reflections(R-Free) 176
    Number of Reflections(R-Work) 3611
    R-Factor(R-Work) 0.157
    R-Factor(R-Free) 0.2038
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5984
    Shell Resolution(Low) 5.7912
    Number of Reflections(R-Free) 193
    Number of Reflections(R-Work) 3559
    R-Factor(R-Work) 0.1943
    R-Factor(R-Free) 0.2363
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.7912
    Shell Resolution(Low) 42.915
    Number of Reflections(R-Free) 216
    Number of Reflections(R-Work) 3544
    R-Factor(R-Work) 0.1883
    R-Factor(R-Free) 0.231
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.071
    f_dihedral_angle_d 15.508
    f_angle_d 1.169
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4328
    Nucleic Acid Atoms 0
    Heterogen Atoms 5
    Solvent Atoms 61
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution SOLVE
    Structure Refinement PHENIX (phenix.refine: 1.7.3_928)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.6_289)
    model building SOLVE
    data collection HKL-2000