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X-RAY DIFFRACTION
Materials and Methods page
4DVX
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.5
    Temperature 293.0
    Details 10% PEG 8000, 5% iso-propanol, 0.1M HEPES, pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 64.61 α = 90
    b = 68.29 β = 91.47
    c = 93.96 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Detector
    Detector CCD
    Type MAR scanner 300 mm plate
    Collection Date 2011-06-23
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 22-BM
    Wavelength List 1
    Site APS
    Beamline 22-BM
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.4
    Resolution(Low) 50
    Number Reflections(All) 32234
    Number Reflections(Observed) 26948
    Percent Possible(Observed) 83.6
    R Merge I(Observed) 0.059
    B(Isotropic) From Wilson Plot 41.97
    Redundancy 3.5
     
    High Resolution Shell Details
    Resolution(High) 2.4
    Resolution(Low) 2.44
    Percent Possible(All) 27.9
    R Merge I(Observed) 0.401
    Mean I Over Sigma(Observed) 1.7
    R-Sym I(Observed) 0.48
    Redundancy 2.2
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.4
    Resolution(Low) 28.461
    Cut-off Sigma(F) 1.37
    Number of Reflections(all) 32160
    Number of Reflections(Observed) 26844
    Number of Reflections(R-Free) 1307
    Percent Reflections(Observed) 83.47
    R-Factor(Observed) 0.2035
    R-Work 0.2004
    R-Free 0.2626
     
    Temperature Factor Modeling
    Mean Isotropic B Value 64.1823
    Anisotropic B[1][1] 7.2426
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -5.736
    Anisotropic B[2][2] 0.3146
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -7.5573
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4004
    Shell Resolution(Low) 2.4964
    Number of Reflections(R-Free) 49
    Number of Reflections(R-Work) 1081
    R-Factor(R-Work) 0.272
    R-Factor(R-Free) 0.3506
    Percent Reflections(Observed) 32.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4964
    Shell Resolution(Low) 2.61
    Number of Reflections(R-Free) 94
    Number of Reflections(R-Work) 1775
    R-Factor(R-Work) 0.2687
    R-Factor(R-Free) 0.3496
    Percent Reflections(Observed) 52.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.61
    Shell Resolution(Low) 2.7474
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2546
    R-Factor(R-Work) 0.2667
    R-Factor(R-Free) 0.3086
    Percent Reflections(Observed) 75.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7474
    Shell Resolution(Low) 2.9194
    Number of Reflections(R-Free) 173
    Number of Reflections(R-Work) 3162
    R-Factor(R-Work) 0.2615
    R-Factor(R-Free) 0.3489
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9194
    Shell Resolution(Low) 3.1446
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 3362
    R-Factor(R-Work) 0.2442
    R-Factor(R-Free) 0.348
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1446
    Shell Resolution(Low) 3.4605
    Number of Reflections(R-Free) 183
    Number of Reflections(R-Work) 3332
    R-Factor(R-Work) 0.2208
    R-Factor(R-Free) 0.2765
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4605
    Shell Resolution(Low) 3.9601
    Number of Reflections(R-Free) 168
    Number of Reflections(R-Work) 3399
    R-Factor(R-Work) 0.1859
    R-Factor(R-Free) 0.2618
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9601
    Shell Resolution(Low) 4.985
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 3422
    R-Factor(R-Work) 0.167
    R-Factor(R-Free) 0.2138
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.985
    Shell Resolution(Low) 28.463
    Number of Reflections(R-Free) 191
    Number of Reflections(R-Work) 3458
    R-Factor(R-Work) 0.1798
    R-Factor(R-Free) 0.2321
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.001
    f_chiral_restr 0.025
    f_dihedral_angle_d 10.848
    f_angle_d 0.403
    f_bond_d 0.001
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 5308
    Nucleic Acid Atoms 0
    Heterogen Atoms 384
    Solvent Atoms 96
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASES
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    data extraction pdb_extract version: 3.10
    refinement phenix