X-RAY DIFFRACTION Experimental Data & Validation


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Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 7.5
Temperature 293.0
Details 10% PEG 8000, 5% iso-propanol, 0.1M HEPES 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 64.59 α = 90
b = 68.53 β = 91.27
c = 94.15 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MAR scanner 300 mm plate -- 2011-06-23
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-BM -- APS 22-BM

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.2 50 97.1 0.05 0.062 -- 3.5 42164 40942 0.0 0.0 40.71
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.2 2.24 80.3 0.357 0.402 2.13 2.6 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.2 27.739 -- 1.42 42494 39980 2006 94.08 -- 0.187 0.1845 0.2325 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.1901 2.2449 -- 107 1924 0.2475 0.2878 -- 67.0
X Ray Diffraction 2.2449 2.3056 -- 120 2359 0.2363 0.3218 -- 82.0
X Ray Diffraction 2.3056 2.3734 -- 149 2542 0.2231 0.2772 -- 90.0
X Ray Diffraction 2.3734 2.4499 -- 135 2677 0.2246 0.2516 -- 93.0
X Ray Diffraction 2.4499 2.5374 -- 137 2786 0.2125 0.2625 -- 96.0
X Ray Diffraction 2.5374 2.6389 -- 161 2783 0.209 0.2639 -- 98.0
X Ray Diffraction 2.6389 2.7589 -- 150 2815 0.2044 0.2755 -- 98.0
X Ray Diffraction 2.7589 2.9043 -- 140 2833 0.2054 0.2533 -- 99.0
X Ray Diffraction 2.9043 3.086 -- 154 2854 0.1984 0.2508 -- 99.0
X Ray Diffraction 3.086 3.3239 -- 156 2846 0.1938 0.2326 -- 99.0
X Ray Diffraction 3.3239 3.6577 -- 139 2856 0.1815 0.2204 -- 98.0
X Ray Diffraction 3.6577 4.1855 -- 157 2840 0.1672 0.1934 -- 98.0
X Ray Diffraction 4.1855 5.2673 -- 151 2902 0.1525 0.1983 -- 99.0
X Ray Diffraction 5.2673 27.7415 -- 150 2957 0.1787 0.2434 -- 99.0
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 57.4785
Anisotropic B[1][1] 6.3929
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] -2.081
Anisotropic B[2][2] 0.52
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -6.9129
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.002
f_chiral_restr 0.034
f_dihedral_angle_d 11.998
f_angle_d 0.521
f_bond_d 0.002
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 5308
Nucleic Acid Atoms 0
Heterogen Atoms 355
Solvent Atoms 231

Software

Computing
Computing Package Purpose
HKL-2000 Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
PHASES Structure Solution
PHENIX (phenix.refine: 1.8_1069) Structure Refinement
Software
Software Name Purpose
pdb_extract version: 3.10 data extraction
phenix refinement