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X-RAY DIFFRACTION
Materials and Methods page
4DVW
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.5
    Temperature 293.0
    Details 10% PEG 8000, 5% iso-propanol, 0.1M HEPES 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 64.59 α = 90
    b = 68.53 β = 91.27
    c = 94.15 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MAR scanner 300 mm plate
    Collection Date 2011-06-23
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 22-BM
    Wavelength 1
    Site APS
    Beamline 22-BM
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.2
    Resolution(Low) 50
    Number Reflections(All) 42164
    Number Reflections(Observed) 40942
    Percent Possible(Observed) 97.1
    R Merge I(Observed) 0.05
    B(Isotropic) From Wilson Plot 40.71
    Redundancy 3.5
     
    High Resolution Shell Details
    Resolution(High) 2.2
    Resolution(Low) 2.24
    Percent Possible(All) 80.3
    R Merge I(Observed) 0.357
    Mean I Over Sigma(Observed) 2.13
    R-Sym I(Observed) 0.402
    Redundancy 2.6
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.2
    Resolution(Low) 27.739
    Cut-off Sigma(F) 1.42
    Number of Reflections(all) 42494
    Number of Reflections(Observed) 39980
    Number of Reflections(R-Free) 2006
    Percent Reflections(Observed) 94.08
    R-Factor(Observed) 0.187
    R-Work 0.1845
    R-Free 0.2325
     
    Temperature Factor Modeling
    Mean Isotropic B Value 57.4785
    Anisotropic B[1][1] 6.3929
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -2.081
    Anisotropic B[2][2] 0.52
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -6.9129
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1901
    Shell Resolution(Low) 2.2449
    Number of Reflections(R-Free) 107
    Number of Reflections(R-Work) 1924
    R-Factor(R-Work) 0.2475
    R-Factor(R-Free) 0.2878
    Percent Reflections(Observed) 67.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2449
    Shell Resolution(Low) 2.3056
    Number of Reflections(R-Free) 120
    Number of Reflections(R-Work) 2359
    R-Factor(R-Work) 0.2363
    R-Factor(R-Free) 0.3218
    Percent Reflections(Observed) 82.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3056
    Shell Resolution(Low) 2.3734
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2542
    R-Factor(R-Work) 0.2231
    R-Factor(R-Free) 0.2772
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3734
    Shell Resolution(Low) 2.4499
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2677
    R-Factor(R-Work) 0.2246
    R-Factor(R-Free) 0.2516
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4499
    Shell Resolution(Low) 2.5374
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2786
    R-Factor(R-Work) 0.2125
    R-Factor(R-Free) 0.2625
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5374
    Shell Resolution(Low) 2.6389
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 2783
    R-Factor(R-Work) 0.209
    R-Factor(R-Free) 0.2639
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6389
    Shell Resolution(Low) 2.7589
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2815
    R-Factor(R-Work) 0.2044
    R-Factor(R-Free) 0.2755
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7589
    Shell Resolution(Low) 2.9043
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2833
    R-Factor(R-Work) 0.2054
    R-Factor(R-Free) 0.2533
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9043
    Shell Resolution(Low) 3.086
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2854
    R-Factor(R-Work) 0.1984
    R-Factor(R-Free) 0.2508
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.086
    Shell Resolution(Low) 3.3239
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2846
    R-Factor(R-Work) 0.1938
    R-Factor(R-Free) 0.2326
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3239
    Shell Resolution(Low) 3.6577
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2856
    R-Factor(R-Work) 0.1815
    R-Factor(R-Free) 0.2204
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6577
    Shell Resolution(Low) 4.1855
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 2840
    R-Factor(R-Work) 0.1672
    R-Factor(R-Free) 0.1934
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1855
    Shell Resolution(Low) 5.2673
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2902
    R-Factor(R-Work) 0.1525
    R-Factor(R-Free) 0.1983
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.2673
    Shell Resolution(Low) 27.7415
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2957
    R-Factor(R-Work) 0.1787
    R-Factor(R-Free) 0.2434
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.002
    f_chiral_restr 0.034
    f_dihedral_angle_d 11.998
    f_angle_d 0.521
    f_bond_d 0.002
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 5308
    Nucleic Acid Atoms 0
    Heterogen Atoms 355
    Solvent Atoms 231
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASES
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    data extraction pdb_extract version: 3.10
    refinement phenix