POP-OUT | CLOSE
 
X-RAY DIFFRACTION
Materials and Methods page
4DVT
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.5
    Temperature 293.0
    Details 10% PEG 8000, 5% iso-propanol, 0.1M HEPES, pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 64.81 α = 90
    b = 68.4 β = 91.94
    c = 93.99 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MAR scanner 300 mm plate
    Collection Date 2011-06-06
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 22-BM
    Wavelength 1
    Site APS
    Beamline 22-BM
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.4
    Resolution(Low) 50
    Number Reflections(All) 29562
    Number Reflections(Observed) 27759
    Percent Possible(Observed) 93.9
    R Merge I(Observed) 0.071
    B(Isotropic) From Wilson Plot 45.16
    Redundancy 3.0
     
    High Resolution Shell Details
    Resolution(High) 2.5
    Resolution(Low) 2.54
    Percent Possible(All) 60.0
    R Merge I(Observed) 0.432
    Mean I Over Sigma(Observed) 1.46
    R-Sym I(Observed) 0.485
    Redundancy 1.8
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.4
    Resolution(Low) 28.192
    Cut-off Sigma(F) 1.42
    Number of Reflections(all) 31053
    Number of Reflections(Observed) 27089
    Number of Reflections(R-Free) 1309
    Percent Reflections(Observed) 87.24
    R-Factor(Observed) 0.199
    R-Work 0.1964
    R-Free 0.2477
     
    Temperature Factor Modeling
    Mean Isotropic B Value 65.4336
    Anisotropic B[1][1] 7.0651
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -6.0723
    Anisotropic B[2][2] -2.6638
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -4.4014
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4336
    Shell Resolution(Low) 2.531
    Number of Reflections(R-Free) 25
    Number of Reflections(R-Work) 960
    R-Factor(R-Work) 0.2812
    R-Factor(R-Free) 0.3214
    Percent Reflections(Observed) 29.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.531
    Shell Resolution(Low) 2.6461
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2344
    R-Factor(R-Work) 0.2695
    R-Factor(R-Free) 0.3635
    Percent Reflections(Observed) 73.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6461
    Shell Resolution(Low) 2.7855
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2970
    R-Factor(R-Work) 0.2566
    R-Factor(R-Free) 0.3078
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7855
    Shell Resolution(Low) 2.9599
    Number of Reflections(R-Free) 174
    Number of Reflections(R-Work) 3180
    R-Factor(R-Work) 0.2469
    R-Factor(R-Free) 0.3047
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9599
    Shell Resolution(Low) 3.1881
    Number of Reflections(R-Free) 168
    Number of Reflections(R-Work) 3169
    R-Factor(R-Work) 0.2316
    R-Factor(R-Free) 0.3014
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1881
    Shell Resolution(Low) 3.5084
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 3286
    R-Factor(R-Work) 0.2101
    R-Factor(R-Free) 0.2957
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5084
    Shell Resolution(Low) 4.0148
    Number of Reflections(R-Free) 185
    Number of Reflections(R-Work) 3262
    R-Factor(R-Work) 0.1833
    R-Factor(R-Free) 0.2274
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0148
    Shell Resolution(Low) 5.0535
    Number of Reflections(R-Free) 173
    Number of Reflections(R-Work) 3272
    R-Factor(R-Work) 0.164
    R-Factor(R-Free) 0.2151
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.0535
    Shell Resolution(Low) 28.1935
    Number of Reflections(R-Free) 172
    Number of Reflections(R-Work) 3337
    R-Factor(R-Work) 0.1751
    R-Factor(R-Free) 0.2114
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.001
    f_chiral_restr 0.026
    f_dihedral_angle_d 10.773
    f_angle_d 0.402
    f_bond_d 0.001
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 5308
    Nucleic Acid Atoms 0
    Heterogen Atoms 388
    Solvent Atoms 107
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASES
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    data extraction pdb_extract version: 3.10
    refinement phenix