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X-RAY DIFFRACTION
Materials and Methods page
4DUI
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 4.6
    Temperature 292.0
    Details 0.02M CACL2, 0.1 NA ACETATE, 30% MPD, pH 4.6, VAPOR DIFFUSION, HANGING DROP, temperature 292K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 43.4 α = 90
    b = 43.4 β = 90
    c = 143.12 γ = 90
     
    Space Group
    Space Group Name:    P 41 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PIXEL
    Type DECTRIS PILATUS 6M
    Details Kirkpatrick-Baez pair of bi-morph mirrors plus channel cut cryogenically cooled monochromator crystal
    Collection Date 2011-10-14
     
    Diffraction Radiation
    Monochromator CRYSTAL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SOLEIL BEAMLINE PROXIMA 1
    Wavelength List 0.980
    Site SOLEIL
    Beamline PROXIMA 1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.35
    Resolution(High) 1.16
    Resolution(Low) 41.53
    Number Reflections(Observed) 48400
    Percent Possible(Observed) 99.5
    R Merge I(Observed) 0.08
    B(Isotropic) From Wilson Plot 14.97
    Redundancy 5.08
     
    High Resolution Shell Details
    Resolution(High) 1.16
    Resolution(Low) 1.23
    Percent Possible(All) 97.8
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.16
    Resolution(Low) 32.103
    Cut-off Sigma(F) 1.35
    Number of Reflections(all) 48528
    Number of Reflections(Observed) 48392
    Number of Reflections(R-Free) 4840
    Percent Reflections(Observed) 99.72
    R-Factor(Observed) 0.1254
    R-Work 0.1228
    R-Free 0.1493
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -0.3291
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -0.3291
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.6581
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.1601
    Shell Resolution(Low) 1.1733
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 1408
    R-Factor(R-Work) 0.2124
    R-Factor(R-Free) 0.2557
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.1733
    Shell Resolution(Low) 1.1871
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 1401
    R-Factor(R-Work) 0.1736
    R-Factor(R-Free) 0.2167
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.1871
    Shell Resolution(Low) 1.2015
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 1425
    R-Factor(R-Work) 0.1635
    R-Factor(R-Free) 0.2006
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2015
    Shell Resolution(Low) 1.2168
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 1408
    R-Factor(R-Work) 0.1619
    R-Factor(R-Free) 0.1744
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2168
    Shell Resolution(Low) 1.2328
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 1426
    R-Factor(R-Work) 0.1508
    R-Factor(R-Free) 0.2053
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2328
    Shell Resolution(Low) 1.2497
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 1433
    R-Factor(R-Work) 0.1457
    R-Factor(R-Free) 0.205
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2497
    Shell Resolution(Low) 1.2675
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 1417
    R-Factor(R-Work) 0.1383
    R-Factor(R-Free) 0.1872
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2675
    Shell Resolution(Low) 1.2864
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 1436
    R-Factor(R-Work) 0.1407
    R-Factor(R-Free) 0.1894
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2864
    Shell Resolution(Low) 1.3065
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 1429
    R-Factor(R-Work) 0.1339
    R-Factor(R-Free) 0.1853
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3065
    Shell Resolution(Low) 1.328
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 1439
    R-Factor(R-Work) 0.1208
    R-Factor(R-Free) 0.1673
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.328
    Shell Resolution(Low) 1.3509
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 1427
    R-Factor(R-Work) 0.111
    R-Factor(R-Free) 0.1599
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3509
    Shell Resolution(Low) 1.3754
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 1417
    R-Factor(R-Work) 0.1127
    R-Factor(R-Free) 0.1482
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3754
    Shell Resolution(Low) 1.4019
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 1457
    R-Factor(R-Work) 0.1104
    R-Factor(R-Free) 0.1482
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4019
    Shell Resolution(Low) 1.4305
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 1434
    R-Factor(R-Work) 0.0996
    R-Factor(R-Free) 0.1541
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4305
    Shell Resolution(Low) 1.4616
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 1443
    R-Factor(R-Work) 0.0964
    R-Factor(R-Free) 0.145
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4616
    Shell Resolution(Low) 1.4956
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 1464
    R-Factor(R-Work) 0.0968
    R-Factor(R-Free) 0.1422
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4956
    Shell Resolution(Low) 1.533
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 1418
    R-Factor(R-Work) 0.0902
    R-Factor(R-Free) 0.1344
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.533
    Shell Resolution(Low) 1.5744
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 1441
    R-Factor(R-Work) 0.0884
    R-Factor(R-Free) 0.1356
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5744
    Shell Resolution(Low) 1.6208
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 1452
    R-Factor(R-Work) 0.0995
    R-Factor(R-Free) 0.1208
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6208
    Shell Resolution(Low) 1.6731
    Number of Reflections(R-Free) 163
    Number of Reflections(R-Work) 1458
    R-Factor(R-Work) 0.0975
    R-Factor(R-Free) 0.1343
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6731
    Shell Resolution(Low) 1.7329
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 1447
    R-Factor(R-Work) 0.1023
    R-Factor(R-Free) 0.1272
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7329
    Shell Resolution(Low) 1.8022
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 1467
    R-Factor(R-Work) 0.1015
    R-Factor(R-Free) 0.1271
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8022
    Shell Resolution(Low) 1.8843
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 1441
    R-Factor(R-Work) 0.1013
    R-Factor(R-Free) 0.1145
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8843
    Shell Resolution(Low) 1.9836
    Number of Reflections(R-Free) 163
    Number of Reflections(R-Work) 1471
    R-Factor(R-Work) 0.1102
    R-Factor(R-Free) 0.1408
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9836
    Shell Resolution(Low) 2.1078
    Number of Reflections(R-Free) 163
    Number of Reflections(R-Work) 1470
    R-Factor(R-Work) 0.1039
    R-Factor(R-Free) 0.1207
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1078
    Shell Resolution(Low) 2.2706
    Number of Reflections(R-Free) 164
    Number of Reflections(R-Work) 1479
    R-Factor(R-Work) 0.1103
    R-Factor(R-Free) 0.128
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2706
    Shell Resolution(Low) 2.499
    Number of Reflections(R-Free) 165
    Number of Reflections(R-Work) 1475
    R-Factor(R-Work) 0.1082
    R-Factor(R-Free) 0.1315
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.499
    Shell Resolution(Low) 2.8604
    Number of Reflections(R-Free) 167
    Number of Reflections(R-Work) 1501
    R-Factor(R-Work) 0.1192
    R-Factor(R-Free) 0.1328
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8604
    Shell Resolution(Low) 3.603
    Number of Reflections(R-Free) 171
    Number of Reflections(R-Work) 1544
    R-Factor(R-Work) 0.1294
    R-Factor(R-Free) 0.1564
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.603
    Shell Resolution(Low) 32.1155
    Number of Reflections(R-Free) 181
    Number of Reflections(R-Work) 1624
    R-Factor(R-Work) 0.1649
    R-Factor(R-Free) 0.1775
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.007
    f_chiral_restr 0.083
    f_dihedral_angle_d 13.824
    f_angle_d 1.8
    f_bond_d 0.013
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1232
    Nucleic Acid Atoms 0
    Heterogen Atoms 32
    Solvent Atoms 167
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.7.3_928)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.3_928)
    model building PHASER