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X-RAY DIFFRACTION
Materials and Methods page
4DTE
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION
    pH 6.1
    Temperature 277.15
    Details 20% (w/v) PEG3350, 0.2 M NaCl, 0.1 M bis-Tris, pH 6.1, VAPOR DIFFUSION, temperature 277.15K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 65.16 α = 90
    b = 73.77 β = 102.73
    c = 91.75 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2011-02-04
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SOLEIL BEAMLINE PROXIMA 1
    Wavelength List 0.98
    Site SOLEIL
    Beamline PROXIMA 1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 11.98
    Resolution(High) 1.96
    Resolution(Low) 59.15
    Number Reflections(All) 61074
    Number Reflections(Observed) 60335
    Percent Possible(Observed) 98.8
     
    High Resolution Shell Details
    Resolution(High) 1.96
    Resolution(Low) 2.01
    Percent Possible(All) 95.5
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.96
    Resolution(Low) 44.747
    Cut-off Sigma(F) 1.34
    Number of Reflections(all) 61074
    Number of Reflections(Observed) 60303
    Number of Reflections(R-Free) 2000
    Percent Reflections(Observed) 98.83
    R-Factor(Observed) 0.1751
    R-Work 0.1736
    R-Free 0.2189
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -4.7527
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 5.2108
    Anisotropic B[2][2] -1.9212
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 6.6739
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9601
    Shell Resolution(Low) 2.0091
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 4014
    R-Factor(R-Work) 0.2632
    R-Factor(R-Free) 0.3217
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0091
    Shell Resolution(Low) 2.0634
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 4155
    R-Factor(R-Work) 0.2564
    R-Factor(R-Free) 0.3184
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0634
    Shell Resolution(Low) 2.1241
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 4187
    R-Factor(R-Work) 0.24
    R-Factor(R-Free) 0.3043
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1241
    Shell Resolution(Low) 2.1927
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 4172
    R-Factor(R-Work) 0.2303
    R-Factor(R-Free) 0.2902
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1927
    Shell Resolution(Low) 2.271
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 4151
    R-Factor(R-Work) 0.2128
    R-Factor(R-Free) 0.3056
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.271
    Shell Resolution(Low) 2.362
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 4150
    R-Factor(R-Work) 0.2014
    R-Factor(R-Free) 0.2908
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.362
    Shell Resolution(Low) 2.4694
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 4171
    R-Factor(R-Work) 0.1956
    R-Factor(R-Free) 0.2391
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4694
    Shell Resolution(Low) 2.5996
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 4163
    R-Factor(R-Work) 0.1863
    R-Factor(R-Free) 0.2191
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5996
    Shell Resolution(Low) 2.7625
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 4163
    R-Factor(R-Work) 0.1816
    R-Factor(R-Free) 0.2281
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7625
    Shell Resolution(Low) 2.9757
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 4164
    R-Factor(R-Work) 0.1746
    R-Factor(R-Free) 0.2275
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9757
    Shell Resolution(Low) 3.2751
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 4185
    R-Factor(R-Work) 0.1706
    R-Factor(R-Free) 0.2106
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2751
    Shell Resolution(Low) 3.7488
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 4171
    R-Factor(R-Work) 0.1524
    R-Factor(R-Free) 0.1989
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7488
    Shell Resolution(Low) 4.7223
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 4218
    R-Factor(R-Work) 0.1348
    R-Factor(R-Free) 0.1856
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7223
    Shell Resolution(Low) 44.759
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 4239
    R-Factor(R-Work) 0.154
    R-Factor(R-Free) 0.1677
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.009
    f_chiral_restr 0.131
    f_dihedral_angle_d 16.087
    f_angle_d 1.757
    f_bond_d 0.019
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 5822
    Nucleic Acid Atoms 0
    Heterogen Atoms 28
    Solvent Atoms 443
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XIA II
    Data Reduction (data scaling) XIA II
    Structure Refinement PHENIX (phenix.refine: 1.8.2_1309)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.3_928)