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X-RAY DIFFRACTION
Materials and Methods page
4DQZ
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.5
    Temperature 291.0
    Details 15% PEG 400, 0.1M NaCl, 0.1M MES, pH 6.5, VAPOR DIFFUSION, HANGING DROP, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 68.5 α = 90
    b = 68.5 β = 90
    c = 165.66 γ = 120
     
    Space Group
    Space Group Name:    P 65
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 200
     
    Diffraction Detector
    Detector CCD
    Type MAR scanner 345 mm plate
    Collection Date 2011-10-08
     
    Diffraction Radiation
    Monochromator GRAPHITE
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 21-ID-F
    Wavelength List 0.9787
    Site APS
    Beamline 21-ID-F
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2.3
    Resolution(Low) 50
    Number Reflections(All) 19468
    Number Reflections(Observed) 19215
    Percent Possible(Observed) 98.7
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 2.301
    Resolution(Low) 40.42
    Cut-off Sigma(F) 1.41
    Number of Reflections(all) 19498
    Number of Reflections(Observed) 19215
    Number of Reflections(R-Free) 1908
    Percent Reflections(Observed) 98.55
    R-Factor(Observed) 0.2093
    R-Work 0.2042
    R-Free 0.2569
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -3.9289
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -3.9289
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 7.8578
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.301
    Shell Resolution(Low) 2.3584
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 1275
    R-Factor(R-Work) 0.2872
    R-Factor(R-Free) 0.3762
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3584
    Shell Resolution(Low) 2.4221
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 1230
    R-Factor(R-Work) 0.2429
    R-Factor(R-Free) 0.2705
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4221
    Shell Resolution(Low) 2.4934
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 1244
    R-Factor(R-Work) 0.2441
    R-Factor(R-Free) 0.3673
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4934
    Shell Resolution(Low) 2.5739
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 1247
    R-Factor(R-Work) 0.2506
    R-Factor(R-Free) 0.3149
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5739
    Shell Resolution(Low) 2.6658
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 1260
    R-Factor(R-Work) 0.2188
    R-Factor(R-Free) 0.3293
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6658
    Shell Resolution(Low) 2.7725
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 1247
    R-Factor(R-Work) 0.2177
    R-Factor(R-Free) 0.301
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7725
    Shell Resolution(Low) 2.8987
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 1240
    R-Factor(R-Work) 0.225
    R-Factor(R-Free) 0.2792
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8987
    Shell Resolution(Low) 3.0515
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 1256
    R-Factor(R-Work) 0.2095
    R-Factor(R-Free) 0.3478
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0515
    Shell Resolution(Low) 3.2426
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 1253
    R-Factor(R-Work) 0.2426
    R-Factor(R-Free) 0.2788
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2426
    Shell Resolution(Low) 3.4928
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 1258
    R-Factor(R-Work) 0.2167
    R-Factor(R-Free) 0.265
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4928
    Shell Resolution(Low) 3.8441
    Number of Reflections(R-Free) 121
    Number of Reflections(R-Work) 1088
    R-Factor(R-Work) 0.2002
    R-Factor(R-Free) 0.2244
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8441
    Shell Resolution(Low) 4.3997
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 1252
    R-Factor(R-Work) 0.1727
    R-Factor(R-Free) 0.1796
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3997
    Shell Resolution(Low) 5.5409
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 1258
    R-Factor(R-Work) 0.1518
    R-Factor(R-Free) 0.2057
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.5409
    Shell Resolution(Low) 40.4261
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 1199
    R-Factor(R-Work) 0.2176
    R-Factor(R-Free) 0.2686
    Percent Reflections(Observed) 94.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.009
    f_chiral_restr 0.091
    f_dihedral_angle_d 14.792
    f_angle_d 1.376
    f_bond_d 0.01
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2734
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 62
     
     
  •   Software and Computing Hide
    Computing
    Data Collection MAR345dtb
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution Phenix
    Structure Refinement PHENIX (phenix.refine: dev_985)
     
    Software
    refinement PHENIX version: (phenix.refine: dev_985)
    model building Phenix
    data collection MAR345dtb