X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 6.5
Temperature 291.0
Details 15% PEG 400, 0.1M NaCl, 0.1M MES, pH 6.5, VAPOR DIFFUSION, HANGING DROP, temperature 291K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 68.5 α = 90
b = 68.5 β = 90
c = 165.66 γ = 120
Symmetry
Space Group P 65

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 200
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MAR scanner 345 mm plate -- 2011-10-08
Diffraction Radiation
Monochromator Protocol
GRAPHITE SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 21-ID-F 0.9787 APS 21-ID-F

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.3 50 98.7 -- -- -- -- 19468 19215 2.0 2.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SAD 2.301 40.42 -- 1.41 19498 19215 1908 98.55 -- 0.2093 0.2042 0.2569 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.301 2.3584 -- 142 1275 0.2872 0.3762 -- 100.0
X Ray Diffraction 2.3584 2.4221 -- 136 1230 0.2429 0.2705 -- 100.0
X Ray Diffraction 2.4221 2.4934 -- 137 1244 0.2441 0.3673 -- 100.0
X Ray Diffraction 2.4934 2.5739 -- 135 1247 0.2506 0.3149 -- 100.0
X Ray Diffraction 2.5739 2.6658 -- 142 1260 0.2188 0.3293 -- 100.0
X Ray Diffraction 2.6658 2.7725 -- 139 1247 0.2177 0.301 -- 100.0
X Ray Diffraction 2.7725 2.8987 -- 141 1240 0.225 0.2792 -- 100.0
X Ray Diffraction 2.8987 3.0515 -- 130 1256 0.2095 0.3478 -- 100.0
X Ray Diffraction 3.0515 3.2426 -- 146 1253 0.2426 0.2788 -- 100.0
X Ray Diffraction 3.2426 3.4928 -- 136 1258 0.2167 0.265 -- 100.0
X Ray Diffraction 3.4928 3.8441 -- 121 1088 0.2002 0.2244 -- 87.0
X Ray Diffraction 3.8441 4.3997 -- 136 1252 0.1727 0.1796 -- 100.0
X Ray Diffraction 4.3997 5.5409 -- 134 1258 0.1518 0.2057 -- 100.0
X Ray Diffraction 5.5409 40.4261 -- 133 1199 0.2176 0.2686 -- 94.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] -3.9289
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -3.9289
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 7.8578
RMS Deviations
Key Refinement Restraint Deviation
f_dihedral_angle_d 14.792
f_chiral_restr 0.091
f_plane_restr 0.009
f_bond_d 0.01
f_angle_d 1.376
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2734
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 62

Software

Computing
Computing Package Purpose
MAR345dtb Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
Phenix Structure Solution
PHENIX (phenix.refine: dev_985) Structure Refinement
Software
Software Name Purpose
MAR345dtb data collection
PHENIX version: (phenix.refine: dev_985) refinement
Phenix model building