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X-RAY DIFFRACTION
Materials and Methods page
4DQN
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.5
    Temperature 293.0
    Details 0.2M sodium chloride, 100mM HEPES (pH 7.5), 25% (w/v) PEG 3350, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 76.04 α = 90
    b = 76.04 β = 90
    c = 119.42 γ = 120
     
    Space Group
    Space Group Name:    P 31 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Collection Date 2010-10-01
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRF BEAMLINE BL17U
    Wavelength List 1
    Site SSRF
    Beamline BL17U
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 1.97
    Resolution(Low) 50
    Number Reflections(All) 29016
    Number Reflections(Observed) 29016
    Percent Possible(Observed) 100.0
    B(Isotropic) From Wilson Plot 31.28
     
    High Resolution Shell Details
    Resolution(High) 1.97
    Resolution(Low) 2.01
    Percent Possible(All) 100.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.97
    Resolution(Low) 34.067
    Cut-off Sigma(F) 1.34
    Number of Reflections(all) 29016
    Number of Reflections(Observed) 28876
    Number of Reflections(R-Free) 1478
    Percent Reflections(Observed) 99.98
    R-Factor(Observed) 0.1879
    R-Work 0.1861
    R-Free 0.22
     
    Temperature Factor Modeling
    Mean Isotropic B Value 35.453
    Anisotropic B[1][1] 3.1677
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 3.1677
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -6.3354
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9701
    Shell Resolution(Low) 2.0337
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2455
    R-Factor(R-Work) 0.2099
    R-Factor(R-Free) 0.2881
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0337
    Shell Resolution(Low) 2.1063
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2456
    R-Factor(R-Work) 0.1942
    R-Factor(R-Free) 0.2459
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1063
    Shell Resolution(Low) 2.1907
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2432
    R-Factor(R-Work) 0.1931
    R-Factor(R-Free) 0.2392
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1907
    Shell Resolution(Low) 2.2903
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2464
    R-Factor(R-Work) 0.1802
    R-Factor(R-Free) 0.2281
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2903
    Shell Resolution(Low) 2.4111
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2457
    R-Factor(R-Work) 0.1855
    R-Factor(R-Free) 0.2406
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4111
    Shell Resolution(Low) 2.5621
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2465
    R-Factor(R-Work) 0.1948
    R-Factor(R-Free) 0.2412
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5621
    Shell Resolution(Low) 2.7598
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2486
    R-Factor(R-Work) 0.2025
    R-Factor(R-Free) 0.2361
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7598
    Shell Resolution(Low) 3.0374
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2500
    R-Factor(R-Work) 0.2147
    R-Factor(R-Free) 0.2295
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0374
    Shell Resolution(Low) 3.4765
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2506
    R-Factor(R-Work) 0.1915
    R-Factor(R-Free) 0.2166
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4765
    Shell Resolution(Low) 4.3786
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2517
    R-Factor(R-Work) 0.1679
    R-Factor(R-Free) 0.2033
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3786
    Shell Resolution(Low) 34.0725
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2660
    R-Factor(R-Work) 0.1751
    R-Factor(R-Free) 0.1977
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.089
    f_dihedral_angle_d 13.623
    f_angle_d 1.199
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2661
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 242
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.6.1_357)
    model building PHASER
    data collection HKL-2000