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X-RAY DIFFRACTION
Materials and Methods page
4DPD
  •   Crystallization Hide
    Crystallization Experiments
    Method Microbatch
    pH 4.5
    Temperature 297.0
    Details PEG 4000, NH4OAc, pH 4.5, Microbatch, temperature 297K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 58.06 α = 90
    b = 156.79 β = 90
    c = 165.03 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type Nonius Kappa CCD
    Details mirrors
    Collection Date 2004-10-29
     
    Diffraction Radiation
    Monochromator GRAPHITE
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type Cu FINE FOCUS
    Wavelength List 1.54
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 2.5
    Resolution(Low) 49.82
    Number Reflections(Observed) 53309
    Percent Possible(Observed) 100.0
    R Merge I(Observed) 0.09
     
    High Resolution Shell Details
    Resolution(High) 2.5
    Resolution(Low) 2.59
    Percent Possible(All) 99.8
    R Merge I(Observed) 0.49
    Mean I Over Sigma(Observed) 2.8344
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method FOURIER SYNTHESIS
    reflnsShellList 2.5
    Resolution(Low) 49.82
    Number of Reflections(all) 53309
    Number of Reflections(Observed) 50342
    Number of Reflections(R-Free) 2644
    Percent Reflections(Observed) 99.74
    R-Factor(Observed) 0.21511
    R-Work 0.2124
    R-Free 0.26648
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Isotropic Thermal Model Overall
    Mean Isotropic B Value 42.262
    Anisotropic B[1][1] 3.0
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -1.14
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -1.86
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5
    Shell Resolution(Low) 2.565
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 3387
    R-Factor(R-Work) 0.267
    R-Factor(R-Free) 0.334
    Percent Reflections(Observed) 99.75
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_gen_planes_other 0.001
    r_gen_planes_refined 0.005
    r_chiral_restr 0.073
    r_dihedral_angle_4_deg 15.386
    r_dihedral_angle_3_deg 14.232
    r_dihedral_angle_2_deg 38.52
    r_dihedral_angle_1_deg 6.603
    r_angle_other_deg 0.74
    r_angle_refined_deg 1.315
    r_bond_other_d 0.001
    r_bond_refined_d 0.009
     
    Coordinate Error
    Luzzati ESD(Observed) 0.31
    Luzzati Sigma A(Observed) 0.32
    Luzzati Resolution Cutoff(Low) 5.0
    Luzzati ESD(R-Free Set) 0.4
    Luzzati Sigma A(R-Free Set) 0.43
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 8927
    Nucleic Acid Atoms 0
    Heterogen Atoms 120
    Solvent Atoms 407
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) SCALEPACK
    Structure Solution CNS
    Structure Refinement REFMAC 5.6.0117
     
    Software
    refinement CNS version: 1.2
    model building CNS
    data collection HKL-2000