POP-OUT | CLOSE
 
X-RAY DIFFRACTION
Materials and Methods page
4DP3
  •   Crystallization Hide
    Crystallization Experiments
    Method Microbatch
    pH 4.5
    Temperature 297.0
    Details PEG 4000, NH4OAc, pH 4.5, Microbatch, temperature 297K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 58.5 α = 90
    b = 156.2 β = 90
    c = 164.59 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type Nonius Kappa CCD
    Details Mirrors
    Collection Date 2008-09-01
     
    Diffraction Radiation
    Monochromator GRAPHITE
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type Cu FINE FOCUS
    Wavelength List 1.54
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Resolution(High) 2.4
    Resolution(Low) 19.9
    Number Reflections(All) 57640
    Number Reflections(Observed) 57735
    Percent Possible(Observed) 96.5
    R Merge I(Observed) 0.047
    B(Isotropic) From Wilson Plot 45.8
     
    High Resolution Shell Details
    Resolution(High) 2.4
    Resolution(Low) 2.49
    Percent Possible(All) 86.7
    R Merge I(Observed) 0.248
    Number Unique Reflections(All) 5107
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method FOURIER SYNTHESIS
    reflnsShellList 2.4
    Resolution(Low) 19.9
    Cut-off Sigma(F) 1.0
    Number of Reflections(all) 59702
    Number of Reflections(Observed) 57640
    Number of Reflections(R-Free) 2903
    Percent Reflections(Observed) 96.5
    R-Work 0.205
    R-Free 0.239
     
    Temperature Factor Modeling
    Mean Isotropic B Value 49.2
    Anisotropic B[1][1] 13.88
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -3.28
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -10.6
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4
    Shell Resolution(Low) 2.51
    Number of Reflections(Observed) 6475
    Number of Reflections(R-Free) 309
    Number of Reflections(R-Work) 6166
    R-Factor(R-Work) 0.274
    R-Factor(R-Free) 0.306
    R-Free Error 0.017
    Percent Reflections(Observed) 88.1
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.51
    Shell Resolution(Low) 2.64
    Number of Reflections(Observed) 6761
    Number of Reflections(R-Free) 349
    Number of Reflections(R-Work) 6412
    R-Factor(R-Work) 0.267
    R-Factor(R-Free) 0.323
    R-Free Error 0.017
    Percent Reflections(Observed) 91.3
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.64
    Shell Resolution(Low) 2.81
    Number of Reflections(Observed) 6975
    Number of Reflections(R-Free) 312
    Number of Reflections(R-Work) 6663
    R-Factor(R-Work) 0.248
    R-Factor(R-Free) 0.299
    R-Free Error 0.017
    Percent Reflections(Observed) 94.6
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.81
    Shell Resolution(Low) 3.02
    Number of Reflections(Observed) 7258
    Number of Reflections(R-Free) 381
    Number of Reflections(R-Work) 6877
    R-Factor(R-Work) 0.236
    R-Factor(R-Free) 0.271
    R-Free Error 0.014
    Percent Reflections(Observed) 98.2
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.02
    Shell Resolution(Low) 3.33
    Number of Reflections(Observed) 7395
    Number of Reflections(R-Free) 386
    Number of Reflections(R-Work) 7009
    R-Factor(R-Work) 0.227
    R-Factor(R-Free) 0.278
    R-Free Error 0.014
    Percent Reflections(Observed) 99.6
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.33
    Shell Resolution(Low) 3.81
    Number of Reflections(Observed) 7457
    Number of Reflections(R-Free) 389
    Number of Reflections(R-Work) 7068
    R-Factor(R-Work) 0.2
    R-Factor(R-Free) 0.235
    R-Free Error 0.012
    Percent Reflections(Observed) 99.7
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.81
    Shell Resolution(Low) 4.78
    Number of Reflections(Observed) 7522
    Number of Reflections(R-Free) 382
    Number of Reflections(R-Work) 7140
    R-Factor(R-Work) 0.164
    R-Factor(R-Free) 0.192
    R-Free Error 0.01
    Percent Reflections(Observed) 99.9
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.78
    Shell Resolution(Low) 19.9
    Number of Reflections(Observed) 7797
    Number of Reflections(R-Free) 395
    Number of Reflections(R-Work) 7402
    R-Factor(R-Work) 0.186
    R-Factor(R-Free) 0.21
    R-Free Error 0.011
    Percent Reflections(Observed) 99.9
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    c_scangle_it 2.824
    c_mcangle_it 2.665
    c_scbond_it 1.878
    c_mcbond_it 1.527
    c_angle_d 1.34
    c_bond_d 0.007
     
    Coordinate Error
    Luzzati ESD(Observed) 0.28
    Luzzati Sigma A(Observed) 0.3
    Luzzati Resolution Cutoff(Low) 5.0
    Luzzati ESD(R-Free Set) 0.34
    Luzzati Sigma A(R-Free Set) 0.35
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 9068
    Nucleic Acid Atoms 0
    Heterogen Atoms 158
    Solvent Atoms 441
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL
    Data Reduction (data scaling) SCALEPACK
    Structure Refinement CNS
     
    Software
    data extraction pdb_extract version: 3.10
    refinement CNS version: 1.3
    data reduction SCALEPACK