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X-RAY DIFFRACTION
Materials and Methods page
4DOY
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.5
    Temperature 293.0
    Details 0.2M Lithium sulfate monohydrate, 0.1M BIS-TRIS, 25%(w/v) Polyethylene glycol 3350, pH 6.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 95.52 α = 98.46
    b = 98.82 β = 106.99
    c = 111.46 γ = 107.07
     
    Space Group
    Space Group Name:    P 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
    Diffrn ID 2
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type RAYONIX MX-225
    Collection Date 2009-07-10
    Detector CCD
    Type RAYONIX MX-225
    Collection Date 2009-07-10
     
    Diffraction Radiation
    Monochromator Si 111
    Diffraction Protocol SINGLE WAVELENGTH
    Monochromator Si 111
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRF BEAMLINE BL17U
    Wavelength List 0.97916
    Site SSRF
    Beamline BL17U
    Source SYNCHROTRON
    Type SSRF BEAMLINE BL17U
    Wavelength List 0.97623
    Site SSRF
    Beamline BL17U
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.79
    Resolution(Low) 50
    Number Reflections(All) 324571
    Number Reflections(Observed) 324571
    Percent Possible(Observed) 96.3
     
    High Resolution Shell Details
    Resolution(High) 1.8
    Resolution(Low) 1.86
    Percent Possible(All) 95.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 1.789
    Resolution(Low) 35.423
    Cut-off Sigma(F) 0.04
    Number of Reflections(all) 305010
    Number of Reflections(Observed) 305010
    Number of Reflections(R-Free) 15296
    Percent Reflections(Observed) 89.7
    R-Factor(Observed) 0.1696
    R-Work 0.1683
    R-Free 0.1936
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 30.5102
    Anisotropic B[1][1] -2.8058
    Anisotropic B[1][2] -6.0017
    Anisotropic B[1][3] 5.9746
    Anisotropic B[2][2] 2.2009
    Anisotropic B[2][3] -6.4489
    Anisotropic B[3][3] 0.6049
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7894
    Shell Resolution(Low) 1.8097
    Number of Reflections(R-Free) 317
    Number of Reflections(R-Work) 6080
    R-Factor(R-Work) 0.2725
    R-Factor(R-Free) 0.3224
    Percent Reflections(Observed) 56.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8097
    Shell Resolution(Low) 1.831
    Number of Reflections(R-Free) 443
    Number of Reflections(R-Work) 8424
    R-Factor(R-Work) 0.251
    R-Factor(R-Free) 0.2892
    Percent Reflections(Observed) 78.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.831
    Shell Resolution(Low) 1.8533
    Number of Reflections(R-Free) 453
    Number of Reflections(R-Work) 8495
    R-Factor(R-Work) 0.245
    R-Factor(R-Free) 0.2792
    Percent Reflections(Observed) 79.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8533
    Shell Resolution(Low) 1.8768
    Number of Reflections(R-Free) 449
    Number of Reflections(R-Work) 8568
    R-Factor(R-Work) 0.2327
    R-Factor(R-Free) 0.2769
    Percent Reflections(Observed) 79.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8768
    Shell Resolution(Low) 1.9015
    Number of Reflections(R-Free) 461
    Number of Reflections(R-Work) 8588
    R-Factor(R-Work) 0.222
    R-Factor(R-Free) 0.2682
    Percent Reflections(Observed) 80.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9015
    Shell Resolution(Low) 1.9275
    Number of Reflections(R-Free) 502
    Number of Reflections(R-Work) 9469
    R-Factor(R-Work) 0.2033
    R-Factor(R-Free) 0.2462
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9275
    Shell Resolution(Low) 1.955
    Number of Reflections(R-Free) 493
    Number of Reflections(R-Work) 8968
    R-Factor(R-Work) 0.1965
    R-Factor(R-Free) 0.2294
    Percent Reflections(Observed) 83.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.955
    Shell Resolution(Low) 1.9842
    Number of Reflections(R-Free) 484
    Number of Reflections(R-Work) 9096
    R-Factor(R-Work) 0.1894
    R-Factor(R-Free) 0.2231
    Percent Reflections(Observed) 85.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9842
    Shell Resolution(Low) 2.0152
    Number of Reflections(R-Free) 482
    Number of Reflections(R-Work) 9311
    R-Factor(R-Work) 0.1878
    R-Factor(R-Free) 0.2172
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0152
    Shell Resolution(Low) 2.0483
    Number of Reflections(R-Free) 510
    Number of Reflections(R-Work) 9455
    R-Factor(R-Work) 0.1804
    R-Factor(R-Free) 0.2171
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0483
    Shell Resolution(Low) 2.0836
    Number of Reflections(R-Free) 509
    Number of Reflections(R-Work) 9587
    R-Factor(R-Work) 0.1749
    R-Factor(R-Free) 0.2167
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0836
    Shell Resolution(Low) 2.1215
    Number of Reflections(R-Free) 502
    Number of Reflections(R-Work) 9658
    R-Factor(R-Work) 0.1681
    R-Factor(R-Free) 0.2086
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1215
    Shell Resolution(Low) 2.1622
    Number of Reflections(R-Free) 507
    Number of Reflections(R-Work) 9670
    R-Factor(R-Work) 0.1711
    R-Factor(R-Free) 0.2153
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1622
    Shell Resolution(Low) 2.2064
    Number of Reflections(R-Free) 515
    Number of Reflections(R-Work) 9674
    R-Factor(R-Work) 0.1716
    R-Factor(R-Free) 0.2
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2064
    Shell Resolution(Low) 2.2543
    Number of Reflections(R-Free) 531
    Number of Reflections(R-Work) 10020
    R-Factor(R-Work) 0.1689
    R-Factor(R-Free) 0.2003
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2543
    Shell Resolution(Low) 2.3068
    Number of Reflections(R-Free) 514
    Number of Reflections(R-Work) 9794
    R-Factor(R-Work) 0.1691
    R-Factor(R-Free) 0.1933
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3068
    Shell Resolution(Low) 2.3645
    Number of Reflections(R-Free) 521
    Number of Reflections(R-Work) 9905
    R-Factor(R-Work) 0.1686
    R-Factor(R-Free) 0.2128
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3645
    Shell Resolution(Low) 2.4284
    Number of Reflections(R-Free) 532
    Number of Reflections(R-Work) 10048
    R-Factor(R-Work) 0.1644
    R-Factor(R-Free) 0.1968
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4284
    Shell Resolution(Low) 2.4998
    Number of Reflections(R-Free) 531
    Number of Reflections(R-Work) 10035
    R-Factor(R-Work) 0.1671
    R-Factor(R-Free) 0.1933
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4998
    Shell Resolution(Low) 2.5805
    Number of Reflections(R-Free) 535
    Number of Reflections(R-Work) 10192
    R-Factor(R-Work) 0.1698
    R-Factor(R-Free) 0.2072
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5805
    Shell Resolution(Low) 2.6727
    Number of Reflections(R-Free) 531
    Number of Reflections(R-Work) 10171
    R-Factor(R-Work) 0.1646
    R-Factor(R-Free) 0.1937
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6727
    Shell Resolution(Low) 2.7796
    Number of Reflections(R-Free) 542
    Number of Reflections(R-Work) 10285
    R-Factor(R-Work) 0.1698
    R-Factor(R-Free) 0.1952
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7796
    Shell Resolution(Low) 2.9061
    Number of Reflections(R-Free) 544
    Number of Reflections(R-Work) 10440
    R-Factor(R-Work) 0.1701
    R-Factor(R-Free) 0.1956
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9061
    Shell Resolution(Low) 3.0592
    Number of Reflections(R-Free) 551
    Number of Reflections(R-Work) 10414
    R-Factor(R-Work) 0.1739
    R-Factor(R-Free) 0.1966
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0592
    Shell Resolution(Low) 3.2508
    Number of Reflections(R-Free) 554
    Number of Reflections(R-Work) 10506
    R-Factor(R-Work) 0.175
    R-Factor(R-Free) 0.1997
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2508
    Shell Resolution(Low) 3.5016
    Number of Reflections(R-Free) 559
    Number of Reflections(R-Work) 10594
    R-Factor(R-Work) 0.1717
    R-Factor(R-Free) 0.1945
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5016
    Shell Resolution(Low) 3.8536
    Number of Reflections(R-Free) 558
    Number of Reflections(R-Work) 10623
    R-Factor(R-Work) 0.1522
    R-Factor(R-Free) 0.1648
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8536
    Shell Resolution(Low) 4.4103
    Number of Reflections(R-Free) 557
    Number of Reflections(R-Work) 10587
    R-Factor(R-Work) 0.1369
    R-Factor(R-Free) 0.1544
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4103
    Shell Resolution(Low) 5.553
    Number of Reflections(R-Free) 564
    Number of Reflections(R-Work) 10692
    R-Factor(R-Work) 0.149
    R-Factor(R-Free) 0.1699
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.553
    Shell Resolution(Low) 35.4302
    Number of Reflections(R-Free) 545
    Number of Reflections(R-Work) 10365
    R-Factor(R-Work) 0.1623
    R-Factor(R-Free) 0.164
    Percent Reflections(Observed) 96.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 12.927
    f_plane_restr 0.005
    f_chiral_restr 0.066
    f_angle_d 0.97
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 24392
    Nucleic Acid Atoms 0
    Heterogen Atoms 72
    Solvent Atoms 2720
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution SOLVE
    Structure Refinement PHENIX (phenix.refine: 1.6.4_486)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.6.4_486)
    model building SOLVE
    data collection HKL-2000