X-RAY DIFFRACTION Experimental Data & Validation


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Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 6.5
Temperature 293.0
Details 0.2M Lithium sulfate monohydrate, 0.1M BIS-TRIS, 25%(w/v) Polyethylene glycol 3350, pH 6.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 95.52 α = 98.46
b = 98.82 β = 106.99
c = 111.46 γ = 107.07
Symmetry
Space Group P 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
2 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD RAYONIX MX-225 -- 2009-07-10
CCD RAYONIX MX-225 -- 2009-07-10
Diffraction Radiation
Monochromator Protocol
Si 111 SINGLE WAVELENGTH
Si 111 SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRF BEAMLINE BL17U 0.97916 SSRF BL17U
SYNCHROTRON SSRF BEAMLINE BL17U 0.97623 SSRF BL17U

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.79 50 96.3 -- -- -- -- 324571 324571 0.0 0.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.8 1.86 95.0 -- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SAD 1.789 35.423 -- 0.04 305010 305010 15296 89.7 -- 0.1696 0.1683 0.1936 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.7894 1.8097 -- 317 6080 0.2725 0.3224 -- 56.0
X Ray Diffraction 1.8097 1.831 -- 443 8424 0.251 0.2892 -- 78.0
X Ray Diffraction 1.831 1.8533 -- 453 8495 0.245 0.2792 -- 79.0
X Ray Diffraction 1.8533 1.8768 -- 449 8568 0.2327 0.2769 -- 79.0
X Ray Diffraction 1.8768 1.9015 -- 461 8588 0.222 0.2682 -- 80.0
X Ray Diffraction 1.9015 1.9275 -- 502 9469 0.2033 0.2462 -- 88.0
X Ray Diffraction 1.9275 1.955 -- 493 8968 0.1965 0.2294 -- 83.0
X Ray Diffraction 1.955 1.9842 -- 484 9096 0.1894 0.2231 -- 85.0
X Ray Diffraction 1.9842 2.0152 -- 482 9311 0.1878 0.2172 -- 87.0
X Ray Diffraction 2.0152 2.0483 -- 510 9455 0.1804 0.2171 -- 88.0
X Ray Diffraction 2.0483 2.0836 -- 509 9587 0.1749 0.2167 -- 89.0
X Ray Diffraction 2.0836 2.1215 -- 502 9658 0.1681 0.2086 -- 89.0
X Ray Diffraction 2.1215 2.1622 -- 507 9670 0.1711 0.2153 -- 90.0
X Ray Diffraction 2.1622 2.2064 -- 515 9674 0.1716 0.2 -- 90.0
X Ray Diffraction 2.2064 2.2543 -- 531 10020 0.1689 0.2003 -- 93.0
X Ray Diffraction 2.2543 2.3068 -- 514 9794 0.1691 0.1933 -- 91.0
X Ray Diffraction 2.3068 2.3645 -- 521 9905 0.1686 0.2128 -- 92.0
X Ray Diffraction 2.3645 2.4284 -- 532 10048 0.1644 0.1968 -- 93.0
X Ray Diffraction 2.4284 2.4998 -- 531 10035 0.1671 0.1933 -- 93.0
X Ray Diffraction 2.4998 2.5805 -- 535 10192 0.1698 0.2072 -- 94.0
X Ray Diffraction 2.5805 2.6727 -- 531 10171 0.1646 0.1937 -- 95.0
X Ray Diffraction 2.6727 2.7796 -- 542 10285 0.1698 0.1952 -- 96.0
X Ray Diffraction 2.7796 2.9061 -- 544 10440 0.1701 0.1956 -- 97.0
X Ray Diffraction 2.9061 3.0592 -- 551 10414 0.1739 0.1966 -- 97.0
X Ray Diffraction 3.0592 3.2508 -- 554 10506 0.175 0.1997 -- 98.0
X Ray Diffraction 3.2508 3.5016 -- 559 10594 0.1717 0.1945 -- 98.0
X Ray Diffraction 3.5016 3.8536 -- 558 10623 0.1522 0.1648 -- 99.0
X Ray Diffraction 3.8536 4.4103 -- 557 10587 0.1369 0.1544 -- 99.0
X Ray Diffraction 4.4103 5.553 -- 564 10692 0.149 0.1699 -- 99.0
X Ray Diffraction 5.553 35.4302 -- 545 10365 0.1623 0.164 -- 96.0
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 30.5102
Anisotropic B[1][1] -2.8058
Anisotropic B[1][2] -6.0017
Anisotropic B[1][3] 5.9746
Anisotropic B[2][2] 2.2009
Anisotropic B[2][3] -6.4489
Anisotropic B[3][3] 0.6049
RMS Deviations
Key Refinement Restraint Deviation
f_dihedral_angle_d 12.927
f_plane_restr 0.005
f_chiral_restr 0.066
f_angle_d 0.97
f_bond_d 0.006
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 24392
Nucleic Acid Atoms 0
Heterogen Atoms 72
Solvent Atoms 2720

Software

Computing
Computing Package Purpose
HKL-2000 Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
SOLVE Structure Solution
PHENIX (phenix.refine: 1.6.4_486) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.6.4_486) refinement
SOLVE model building
HKL-2000 data collection