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X-RAY DIFFRACTION
Materials and Methods page
4DOP
  •   Crystallization Hide
    Crystallization Experiments
    Method vapor diffusion
    pH 7
    Temperature 298.0
    Details PEG3350, NH4SO4, JM600, pH 7, vapor diffusion, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 160.52 α = 90
    b = 160.52 β = 90
    c = 681.33 γ = 120
     
    Space Group
    Space Group Name:    H 3 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector AREA DETECTOR
    Type ADSC QUANTUM 315r
    Collection Date 2011-01-01
     
    Diffraction Radiation
    Monochromator Cryogenically-cooled double crystal Si(111) monochromator. Triple striped vertical and horizantal focussing mirrors in Kirkpatrick-Baez geometry.
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 24-ID-C
    Wavelength List 0.9798
    Site APS
    Beamline 24-ID-C
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 4.2
    Resolution(Low) 136.21
    Number Reflections(All) 25305
    Number Reflections(Observed) 25305
    Percent Possible(Observed) 100.0
    Redundancy 6.9
     
    High Resolution Shell Details
    Resolution(High) 4.2
    Resolution(Low) 4.31
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.868
    Mean I Over Sigma(Observed) 0.9
    R-Sym I(Observed) 0.868
    Redundancy 7.2
    Number Unique Reflections(All) 1855
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 4.2
    Resolution(Low) 97.311
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 23337
    Number of Reflections(Observed) 23337
    Number of Reflections(R-Free) 1188
    Percent Reflections(Observed) 92.15
    R-Factor(All) 0.2241
    R-Factor(Observed) 0.2241
    R-Work 0.2219
    R-Free 0.268
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 111.488
    Anisotropic B[1][1] 4.9741
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 4.9741
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -9.9481
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2
    Shell Resolution(Low) 4.3913
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2582
    R-Factor(R-Work) 0.2839
    R-Factor(R-Free) 0.3392
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3913
    Shell Resolution(Low) 4.6228
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2640
    R-Factor(R-Work) 0.2206
    R-Factor(R-Free) 0.2757
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6228
    Shell Resolution(Low) 4.9124
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 2689
    R-Factor(R-Work) 0.1883
    R-Factor(R-Free) 0.2261
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.9124
    Shell Resolution(Low) 5.2917
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2714
    R-Factor(R-Work) 0.2095
    R-Factor(R-Free) 0.2598
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.2917
    Shell Resolution(Low) 5.8241
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 2720
    R-Factor(R-Work) 0.2508
    R-Factor(R-Free) 0.2801
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.8241
    Shell Resolution(Low) 6.6667
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 2793
    R-Factor(R-Work) 0.2352
    R-Factor(R-Free) 0.296
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.6667
    Shell Resolution(Low) 8.3986
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 2891
    R-Factor(R-Work) 0.2009
    R-Factor(R-Free) 0.2756
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 8.3986
    Shell Resolution(Low) 97.311
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 3120
    R-Factor(R-Work) 0.2136
    R-Factor(R-Free) 0.2363
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 14.118
    f_plane_restr 0.003
    f_chiral_restr 0.041
    f_angle_d 0.617
    f_bond_d 0.003
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 12873
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 18
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC Quantum
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) SCALA
    Structure Solution Phaser_EP
    Structure Refinement PHENIX (phenix.refine: 1.6.4_486)
     
    Software
    data extraction pdb_extract version: 3.10
    refinement phenix
    data reduction SCALA version: 3.3.9