X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 5.5
Temperature 293.0
Details 1.8 M AMMONIUM SULFATE, 0.1 M ACETATE, CRYO CONDITIONS: 2.0 M AMMONIUM SULFATE, 0.1 M ACETATE PH 5.5, 25% GLYCEROL, VAPOR DIFFUSION, SITTING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 136.01 α = 90
b = 136.01 β = 90
c = 109.29 γ = 120
Symmetry
Space Group P 63 2 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 95
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD RIGAKU SATURN 944 MIRRORS 2009-01-06
Diffraction Radiation
Monochromator Protocol
GRAPHITE SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU MICROMAX-007 HF 1.5418 -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.8 30 99.7 0.149 -- -- 26.7 15133 15133 0.0 -3.0 30.1
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.8 2.88 98.5 0.557 -- -- 25.8 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.8 15.0 -- 0.0 14181 14181 839 94.1 0.19955 0.19955 0.19573 0.26565 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.803 2.873 -- 48 993 0.242 0.321 -- 98.5
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 39.7
Anisotropic B[1][1] 0.71
Anisotropic B[1][2] 0.35
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 0.71
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -1.06
RMS Deviations
Key Refinement Restraint Deviation
r_chiral_restr 0.07
r_angle_refined_deg 1.061
r_mcangle_it 2.358
r_scangle_it 26.562
r_gen_planes_refined 0.0
r_dihedral_angle_2_deg 36.206
r_bond_refined_d 0.006
r_dihedral_angle_1_deg 6.244
r_mcbond_it 1.064
r_dihedral_angle_4_deg 14.6
r_dihedral_angle_3_deg 15.178
r_scbond_it 26.169
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3709
Nucleic Acid Atoms 0
Heterogen Atoms 18
Solvent Atoms 78

Software

Software
Software Name Purpose
CrystalClear data collection
MOLREP phasing
REFMAC refinement version: 5.5.0109
XDS data reduction
XDS data scaling