X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 6.1
Temperature 298.0
Details 22% PEG 8000, 0.1M sodium cacodylate, 0.2M ammonium sulfate, pH 6.1, VAPOR DIFFUSION, HANGING DROP, temperature 298K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 41.78 α = 90
b = 82.04 β = 90
c = 91.81 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315 -- 2011-07-22
Diffraction Radiation
Monochromator Protocol
Si 111 Channel SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X29A 1.075 NSLS X29A

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.3 50 100.0 -- -- -- -- -- 14553 0.0 0.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.3 2.38 100.0 -- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.3 45.904 -- 1.35 14617 14553 1456 99.56 -- 0.2059 0.2008 0.2519 Random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.3 2.3821 -- 136 1216 0.2436 0.319 -- 96.0
X Ray Diffraction 2.3821 2.4775 -- 144 1302 0.2264 0.3225 -- 100.0
X Ray Diffraction 2.4775 2.5902 -- 142 1285 0.2163 0.2739 -- 100.0
X Ray Diffraction 2.5902 2.7268 -- 145 1301 0.2312 0.3266 -- 100.0
X Ray Diffraction 2.7268 2.8976 -- 143 1292 0.2225 0.2946 -- 100.0
X Ray Diffraction 2.8976 3.1212 -- 145 1295 0.2181 0.2735 -- 100.0
X Ray Diffraction 3.1212 3.4353 -- 146 1322 0.2022 0.2533 -- 100.0
X Ray Diffraction 3.4353 3.9321 -- 147 1320 0.1897 0.2309 -- 100.0
X Ray Diffraction 3.9321 4.9531 -- 149 1341 0.1647 0.2036 -- 100.0
X Ray Diffraction 4.9531 45.9131 -- 159 1423 0.2101 0.2529 -- 100.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] -0.2126
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -4.5408
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 4.7534
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.003
f_chiral_restr 0.061
f_dihedral_angle_d 14.35
f_angle_d 0.993
f_bond_d 0.006
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2103
Nucleic Acid Atoms 0
Heterogen Atoms 99
Solvent Atoms 44

Software

Computing
Computing Package Purpose
HKL-2000 Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
PHASER Structure Solution
PHENIX (phenix.refine: 1.7.1_743) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.7.1_743) refinement
PHASER model building
HKL-2000 data collection