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X-RAY DIFFRACTION
Materials and Methods page
4DN0
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.1
    Temperature 298.0
    Details 22% PEG 8000, 0.1M sodium cacodylate, 0.2M ammonium sulfate, pH 6.1, VAPOR DIFFUSION, HANGING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 41.78 α = 90
    b = 82.04 β = 90
    c = 91.81 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Collection Date 2011-07-22
     
    Diffraction Radiation
    Monochromator Si 111 Channel
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X29A
    Wavelength List 1.075
    Site NSLS
    Beamline X29A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.3
    Resolution(Low) 50
    Number Reflections(Observed) 14553
    Percent Possible(Observed) 100.0
     
    High Resolution Shell Details
    Resolution(High) 2.3
    Resolution(Low) 2.38
    Percent Possible(All) 100.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.3
    Resolution(Low) 45.904
    Cut-off Sigma(F) 1.35
    Number of Reflections(all) 14617
    Number of Reflections(Observed) 14553
    Number of Reflections(R-Free) 1456
    Percent Reflections(Observed) 99.56
    R-Factor(Observed) 0.2059
    R-Work 0.2008
    R-Free 0.2519
    R-Free Selection Details Random
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -0.2126
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -4.5408
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 4.7534
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3
    Shell Resolution(Low) 2.3821
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 1216
    R-Factor(R-Work) 0.2436
    R-Factor(R-Free) 0.319
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3821
    Shell Resolution(Low) 2.4775
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 1302
    R-Factor(R-Work) 0.2264
    R-Factor(R-Free) 0.3225
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4775
    Shell Resolution(Low) 2.5902
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 1285
    R-Factor(R-Work) 0.2163
    R-Factor(R-Free) 0.2739
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5902
    Shell Resolution(Low) 2.7268
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 1301
    R-Factor(R-Work) 0.2312
    R-Factor(R-Free) 0.3266
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7268
    Shell Resolution(Low) 2.8976
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 1292
    R-Factor(R-Work) 0.2225
    R-Factor(R-Free) 0.2946
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8976
    Shell Resolution(Low) 3.1212
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 1295
    R-Factor(R-Work) 0.2181
    R-Factor(R-Free) 0.2735
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1212
    Shell Resolution(Low) 3.4353
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 1322
    R-Factor(R-Work) 0.2022
    R-Factor(R-Free) 0.2533
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4353
    Shell Resolution(Low) 3.9321
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 1320
    R-Factor(R-Work) 0.1897
    R-Factor(R-Free) 0.2309
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9321
    Shell Resolution(Low) 4.9531
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 1341
    R-Factor(R-Work) 0.1647
    R-Factor(R-Free) 0.2036
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.9531
    Shell Resolution(Low) 45.9131
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 1423
    R-Factor(R-Work) 0.2101
    R-Factor(R-Free) 0.2529
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.061
    f_dihedral_angle_d 14.35
    f_angle_d 0.993
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2103
    Nucleic Acid Atoms 0
    Heterogen Atoms 99
    Solvent Atoms 44
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.1_743)
    model building PHASER
    data collection HKL-2000