X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 7.5
Temperature 298.0
Details 11.5% PEG 8000, 0.1M Tris-HCl, 0.2M Magnesium chloride, pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 298K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 88.51 α = 90
b = 113.35 β = 90
c = 61.85 γ = 90
Symmetry
Space Group P 21 21 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315 -- 2011-06-16
Diffraction Radiation
Monochromator Protocol
Si 111 channel SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X29A 1.075 NSLS X29A

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.1 50 100.0 -- -- -- -- -- 36951 0.0 0.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SAD 2.102 47.728 -- 1.34 36980 36951 2000 99.92 -- 0.1979 0.1956 0.2378 Random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.102 2.1544 -- 141 2476 0.2463 0.2995 -- 99.0
X Ray Diffraction 2.1544 2.2127 -- 141 2458 0.2275 0.3228 -- 100.0
X Ray Diffraction 2.2127 2.2778 -- 139 2422 0.213 0.281 -- 100.0
X Ray Diffraction 2.2778 2.3513 -- 141 2469 0.2187 0.2739 -- 100.0
X Ray Diffraction 2.3513 2.4353 -- 141 2459 0.2121 0.2628 -- 100.0
X Ray Diffraction 2.4353 2.5328 -- 143 2492 0.2162 0.2972 -- 100.0
X Ray Diffraction 2.5328 2.6481 -- 140 2452 0.2163 0.2878 -- 100.0
X Ray Diffraction 2.6481 2.7877 -- 142 2487 0.2192 0.2585 -- 100.0
X Ray Diffraction 2.7877 2.9623 -- 143 2492 0.2269 0.3406 -- 100.0
X Ray Diffraction 2.9623 3.191 -- 141 2484 0.2136 0.3016 -- 100.0
X Ray Diffraction 3.191 3.5121 -- 144 2507 0.199 0.2381 -- 100.0
X Ray Diffraction 3.5121 4.02 -- 145 2531 0.1717 0.2254 -- 100.0
X Ray Diffraction 4.02 5.0639 -- 145 2540 0.1509 0.1682 -- 100.0
X Ray Diffraction 5.0639 47.74 -- 154 2682 0.2083 0.2131 -- 100.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] 5.5518
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -8.0278
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 2.476
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.003
f_chiral_restr 0.061
f_dihedral_angle_d 13.123
f_angle_d 0.993
f_bond_d 0.007
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 4175
Nucleic Acid Atoms 0
Heterogen Atoms 40
Solvent Atoms 129

Software

Computing
Computing Package Purpose
HKL-2000 Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
SOLVE Structure Solution
PHENIX (phenix.refine: 1.7.1_743) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.7.1_743) refinement
SOLVE model building
HKL-2000 data collection