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X-RAY DIFFRACTION
Materials and Methods page
4DL0
  •   Crystallization Hide
    Crystallization Experiments
    pH 6
    Temperature 292.0
    Details 0.1 M Lithium Sulfate, 0.1 M MES, 20% PEG mme 2000, 0.15 M Glycine, pH 6, VAPOR DIFFUSION, HANGING DROP, temperature 292K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 95.79 α = 90
    b = 105.61 β = 90
    c = 120.49 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 210
    Details MICROBEAM
    Collection Date 2011-11-21
     
    Diffraction Radiation
    Monochromator SI (111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type CHESS BEAMLINE A1
    Wavelength 0.9767
    Site CHESS
    Beamline A1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2.9
    Resolution(Low) 40
    Number Reflections(Observed) 51697
    Percent Possible(Observed) 99.4
    R Merge I(Observed) 0.158
    Redundancy 10.3
     
    High Resolution Shell Details
    Resolution(High) 2.9
    Resolution(Low) 2.95
    Percent Possible(All) 99.4
    Redundancy 9.7
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD, MOLECULAR REPLACEMENT
    reflnsShellList 2.905
    Resolution(Low) 39.71
    Cut-off Sigma(F) 1.34
    Number of Reflections(all) 51697
    Number of Reflections(Observed) 51603
    Number of Reflections(R-Free) 3740
    Percent Reflections(Observed) 99.23
    R-Factor(Observed) 0.2115
    R-Work 0.2078
    R-Free 0.2569
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -6.5516
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -5.5855
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 12.1371
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9051
    Shell Resolution(Low) 2.9419
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 1614
    R-Factor(R-Work) 0.3733
    R-Factor(R-Free) 0.3903
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9419
    Shell Resolution(Low) 2.9806
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 1724
    R-Factor(R-Work) 0.3623
    R-Factor(R-Free) 0.42
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9806
    Shell Resolution(Low) 3.0214
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 1767
    R-Factor(R-Work) 0.3681
    R-Factor(R-Free) 0.362
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0214
    Shell Resolution(Low) 3.0645
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 1749
    R-Factor(R-Work) 0.3305
    R-Factor(R-Free) 0.3845
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0645
    Shell Resolution(Low) 3.1103
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 1794
    R-Factor(R-Work) 0.3147
    R-Factor(R-Free) 0.3641
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1103
    Shell Resolution(Low) 3.1589
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 1773
    R-Factor(R-Work) 0.3025
    R-Factor(R-Free) 0.3879
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1589
    Shell Resolution(Low) 3.2106
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 1761
    R-Factor(R-Work) 0.3082
    R-Factor(R-Free) 0.3973
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2106
    Shell Resolution(Low) 3.266
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 1792
    R-Factor(R-Work) 0.2929
    R-Factor(R-Free) 0.4069
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.266
    Shell Resolution(Low) 3.3253
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 1781
    R-Factor(R-Work) 0.2895
    R-Factor(R-Free) 0.3304
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3253
    Shell Resolution(Low) 3.3892
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 1782
    R-Factor(R-Work) 0.2667
    R-Factor(R-Free) 0.3475
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3892
    Shell Resolution(Low) 3.4584
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 1784
    R-Factor(R-Work) 0.2453
    R-Factor(R-Free) 0.2613
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4584
    Shell Resolution(Low) 3.5335
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 1779
    R-Factor(R-Work) 0.2283
    R-Factor(R-Free) 0.2875
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5335
    Shell Resolution(Low) 3.6157
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 1757
    R-Factor(R-Work) 0.234
    R-Factor(R-Free) 0.2836
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6157
    Shell Resolution(Low) 3.706
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 1797
    R-Factor(R-Work) 0.2218
    R-Factor(R-Free) 0.2473
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.706
    Shell Resolution(Low) 3.8062
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 1791
    R-Factor(R-Work) 0.1952
    R-Factor(R-Free) 0.253
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8062
    Shell Resolution(Low) 3.9181
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 1788
    R-Factor(R-Work) 0.1987
    R-Factor(R-Free) 0.2477
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9181
    Shell Resolution(Low) 4.0444
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 1800
    R-Factor(R-Work) 0.1984
    R-Factor(R-Free) 0.1949
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0444
    Shell Resolution(Low) 4.1888
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 1789
    R-Factor(R-Work) 0.1682
    R-Factor(R-Free) 0.2892
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1888
    Shell Resolution(Low) 4.3563
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 1788
    R-Factor(R-Work) 0.1683
    R-Factor(R-Free) 0.2149
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3563
    Shell Resolution(Low) 4.5543
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 1782
    R-Factor(R-Work) 0.1558
    R-Factor(R-Free) 0.1956
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5543
    Shell Resolution(Low) 4.7941
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 1787
    R-Factor(R-Work) 0.1608
    R-Factor(R-Free) 0.2087
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7941
    Shell Resolution(Low) 5.0938
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 1772
    R-Factor(R-Work) 0.1635
    R-Factor(R-Free) 0.2146
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.0938
    Shell Resolution(Low) 5.4862
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 1804
    R-Factor(R-Work) 0.1635
    R-Factor(R-Free) 0.1857
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.4862
    Shell Resolution(Low) 6.0366
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 1758
    R-Factor(R-Work) 0.1963
    R-Factor(R-Free) 0.2337
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.0366
    Shell Resolution(Low) 6.9061
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 1788
    R-Factor(R-Work) 0.2071
    R-Factor(R-Free) 0.2835
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.9061
    Shell Resolution(Low) 8.686
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 1798
    R-Factor(R-Work) 0.1505
    R-Factor(R-Free) 0.1882
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 8.686
    Shell Resolution(Low) 39.7135
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 1764
    R-Factor(R-Work) 0.1549
    R-Factor(R-Free) 0.197
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.002
    f_chiral_restr 0.042
    f_dihedral_angle_d 12.262
    f_angle_d 0.635
    f_bond_d 0.003
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 7062
    Nucleic Acid Atoms 0
    Heterogen Atoms 42
    Solvent Atoms 31
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL
    Structure Solution SOLVE ; PHASER
    Structure Refinement PHENIX (phenix.refine: dev_989)
     
    Software
    data extraction pdb_extract version: 3.10
    refinement phenix
    phasing SOLVE
    molecular replacement Phaser version: 2.4.0
    data reduction HKL